{"id":"https://openalex.org/W186084000","doi":"https://doi.org/10.1360/02yf9040","title":"Clustering of behavioral phases in FSMs and its applications to VLSI test","display_name":"Clustering of behavioral phases in FSMs and its applications to VLSI test","publication_year":2002,"publication_date":"2002-12-01","ids":{"openalex":"https://openalex.org/W186084000","doi":"https://doi.org/10.1360/02yf9040","mag":"186084000"},"language":"en","primary_location":{"id":"doi:10.1360/02yf9040","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1360/02yf9040","pdf_url":null,"source":{"id":"https://openalex.org/S4210224633","display_name":"Science in China Series F Information Sciences","issn_l":"1009-2757","issn":["1009-2757","1862-2836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science in China Series F Information Sciences","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100768288","display_name":"Huawei Li","orcid":"https://orcid.org/0000-0001-8082-4218"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Huawei Li","raw_affiliation_strings":["Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"raw_affiliation_string":"[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100816008","display_name":"Yinghua Min","orcid":null},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yinghua Min","raw_affiliation_strings":["Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"raw_affiliation_string":"[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]","institution_ids":["https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5106406114","display_name":"Zhongcheng Li","orcid":"https://orcid.org/0000-0001-9485-2842"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhongcheng Li","raw_affiliation_strings":["Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Computing Technology, Chinese Academy of Sciences, 100080, Beijing, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]},{"raw_affiliation_string":"[Institute Of Computing Technology, Chinese Academy of Sciences, Beijing, China]","institution_ids":["https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100768288"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210090176"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.02966695,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"45","issue":"6","first_page":"462","last_page":"478"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.8002524375915527},{"id":"https://openalex.org/keywords/behavioral-modeling","display_name":"Behavioral modeling","score":0.696090042591095},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6423605680465698},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5668541789054871},{"id":"https://openalex.org/keywords/behavioral-pattern","display_name":"Behavioral pattern","score":0.525558352470398},{"id":"https://openalex.org/keywords/finite-state-machine","display_name":"Finite-state machine","score":0.5111075043678284},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3462997078895569},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3434038758277893},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2726113796234131},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19459310173988342},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.07996100187301636},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.0698680579662323}],"concepts":[{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.8002524375915527},{"id":"https://openalex.org/C78639753","wikidata":"https://www.wikidata.org/wiki/Q3318160","display_name":"Behavioral modeling","level":2,"score":0.696090042591095},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6423605680465698},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5668541789054871},{"id":"https://openalex.org/C83804111","wikidata":"https://www.wikidata.org/wiki/Q1063558","display_name":"Behavioral pattern","level":2,"score":0.525558352470398},{"id":"https://openalex.org/C167822520","wikidata":"https://www.wikidata.org/wiki/Q176452","display_name":"Finite-state machine","level":2,"score":0.5111075043678284},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3462997078895569},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3434038758277893},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2726113796234131},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19459310173988342},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.07996100187301636},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0698680579662323},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1360/02yf9040","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1360/02yf9040","pdf_url":null,"source":{"id":"https://openalex.org/S4210224633","display_name":"Science in China Series F Information Sciences","issn_l":"1009-2757","issn":["1009-2757","1862-2836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Science in China Series F Information Sciences","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W35683430","https://openalex.org/W1574480256","https://openalex.org/W2026317494","https://openalex.org/W2096835930","https://openalex.org/W2100139728","https://openalex.org/W2124618076","https://openalex.org/W2133650527","https://openalex.org/W2135931142","https://openalex.org/W2146657836","https://openalex.org/W2161273503","https://openalex.org/W2167352014","https://openalex.org/W2541102694","https://openalex.org/W3016023799","https://openalex.org/W4230587734","https://openalex.org/W4238736398","https://openalex.org/W6699570678"],"related_works":["https://openalex.org/W2152238375","https://openalex.org/W3088948716","https://openalex.org/W432535052","https://openalex.org/W4210491229","https://openalex.org/W2031110496","https://openalex.org/W4384559558","https://openalex.org/W4285612255","https://openalex.org/W2075878881","https://openalex.org/W2013973943","https://openalex.org/W2354206928"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,14,106,111,122,155,165],"new":[4,42,107],"level":[5],"of":[6,13,28,33,50,88,101,142,164],"description":[7,19,43],"between":[8],"behavioral":[9,22,29,34,67,75,77,84,89,102,123,143],"and":[10,31,48,86],"state":[11],"descriptions":[12],"finite-state":[15],"machine":[16],"(FSM).":[17],"The":[18,41],"is":[20,56,72,128,138],"termed":[21],"phase":[23,30,103,124],"clustering":[24,32,87,104,141],"description.":[25],"New":[26],"concepts":[27],"phases":[35,68,78,90],"in":[36,110,130,158,168],"an":[37,54],"FSM":[38,51,55],"are":[39],"introduced.":[40],"simplifies":[44],"functional":[45,96],"analysis,":[46],"verification":[47],"test":[49,112,135,151],"designs.":[52],"If":[53,70],"described":[57,73],"at":[58,74,116,161],"low":[59],"level,":[60,76],"some":[61],"states":[62],"can":[63,79,91],"be":[64,80,92],"clustered":[65],"into":[66],"directly.":[69],"it":[71],"extracted":[81],"from":[82],"the":[83,162],"description,":[85],"performed":[93],"through":[94,140],"easy":[95],"analysis.":[97],"As":[98],"one":[99],"application":[100],"descriptions,":[105],"technique":[108],"employed":[109],"generation":[113,136],"system,":[114],"ATCLUB,":[115,134],"Register":[117],"Transfer":[118],"(RT)-level":[119],"based":[120],"on":[121],"transition":[125],"fault":[126,169],"model":[127],"introduced":[129],"this":[131],"paper.":[132],"In":[133],"process":[137],"accelerated":[139],"phases.":[144],"Experimental":[145],"results":[146],"show":[147],"that":[148],"ATCLUB":[149],"generates":[150],"sequence":[152],"efficiently,":[153],"with":[154],"sharp":[156],"decrease":[157,167],"vector":[159],"count":[160],"penalty":[163],"slightly":[166],"coverage":[170],"comparing":[171],"to":[172],"other":[173],"ATPG":[174],"tools.":[175]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}