{"id":"https://openalex.org/W1988630495","doi":"https://doi.org/10.1515/itit-2013-1042","title":"Behavior of stochastic circuits under severe error conditions","display_name":"Behavior of stochastic circuits under severe error conditions","publication_year":2014,"publication_date":"2014-05-27","ids":{"openalex":"https://openalex.org/W1988630495","doi":"https://doi.org/10.1515/itit-2013-1042","mag":"1988630495"},"language":"en","primary_location":{"id":"doi:10.1515/itit-2013-1042","is_oa":false,"landing_page_url":"https://doi.org/10.1515/itit-2013-1042","pdf_url":null,"source":{"id":"https://openalex.org/S4210229153","display_name":"it - Information Technology","issn_l":"1611-2776","issn":["1611-2776","2196-7032"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"it - Information Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068964497","display_name":"Te-Hsuan Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Te-Hsuan Chen","raw_affiliation_strings":["Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038032703","display_name":"Armin Alaghi","orcid":"https://orcid.org/0000-0003-2055-6754"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Armin Alaghi","raw_affiliation_strings":["Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101995490","display_name":"John P. Hayes","orcid":"https://orcid.org/0000-0002-4747-492X"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John P. Hayes","raw_affiliation_strings":["Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5068964497"],"corresponding_institution_ids":["https://openalex.org/I27837315"],"apc_list":null,"apc_paid":null,"fwci":2.3417,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.89436923,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"56","issue":"4","first_page":"182","last_page":"191"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11321","display_name":"Error Correcting Code Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stochastic-computing","display_name":"Stochastic computing","score":0.881807804107666},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.8003129363059998},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6558274030685425},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5505203008651733},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5288230776786804},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5144296288490295},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5120366215705872},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.49742868542671204},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.48815542459487915},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.4212248921394348},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4145858883857727},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.34538811445236206},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.31663087010383606},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18614041805267334},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13441121578216553},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12834817171096802},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.11996620893478394},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09641459584236145},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08624956011772156}],"concepts":[{"id":"https://openalex.org/C2780971903","wikidata":"https://www.wikidata.org/wiki/Q2933705","display_name":"Stochastic computing","level":3,"score":0.881807804107666},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.8003129363059998},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6558274030685425},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5505203008651733},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5288230776786804},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5144296288490295},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5120366215705872},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.49742868542671204},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.48815542459487915},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.4212248921394348},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4145858883857727},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.34538811445236206},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31663087010383606},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18614041805267334},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13441121578216553},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12834817171096802},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.11996620893478394},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09641459584236145},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08624956011772156}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1515/itit-2013-1042","is_oa":false,"landing_page_url":"https://doi.org/10.1515/itit-2013-1042","pdf_url":null,"source":{"id":"https://openalex.org/S4210229153","display_name":"it - Information Technology","issn_l":"1611-2776","issn":["1611-2776","2196-7032"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"it - Information Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W141121412","https://openalex.org/W1534925464","https://openalex.org/W1866124897","https://openalex.org/W2003056114","https://openalex.org/W2019751845","https://openalex.org/W2024050764","https://openalex.org/W2027208482","https://openalex.org/W2027269053","https://openalex.org/W2037616057","https://openalex.org/W2077344647","https://openalex.org/W2098470668","https://openalex.org/W2101765144","https://openalex.org/W2125169487","https://openalex.org/W2143674663","https://openalex.org/W2153421476","https://openalex.org/W2171060285","https://openalex.org/W2497735908","https://openalex.org/W3142488006","https://openalex.org/W3149410719"],"related_works":["https://openalex.org/W2110991008","https://openalex.org/W2042832476","https://openalex.org/W2091801823","https://openalex.org/W2394408226","https://openalex.org/W2541274825","https://openalex.org/W2061536619","https://openalex.org/W3079537800","https://openalex.org/W2141072664","https://openalex.org/W2121052741","https://openalex.org/W2617032002"],"abstract_inverted_index":{"Abstract":[0],"Stochastic":[1,26],"computing":[2,8],"is":[3,11],"an":[4,29],"old":[5],"and":[6,19,41,64,80,95,118],"unconventional":[7],"technique":[9],"that":[10,124,147],"finding":[12],"promising":[13],"new":[14],"applications":[15],"in":[16,101],"image":[17],"processing":[18],"the":[20,51,92,96,102],"handling":[21],"of":[22,36,53,72,104,125],"complex":[23],"error-correcting":[24],"codes.":[25],"circuits":[27,34,98,113,127,149],"offer":[28],"alternative":[30],"to":[31,49,61,110,119,123],"conventional":[32,126],"digital":[33],"because":[35],"their":[37,121],"extremely":[38],"small":[39],"size":[40],"inherent":[42],"noise":[43],"tolerance.":[44],"They":[45],"are":[46],"also":[47],"well-suited":[48],"meeting":[50],"requirements":[52],"emerging":[54],"nanoscale":[55],"technologies":[56],"where":[57],"non-deterministic":[58],"behavior":[59,122],"due":[60],"manufacturing":[62],"defects":[63],"soft":[65],"errors":[66,89],"cannot":[67],"be":[68],"ignored.":[69],"Error":[70],"analysis":[71],"stochastic":[73,97,112,148],"circuits,":[74],"however,":[75],"has":[76],"received":[77],"little":[78],"attention":[79],"remains":[81],"a":[82,105],"largely":[83],"open":[84],"problem,":[85],"especially":[86],"when":[87],"multiple":[88],"affecting":[90],"both":[91],"data":[93],"sources":[94],"can":[99],"occur":[100],"course":[103],"computation.":[106],"This":[107],"paper":[108],"attempts":[109],"analyze":[111],"under":[114,128,155],"various":[115],"error":[116,130,153,157],"conditions,":[117],"compare":[120],"similar":[129],"conditions.":[131,158],"We":[132],"use":[133],"probabilistic":[134],"transfer":[135],"matrices":[136],"for":[137],"this":[138],"analysis,":[139],"complemented":[140],"by":[141],"circuit":[142],"simulation.":[143],"Our":[144],"results":[145],"indicate":[146],"provide":[150],"significantly":[151],"better":[152],"tolerance":[154],"severe":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}