{"id":"https://openalex.org/W1970149585","doi":"https://doi.org/10.1587/elex.11.20140307","title":"A novel electromagnetic interference resisting local interconnection network transmitter","display_name":"A novel electromagnetic interference resisting local interconnection network transmitter","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W1970149585","doi":"https://doi.org/10.1587/elex.11.20140307","mag":"1970149585"},"language":"en","primary_location":{"id":"doi:10.1587/elex.11.20140307","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140307","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/10/11_11.20140307/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/11/10/11_11.20140307/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103055465","display_name":"Zhengmin Zhang","orcid":"https://orcid.org/0000-0003-4675-4994"},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhengmin Zhang","raw_affiliation_strings":["Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100351910","display_name":"Lin Zhang","orcid":"https://orcid.org/0000-0003-0545-1110"},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Zhang","raw_affiliation_strings":["Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111894630","display_name":"Zhenqiu Ning","orcid":null},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenqiu Ning","raw_affiliation_strings":["Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081112851","display_name":"Xing Jin","orcid":"https://orcid.org/0000-0001-5693-3414"},"institutions":[{"id":"https://openalex.org/I4210147322","display_name":"Shanghai Institute of Microsystem and Information Technology","ror":"https://ror.org/04nytyj38","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210147322"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Jin","raw_affiliation_strings":["Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Engineering Center of Automotive Electronics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences","institution_ids":["https://openalex.org/I4210147322"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210147322"],"apc_list":null,"apc_paid":null,"fwci":0.2129,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57057686,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"11","issue":"10","first_page":"20140307","last_page":"20140307"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.8859641551971436},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.762200117111206},{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.7430423498153687},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.7232088446617126},{"id":"https://openalex.org/keywords/duty-cycle","display_name":"Duty cycle","score":0.697176992893219},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.631881594657898},{"id":"https://openalex.org/keywords/operational-transconductance-amplifier","display_name":"Operational transconductance amplifier","score":0.519989550113678},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.503771960735321},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4899408221244812},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4871065616607666},{"id":"https://openalex.org/keywords/transconductance","display_name":"Transconductance","score":0.47486257553100586},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4340646266937256},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33160150051116943},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3246116638183594},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2767149806022644},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2089703381061554},{"id":"https://openalex.org/keywords/differential-amplifier","display_name":"Differential amplifier","score":0.1573534607887268},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.10225573182106018}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.8859641551971436},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.762200117111206},{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.7430423498153687},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.7232088446617126},{"id":"https://openalex.org/C199822604","wikidata":"https://www.wikidata.org/wiki/Q557120","display_name":"Duty cycle","level":3,"score":0.697176992893219},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.631881594657898},{"id":"https://openalex.org/C58117264","wikidata":"https://www.wikidata.org/wiki/Q1239595","display_name":"Operational transconductance amplifier","level":5,"score":0.519989550113678},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.503771960735321},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4899408221244812},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4871065616607666},{"id":"https://openalex.org/C2779283907","wikidata":"https://www.wikidata.org/wiki/Q1632964","display_name":"Transconductance","level":4,"score":0.47486257553100586},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4340646266937256},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33160150051116943},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3246116638183594},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2767149806022644},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2089703381061554},{"id":"https://openalex.org/C11722477","wikidata":"https://www.wikidata.org/wiki/Q1056298","display_name":"Differential amplifier","level":4,"score":0.1573534607887268},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.10225573182106018},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.11.20140307","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140307","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/10/11_11.20140307/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.11.20140307","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20140307","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/10/11_11.20140307/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1970149585.pdf","grobid_xml":"https://content.openalex.org/works/W1970149585.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1651840573","https://openalex.org/W2110040930","https://openalex.org/W2118179090","https://openalex.org/W2160916000","https://openalex.org/W4250936563"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W4385545073","https://openalex.org/W1921091955","https://openalex.org/W2163032211","https://openalex.org/W2587678315"],"abstract_inverted_index":{"To":[0],"provide":[1],"a":[2,11],"high":[3],"EMI":[4],"resisting":[5],"Local":[6],"Interconnection":[7],"Network":[8],"(LIN)":[9],"transmitter,":[10],"novel":[12],"structure":[13],"with":[14],"an":[15],"error":[16],"feedback":[17],"amplifier":[18,25],"composed":[19],"of":[20,57,67],"low":[21],"input":[22],"impedance":[23],"transconductance":[24],"was":[26,30,40],"proposed.":[27],"The":[28],"circuit":[29],"fabricated":[31],"in":[32],"0.5":[33],"\u00b5m":[34],"60":[35],"V":[36],"BCD":[37],"process":[38],"and":[39],"simulated":[41],"hiring":[42],"the":[43,55,58,62,65],"standard":[44],"IEC62132-4:":[45],"Direct":[46],"Power":[47],"Injection":[48],"(DPI)":[49],"method.":[50],"Simulation":[51],"result":[52],"showed":[53],"that":[54],"performance":[56],"duty":[59],"cycle":[60],"satisfied":[61],"requirement":[63],"under":[64],"condition":[66],"superimposing":[68],"more":[69],"than":[70],"5":[71],"W":[72],"Electromagnetic":[73],"interference":[74],"(EMI)":[75],"ranged":[76],"from":[77],"150":[78],"KHz":[79],"to":[80],"1":[81],"GHz":[82],"onto":[83],"LIN":[84],"bus.":[85]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}