{"id":"https://openalex.org/W2060959348","doi":"https://doi.org/10.1587/elex.11.20131041","title":"Vertical stack array of one-time programmable nonvolatile memory based on pn-junction diode and its operation scheme for faster access","display_name":"Vertical stack array of one-time programmable nonvolatile memory based on pn-junction diode and its operation scheme for faster access","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2060959348","doi":"https://doi.org/10.1587/elex.11.20131041","mag":"2060959348"},"language":"en","primary_location":{"id":"doi:10.1587/elex.11.20131041","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20131041","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/4/11_11.20131041/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://www.jstage.jst.go.jp/article/elex/11/4/11_11.20131041/_pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013505991","display_name":"Seongjae Cho","orcid":"https://orcid.org/0000-0001-8520-718X"},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seongjae Cho","raw_affiliation_strings":["Department of Electronic Engineering, Gachon University"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Gachon University","institution_ids":["https://openalex.org/I12832649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053416393","display_name":"Sunghun Jung","orcid":"https://orcid.org/0000-0001-5243-9689"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sunghun Jung","raw_affiliation_strings":["Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University"],"affiliations":[{"raw_affiliation_string":"Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100647604","display_name":"Sungjun Kim","orcid":"https://orcid.org/0000-0002-9873-2474"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungjun Kim","raw_affiliation_strings":["Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University"],"affiliations":[{"raw_affiliation_string":"Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057864063","display_name":"Byung\u2010Gook Park","orcid":"https://orcid.org/0000-0002-2962-2458"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byung-Gook Park","raw_affiliation_strings":["Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University"],"affiliations":[{"raw_affiliation_string":"Inter-university Semiconductor Research Center (ISRC) and Department of Electrical and Computer Engineering, Seoul National University","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5013505991"],"corresponding_institution_ids":["https://openalex.org/I12832649"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10796963,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"11","issue":"4","first_page":"20131041","last_page":"20131041"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.7087036371231079},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.6101410984992981},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5606092810630798},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.5376487970352173},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5245121717453003},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.507707953453064},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47791844606399536},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.47147420048713684},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4538097381591797},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.44810548424720764},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4328271448612213},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4314529299736023},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4133695960044861},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3760814368724823},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.36183786392211914},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21806567907333374},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1702663004398346}],"concepts":[{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.7087036371231079},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.6101410984992981},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5606092810630798},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.5376487970352173},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5245121717453003},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.507707953453064},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47791844606399536},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.47147420048713684},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4538097381591797},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.44810548424720764},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4328271448612213},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4314529299736023},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4133695960044861},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3760814368724823},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36183786392211914},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21806567907333374},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1702663004398346},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1587/elex.11.20131041","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20131041","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/4/11_11.20131041/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1587/elex.11.20131041","is_oa":true,"landing_page_url":"https://doi.org/10.1587/elex.11.20131041","pdf_url":"https://www.jstage.jst.go.jp/article/elex/11/4/11_11.20131041/_pdf","source":{"id":"https://openalex.org/S207433681","display_name":"IEICE Electronics Express","issn_l":"1349-2543","issn":["1349-2543","1349-9467"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4320800604","host_organization_name":"Institute of Electronics, Information and Communication Engineers","host_organization_lineage":["https://openalex.org/P4320800604"],"host_organization_lineage_names":["Institute of Electronics, Information and Communication Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEICE Electronics Express","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3074197220","display_name":null,"funder_award_id":"10035320","funder_id":"https://openalex.org/F4320321640","funder_display_name":"Ministry of Knowledge Economy"},{"id":"https://openalex.org/G7313095587","display_name":null,"funder_award_id":"10035320","funder_id":"https://openalex.org/F4320334879","funder_display_name":"Korea Evaluation Institute of Industrial Technology"}],"funders":[{"id":"https://openalex.org/F4320321640","display_name":"Ministry of Knowledge Economy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320334879","display_name":"Korea Evaluation Institute of Industrial Technology","ror":"https://ror.org/03z9cwa38"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2060959348.pdf","grobid_xml":"https://content.openalex.org/works/W2060959348.grobid-xml"},"referenced_works_count":13,"referenced_works":["https://openalex.org/W1599102690","https://openalex.org/W1977361282","https://openalex.org/W1997932198","https://openalex.org/W2009358702","https://openalex.org/W2042225344","https://openalex.org/W2044726868","https://openalex.org/W2093699422","https://openalex.org/W2114372929","https://openalex.org/W2127973690","https://openalex.org/W2150263907","https://openalex.org/W2327238355","https://openalex.org/W2739201797","https://openalex.org/W2926195008"],"related_works":["https://openalex.org/W2004241287","https://openalex.org/W2380576232","https://openalex.org/W2937054111","https://openalex.org/W2066223521","https://openalex.org/W3014521742","https://openalex.org/W1559639976","https://openalex.org/W2113742827","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W2040773997"],"abstract_inverted_index":{"In":[0,54],"this":[1,55],"work,":[2,56],"a":[3],"three-dimensional":[4],"(3-D)":[5],"architecture":[6,29],"of":[7,51,88],"one-time":[8],"programmable":[9],"(OTP)":[10],"nonvolatile":[11],"memory":[12],"(NVM)":[13],"arrays":[14],"is":[15,30,83],"introduced":[16],"and":[17,22,36,44,68,92],"its":[18,86],"viable":[19],"process":[20,90],"integration":[21,35],"operation":[23,69],"method":[24],"are":[25,75],"schemed.":[26],"Vertical":[27],"stack":[28],"highly":[31],"persued":[32],"for":[33,60,71],"higher-level":[34],"NVMs":[37],"based":[38],"on":[39],"devices":[40],"free":[41],"from":[42],"transistors":[43],"charge":[45],"trapping":[46],"layers":[47],"would":[48],"be":[49],"one":[50],"the":[52,61],"candidates.":[53],"in":[57,77],"an":[58],"effort":[59],"NVM":[62],"technology":[63],"trend,":[64],"architecture,":[65],"fabrication":[66],"process,":[67],"scheme":[70],"faster":[72],"data":[73],"access":[74],"studied":[76],"depth.":[78],"Silicon":[79],"(Si)":[80],"pn-junction":[81],"diode":[82],"focused":[84],"by":[85],"virtues":[87],"cost-effectiveness,":[89],"maturity,":[91],"compatibility":[93],"to":[94],"peripheral":[95],"Si":[96],"CMOS":[97],"circuits.":[98]},"counts_by_year":[],"updated_date":"2026-03-14T08:43:22.919905","created_date":"2025-10-10T00:00:00"}