{"id":"https://openalex.org/W2748052226","doi":"https://doi.org/10.1504/ijhpcn.2017.10007215","title":"Addressing statistical significance of fault injection: empirical studies of the soft error susceptibility","display_name":"Addressing statistical significance of fault injection: empirical studies of the soft error susceptibility","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2748052226","doi":"https://doi.org/10.1504/ijhpcn.2017.10007215","mag":"2748052226"},"language":"en","primary_location":{"id":"doi:10.1504/ijhpcn.2017.10007215","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijhpcn.2017.10007215","pdf_url":null,"source":{"id":"https://openalex.org/S159903936","display_name":"International Journal of High Performance Computing and Networking","issn_l":"1740-0562","issn":["1740-0562","1740-0570"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of High Performance Computing and Networking","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036921385","display_name":"Sean Blanchard","orcid":"https://orcid.org/0000-0002-1119-7828"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sean Blanchard","raw_affiliation_strings":["Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056569157","display_name":"Nathan DeBardeleben","orcid":"https://orcid.org/0000-0002-5593-9205"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nathan DeBardeleben","raw_affiliation_strings":["Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082758762","display_name":"Song Fu","orcid":"https://orcid.org/0000-0002-7705-0829"},"institutions":[{"id":"https://openalex.org/I123534392","display_name":"University of North Texas","ror":"https://ror.org/00v97ad02","country_code":"US","type":"education","lineage":["https://openalex.org/I123534392"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Song Fu","raw_affiliation_strings":["Department of Computer Science and Engineering, University of North Texas, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, University of North Texas, USA","institution_ids":["https://openalex.org/I123534392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102787759","display_name":"Qiang Guan","orcid":"https://orcid.org/0000-0002-3804-8945"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qiang Guan","raw_affiliation_strings":["Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ultrascale Systems Research Center, Los Alamos National Laboratory, Bikini Atoll Rd., SM 30, Los Alamos, NM 87545, USA","institution_ids":["https://openalex.org/I1343871089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1408,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.49906768,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"10","issue":"4/5","first_page":"436","last_page":"436"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9905999898910522,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9670000076293945,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8131164312362671},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.7635233402252197},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6143004298210144},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5975626707077026},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5307823419570923},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5214916467666626},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5194970369338989},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.5120909214019775},{"id":"https://openalex.org/keywords/code","display_name":"Code (set theory)","score":0.4502604603767395},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40715935826301575},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.35396844148635864},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.2571873068809509},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.10805156826972961},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.07806462049484253}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8131164312362671},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.7635233402252197},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6143004298210144},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5975626707077026},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5307823419570923},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5214916467666626},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5194970369338989},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.5120909214019775},{"id":"https://openalex.org/C2776760102","wikidata":"https://www.wikidata.org/wiki/Q5139990","display_name":"Code (set theory)","level":3,"score":0.4502604603767395},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40715935826301575},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.35396844148635864},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.2571873068809509},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.10805156826972961},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.07806462049484253},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1504/ijhpcn.2017.10007215","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijhpcn.2017.10007215","pdf_url":null,"source":{"id":"https://openalex.org/S159903936","display_name":"International Journal of High Performance Computing and Networking","issn_l":"1740-0562","issn":["1740-0562","1740-0570"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of High Performance Computing and Networking","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2044069930","https://openalex.org/W2078707653","https://openalex.org/W3196277062","https://openalex.org/W4224229821","https://openalex.org/W2079643259","https://openalex.org/W2969553121","https://openalex.org/W2593605297","https://openalex.org/W2782341877","https://openalex.org/W2485576852","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Soft":[0],"errors":[1,46],"are":[2,178],"becoming":[3],"an":[4],"important":[5],"issue":[6],"in":[7,28,52,149,167,184],"computing":[8,18,23],"systems.":[9],"Near-threshold":[10],"voltage":[11],"(NTV),":[12],"reduced":[13],"circuit":[14],"sizes,":[15],"high":[16,21],"performance":[17],"(HPC),":[19],"and":[20,43,76,105,108],"altitude":[22],"all":[24],"present":[25],"interesting":[26],"challenges":[27],"this":[29,53],"area.":[30],"Much":[31],"of":[32,61,92,125,134,137,158],"the":[33,48,57,67,73,90,98,114,123,126,132,135,156],"existing":[34],"literature":[35],"has":[36],"focused":[37],"on":[38,72,103],"hardware":[39,49,150],"techniques":[40],"to":[41,83,113,117,164],"mitigate":[42],"measure":[44],"soft":[45,58],"at":[47,66,131],"level.":[50],"Instead,":[51],"paper,":[54],"we":[55,129,154,171,181],"explore":[56,96],"error":[59],"susceptibility":[60],"three":[62],"common":[63],"sorting":[64],"algorithms":[65],"software":[68,79],"layer.":[69],"We":[70,95],"focus":[71],"comparison":[74],"operator":[75],"use":[77],"our":[78,168,185],"fault":[80,138,151,176],"injection":[81,152],"tool":[82],"place":[84],"faults":[85,111],"with":[86],"fine":[87],"precision":[88],"during":[89],"execution":[91],"these":[93,110],"algorithms.":[94],"how":[97,119],"algorithm":[99],"susceptibilities":[100],"vary":[101],"based":[102],"input":[104],"bit":[106],"position":[107],"relate":[109],"back":[112],"source":[115],"code":[116],"study":[118],"algorithmic":[120],"decisions":[121],"impact":[122],"reliability":[124],"codes.":[127],"Finally,":[128],"look":[130],"question":[133],"number":[136,157],"injections":[139,159,177],"required":[140,163,179],"for":[141],"statistical":[142],"significance.":[143],"Using":[144],"standard":[145],"practice":[146],"equations":[147],"used":[148],"experiments,":[153],"calculate":[155],"that":[160,174],"should":[161],"be":[162],"achieve":[165],"confidence":[166,183],"results.":[169],"Then":[170],"show,":[172],"empirically,":[173],"more":[175],"before":[180],"gain":[182],"experiments.":[186]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}