{"id":"https://openalex.org/W2629825550","doi":"https://doi.org/10.1504/ijes.2017.10005720","title":"A near-field magnet peak values detecting method to locate short circuit points on PCB","display_name":"A near-field magnet peak values detecting method to locate short circuit points on PCB","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2629825550","doi":"https://doi.org/10.1504/ijes.2017.10005720","mag":"2629825550"},"language":"en","primary_location":{"id":"doi:10.1504/ijes.2017.10005720","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijes.2017.10005720","pdf_url":null,"source":{"id":"https://openalex.org/S204369148","display_name":"International Journal of Embedded Systems","issn_l":"1741-1068","issn":["1741-1068","1741-1076"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Embedded Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091835003","display_name":"Yuyu Zhou","orcid":"https://orcid.org/0000-0003-1765-6789"},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuyu Zhou","raw_affiliation_strings":["Network and Education Technology Center, Jinan University, Guangzhou, 510632, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Network and Education Technology Center, Jinan University, Guangzhou, 510632, China","institution_ids":["https://openalex.org/I159948400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035431006","display_name":"Zhusong Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhusong Liu","raw_affiliation_strings":["Faculty of Computer Science and Technology, Guangdong University of Technology, Guangzhou, 510006, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Computer Science and Technology, Guangdong University of Technology, Guangzhou, 510006, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074511196","display_name":"Hongchun Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongchun Zhou","raw_affiliation_strings":["Network and Education Technology Center, Jinan University, Guangzhou, 510632, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Network and Education Technology Center, Jinan University, Guangzhou, 510632, China","institution_ids":["https://openalex.org/I159948400"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101453506","display_name":"Shuqiang Huang","orcid":"https://orcid.org/0000-0001-9551-022X"},"institutions":[{"id":"https://openalex.org/I159948400","display_name":"Jinan University","ror":"https://ror.org/02xe5ns62","country_code":"CN","type":"education","lineage":["https://openalex.org/I159948400"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuqiang Huang","raw_affiliation_strings":["Network and Education Technology Center, Jinan University, Guangzhou, 510632, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Network and Education Technology Center, Jinan University, Guangzhou, 510632, China","institution_ids":["https://openalex.org/I159948400"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113174191","display_name":"Jielin Zeng","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jielin Zeng","raw_affiliation_strings":["Guangdong Planning and Designing Institute of Telecommunications Co., Ltd., Guangzhou, 510632, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangdong Planning and Designing Institute of Telecommunications Co., Ltd., Guangzhou, 510632, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1408,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.48386946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"9","issue":"3","first_page":"262","last_page":"262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9811999797821045,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.977400004863739,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.7534877061843872},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.6736721396446228},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5813369750976562},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5664633512496948},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5390408039093018},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5163899064064026},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48150691390037537},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4754236042499542},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.47260692715644836},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.44211989641189575},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3811003565788269},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25736314058303833},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11992281675338745},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.05501353740692139}],"concepts":[{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.7534877061843872},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.6736721396446228},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5813369750976562},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5664633512496948},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5390408039093018},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5163899064064026},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48150691390037537},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4754236042499542},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.47260692715644836},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.44211989641189575},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3811003565788269},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25736314058303833},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11992281675338745},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.05501353740692139},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1504/ijes.2017.10005720","is_oa":false,"landing_page_url":"https://doi.org/10.1504/ijes.2017.10005720","pdf_url":null,"source":{"id":"https://openalex.org/S204369148","display_name":"International Journal of Embedded Systems","issn_l":"1741-1068","issn":["1741-1068","1741-1076"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310317825","host_organization_name":"Inderscience Publishers","host_organization_lineage":["https://openalex.org/P4310317825"],"host_organization_lineage_names":["Inderscience Publishers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Embedded Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4252608911","https://openalex.org/W2184913151","https://openalex.org/W2389426768","https://openalex.org/W3147987719","https://openalex.org/W2599361292","https://openalex.org/W2698654916","https://openalex.org/W2907188494","https://openalex.org/W3163908127","https://openalex.org/W2013997577","https://openalex.org/W2975185102"],"abstract_inverted_index":{"The":[0,110],"existing":[1],"print":[2],"circuit":[3,7,35,58,64,92,106,125],"board":[4,93],"(PCB)":[5],"short":[6,34,57,63,105,124],"fault":[8],"detecting":[9,59],"schemes":[10],"can":[11,98,120],"only":[12],"determine":[13],"the":[14,20,24,40,47,50,62,73,77,82,87,91,100,104,115,123],"existence":[15],"of":[16,23,49,76,103],"shorts":[17],"rather":[18],"than":[19],"precise":[21,101],"location":[22],"circuit.":[25],"To":[26],"solve":[27],"this":[28,30],"problem,":[29],"paper":[31],"proposes":[32],"a":[33,56,69],"locating":[36],"scheme":[37,97],"based":[38],"on":[39,108],"near-field":[41,79],"magnetic":[42,78],"specific":[43],"point":[44,107,126],"detecting.":[45],"First,":[46],"existences":[48],"shorted":[51],"wires":[52],"are":[53,66],"detected":[54,85],"by":[55,68,81,86],"algorithm.":[60],"Second,":[61],"networks":[65],"excited":[67],"high":[70],"voltage.":[71],"Third,":[72],"peak":[74],"values":[75],"exited":[80],"voltage":[83],"will":[84],"sensors":[88],"arranged":[89],"above":[90],"and":[94,119],"analysed.":[95],"This":[96],"locate":[99,122],"position":[102],"board.":[109],"simulation":[111],"results":[112],"show":[113],"that":[114],"technique":[116],"is":[117],"operational":[118],"effectively":[121],"position.":[127]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}