{"id":"https://openalex.org/W2596598762","doi":"https://doi.org/10.1504/ijwmc.2017.10003980","title":"Strip wrinkling detection based on feature extraction and sparse representation","display_name":"Strip wrinkling detection based on feature extraction and sparse representation","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2596598762","doi":"https://doi.org/10.1504/ijwmc.2017.10003980","mag":"2596598762"},"language":"en","primary_location":{"id":"doi:10.1504/ijwmc.2017.10003980","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijwmc.2017.10003980","pdf_url":null,"source":{"id":"https://openalex.org/S168395412","display_name":"International Journal of Wireless and Mobile Computing","issn_l":"1741-1084","issn":["1741-1084","1741-1092"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Wireless and Mobile Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100770694","display_name":"Xiong Chen","orcid":"https://orcid.org/0000-0003-0855-4764"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiong Chen","raw_affiliation_strings":["Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China"],"affiliations":[{"raw_affiliation_string":"Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103040438","display_name":"Wenhao Wang","orcid":"https://orcid.org/0000-0002-7532-7409"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenhao Wang","raw_affiliation_strings":["Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China"],"affiliations":[{"raw_affiliation_string":"Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102490652","display_name":"Yuqi Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuqi Pan","raw_affiliation_strings":["Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China"],"affiliations":[{"raw_affiliation_string":"Intelligent Control Research Lab, Department of Electronic Engineering, Fudan University, Shanghai 200433, China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100770694"],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":0.2012,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48433965,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"12","issue":"1","first_page":"36","last_page":"36"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12206","display_name":"Vibration and Dynamic Analysis","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12206","display_name":"Vibration and Dynamic Analysis","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8283942341804504},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6797938942909241},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.6735876798629761},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.6330591440200806},{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.617967963218689},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5745989680290222},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.5676389336585999},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.557029128074646},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.5516204237937927},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.46452343463897705},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3711014688014984},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.05375772714614868}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8283942341804504},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6797938942909241},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.6735876798629761},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.6330591440200806},{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.617967963218689},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5745989680290222},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.5676389336585999},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.557029128074646},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.5516204237937927},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.46452343463897705},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3711014688014984},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.05375772714614868},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1504/ijwmc.2017.10003980","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijwmc.2017.10003980","pdf_url":null,"source":{"id":"https://openalex.org/S168395412","display_name":"International Journal of Wireless and Mobile Computing","issn_l":"1741-1084","issn":["1741-1084","1741-1092"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Wireless and Mobile Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1533496907","https://openalex.org/W1677409904","https://openalex.org/W2008081771","https://openalex.org/W2010641531","https://openalex.org/W2069959554","https://openalex.org/W2109852700","https://openalex.org/W2119667497","https://openalex.org/W2126607811","https://openalex.org/W2131846894","https://openalex.org/W2151103935","https://openalex.org/W2151693816","https://openalex.org/W2160547390","https://openalex.org/W2531607313"],"related_works":["https://openalex.org/W3034955165","https://openalex.org/W2094920358","https://openalex.org/W2041448692","https://openalex.org/W2247121321","https://openalex.org/W2391926582","https://openalex.org/W1966831329","https://openalex.org/W1995688991","https://openalex.org/W2020188645","https://openalex.org/W2739923608","https://openalex.org/W2049930962"],"abstract_inverted_index":{"Strip":[0],"wrinkling":[1,19,41,66],"is":[2,14,68,109],"a":[3,37,46,121],"kind":[4],"of":[5,25,65,75],"adverse":[6],"phenomenon":[7],"occurring":[8],"during":[9],"strip":[10,18,67,89,122],"steel":[11,123],"production.":[12],"It":[13],"necessary":[15],"to":[16],"detect":[17],"promptly":[20],"for":[21,31,40,70],"production":[22,124],"lines,":[23],"most":[24],"which":[26,98],"rely":[27],"on":[28],"manual":[29],"survey":[30],"detection":[32],"until":[33],"now.":[34],"To":[35],"provide":[36],"better":[38],"condition":[39],"detection,":[42],"this":[43,61,105],"paper":[44],"introduces":[45],"feature-based":[47],"image":[48],"processing":[49],"method.":[50,62],"Feature":[51],"extraction,":[52],"dictionary":[53,84,99],"learning":[54],"and":[55,126],"sparse":[56,112],"representation":[57],"are":[58],"included":[59],"in":[60,120],"Draped":[63],"surface":[64],"suitable":[69],"SIFT":[71],"technique":[72],"extracting":[73],"features":[74,79,101],"wrinkles.":[76],"The":[77,114],"extracted":[78],"will":[80],"be":[81,94],"collected":[82],"by":[83,96,111],"learning.":[85],"For":[86],"every":[87],"original":[88],"image,":[90],"detecting":[91],"wrinkles":[92],"may":[93],"realised":[95],"assessing":[97],"its":[100,130],"incline":[102],"to.":[103],"At":[104],"stage,":[106],"the":[107,127],"assessment":[108],"implemented":[110],"representation.":[113],"proposed":[115],"method":[116],"has":[117],"been":[118],"tested":[119],"line":[125],"performance":[128],"showed":[129],"applicability.":[131]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}