{"id":"https://openalex.org/W2621310642","doi":"https://doi.org/10.1504/ijmr.2017.10005448","title":"Quantitative Testing of micro-cracks by the MFL technique Based on GA-BP neural network","display_name":"Quantitative Testing of micro-cracks by the MFL technique Based on GA-BP neural network","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2621310642","doi":"https://doi.org/10.1504/ijmr.2017.10005448","mag":"2621310642"},"language":"en","primary_location":{"id":"doi:10.1504/ijmr.2017.10005448","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijmr.2017.10005448","pdf_url":null,"source":{"id":"https://openalex.org/S171766750","display_name":"International Journal of Manufacturing Research","issn_l":"1750-0591","issn":["1750-0591","1750-0605"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Manufacturing Research","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019056147","display_name":"Qiu Zhongchao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210097214","display_name":"Shandong Management University","ror":"https://ror.org/00vzprm14","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210097214"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhongchao Qiu","raw_affiliation_strings":["School of Mechanical and Electrical Engineering, Shandong Management University, Jinan, 250100, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical and Electrical Engineering, Shandong Management University, Jinan, 250100, China","institution_ids":["https://openalex.org/I4210097214"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5019056147"],"corresponding_institution_ids":["https://openalex.org/I4210097214"],"apc_list":null,"apc_paid":null,"fwci":0.3955,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60991633,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"12","issue":"1","first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9614999890327454,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9555000066757202,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.8506331443786621},{"id":"https://openalex.org/keywords/magnetic-flux-leakage","display_name":"Magnetic flux leakage","score":0.841105043888092},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.6378198266029358},{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.606890082359314},{"id":"https://openalex.org/keywords/nondestructive-testing","display_name":"Nondestructive testing","score":0.6008085608482361},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.5395528674125671},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41953182220458984},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4186558127403259},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3279162645339966},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2525095045566559},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23739168047904968},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.18982306122779846},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.1672345995903015},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.08904290199279785},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06615462899208069},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.061405450105667114},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.055732518434524536}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.8506331443786621},{"id":"https://openalex.org/C20892748","wikidata":"https://www.wikidata.org/wiki/Q4390394","display_name":"Magnetic flux leakage","level":3,"score":0.841105043888092},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.6378198266029358},{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.606890082359314},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.6008085608482361},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.5395528674125671},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41953182220458984},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4186558127403259},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3279162645339966},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2525095045566559},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23739168047904968},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.18982306122779846},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.1672345995903015},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.08904290199279785},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06615462899208069},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.061405450105667114},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.055732518434524536},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1504/ijmr.2017.10005448","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijmr.2017.10005448","pdf_url":null,"source":{"id":"https://openalex.org/S171766750","display_name":"International Journal of Manufacturing Research","issn_l":"1750-0591","issn":["1750-0591","1750-0605"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Manufacturing Research","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4384112194","https://openalex.org/W2783354812","https://openalex.org/W2103009189","https://openalex.org/W4312958259","https://openalex.org/W4390813131","https://openalex.org/W2902977491","https://openalex.org/W2101676717","https://openalex.org/W4241743597","https://openalex.org/W2165594630","https://openalex.org/W2577089618"],"abstract_inverted_index":{"Magnetic":[0],"flux":[1],"leakage":[2],"(MFL)":[3],"testing":[4],"is":[5,22,48,86,91],"one":[6],"of":[7,18,27,36,69,104,130],"the":[8,16,19,25,45,67,113,128,131],"traditional":[9],"electromagnetic":[10],"non-destructive":[11],"test":[12],"(NDT)":[13],"techniques,":[14],"and":[15,88,117],"focus":[17],"MFL":[20,46,78,115],"technique":[21,47],"to":[23,65],"predict":[24,66],"sizes":[26,68,129],"defects,":[28],"particularly":[29],"micro-cracks.":[30],"In":[31,63],"this":[32],"paper,":[33],"parameters":[34,89,102],"identification":[35,90,103],"artificial":[37,70,105],"rectangular":[38,71,106],"micro-cracks":[39,72,107],"ranging":[40,73],"between":[41,74],"0.1-0.3":[42,75],"mm":[43],"by":[44,56],"investigated":[49],"with":[50,93,112],"a":[51,57,77,94,118,124],"BP":[52],"neural":[53,61,96,120],"network":[54],"improved":[55],"genetic":[58],"algorithm":[59],"(GA-BP":[60],"network).":[62],"order":[64],"mm,":[76],"system":[79,116],"based":[80],"on":[81],"anisotropic":[82],"magneto-resistive":[83],"(AMR)":[84],"sensors":[85],"developed,":[87],"implemented":[92,110],"GABP":[95],"network.":[97],"The":[98],"results":[99],"show":[100],"that":[101],"can":[108],"be":[109],"effectively":[111],"developed":[114],"GA-BP":[119],"network,":[121],"which":[122],"provides":[123],"basis":[125],"for":[126],"predicting":[127],"natural":[132],"cracks.":[133],"[Received":[134],"19":[135],"July":[136],"2016;":[137],"Accepted":[138],"16":[139],"November":[140],"2016]":[141]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}