{"id":"https://openalex.org/W6884853433","doi":"https://doi.org/10.13016/ogmy-8edj","title":"PROGNOSTICS AND SECURE HEALTH MANAGEMENT OF ANALOG CIRCUITS","display_name":"PROGNOSTICS AND SECURE HEALTH MANAGEMENT OF ANALOG CIRCUITS","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W6884853433","doi":"https://doi.org/10.13016/ogmy-8edj"},"language":"en","primary_location":{"id":"doi:10.13016/ogmy-8edj","is_oa":true,"landing_page_url":"https://doi.org/10.13016/ogmy-8edj","pdf_url":null,"source":{"id":"https://openalex.org/S4306402644","display_name":"Digital Repository at the University of Maryland (University of Maryland College Park)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66946132","host_organization_name":"University of Maryland, College Park","host_organization_lineage":["https://openalex.org/I66946132"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},"type":"other","indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.13016/ogmy-8edj","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Khemani, Varun","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Khemani, Varun","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":null,"topics":[],"keywords":[{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5259000062942505},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.5166000127792358},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5058000087738037},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4708999991416931},{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.4207000136375427},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.412200003862381},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.3959999978542328},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.37299999594688416}],"concepts":[{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5259000062942505},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.5166000127792358},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5058000087738037},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4726000130176544},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4708999991416931},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4677000045776367},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42660000920295715},{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.4207000136375427},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.412200003862381},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4106999933719635},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.3959999978542328},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38499999046325684},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.37299999594688416},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.35040000081062317},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.35010001063346863},{"id":"https://openalex.org/C2780873074","wikidata":"https://www.wikidata.org/wiki/Q5656397","display_name":"Hardware Trojan","level":3,"score":0.34060001373291016},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.33169999718666077},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.33059999346733093},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.3296999931335449},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.3287000060081482},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.3057999908924103},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.29789999127388},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28780001401901245},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2743000090122223},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.2720000147819519},{"id":"https://openalex.org/C132943942","wikidata":"https://www.wikidata.org/wiki/Q2562511","display_name":"Footprint","level":2,"score":0.25850000977516174},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.2513999938964844}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.13016/ogmy-8edj","is_oa":true,"landing_page_url":"https://doi.org/10.13016/ogmy-8edj","pdf_url":null,"source":{"id":"https://openalex.org/S4306402644","display_name":"Digital Repository at the University of Maryland (University of Maryland College Park)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66946132","host_organization_name":"University of Maryland, College Park","host_organization_lineage":["https://openalex.org/I66946132"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":{"id":"doi:10.13016/ogmy-8edj","is_oa":true,"landing_page_url":"https://doi.org/10.13016/ogmy-8edj","pdf_url":null,"source":{"id":"https://openalex.org/S4306402644","display_name":"Digital Repository at the University of Maryland (University of Maryland College Park)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I66946132","host_organization_name":"University of Maryland, College Park","host_organization_lineage":["https://openalex.org/I66946132"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":[],"abstract_inverted_index":{"Analog":[0],"circuits":[1,8,20,173],"are":[2,29,54,192,208,215,223,238,298,309,353,364,383],"a":[3,55,204,216,299,304],"critical":[4,46],"part":[5],"of":[6,25,35,50,57,73,79,110,132,139,164,171,181,219,227,234,257,311,374,380],"industrial":[7,51],"and":[9,41,102,134,207,230,280,294,319,376],"systems.":[10],"Estimates":[11],"in":[12,70,99,148,168,270,277,314,372],"the":[13,48,71,108,125,130,136,140,156,162,169,179,232,278,315,381],"literature":[14],"show":[15],"that,":[16],"even":[17],"though":[18],"analog":[19,38,61],"comprise":[21],"less":[22],"than":[23,33,195],"20%":[24],"all":[26],"circuits,":[27],"they":[28,199,248],"responsible":[30],"for":[31,95,306,359,385],"more":[32,193],"80%":[34],"faults.":[36],"Hence,":[37],"circuit":[39,62,80,126,157,235,274],"Prognosis":[40,279],"Health":[42,282],"Management":[43,283],"(PHM)":[44],"is":[45,120,129,146,263,303],"to":[47,67,93,105,153,178,210,240,265,272,324,333,338,348,355,366,368],"health":[49],"circuits.":[52],"There":[53],"multitude":[56],"ways":[58],"that":[59,97,122,128,222],"any":[60],"can":[63,123],"fail,":[64],"which":[65,302,330],"leads":[66],"proportional":[68],"scaling":[69],"number":[72,78,109],"possible":[74,111],"fault":[75,112],"classes":[76,113],"with":[77,150],"components.":[81,236],"Therefore,":[82],"this":[83],"research":[84,382],"presents":[85],"an":[86,100,335],"advanced":[87],"Design":[88],"Of":[89],"Experiments-based":[90],"(DOE)":[91],"approach":[92,119,262],"account":[94],"components":[96],"degrade":[98],"individual":[101],"interacting":[103],"fashion,":[104],"narrow":[106],"down":[107],"under":[114],"consideration.":[115],"A":[116],"wavelet-based":[117],"deep-learning":[118],"developed":[121],"localize":[124],"component":[127],"source":[131,163],"degradation":[133,151],"predict":[135,154],"exact":[137],"value":[138,145],"degraded":[141,144],"component.":[142],"This":[143],"used":[147,323],"conjunction":[149],"models":[152],"when":[155],"will":[158],"fail":[159],"based":[160],"on":[161,292,346],"degradation.":[165],"Increasing":[166],"outsourcing":[167],"fabrication":[170,228],"electronic":[172],"has":[174],"made":[175,365],"them":[176],"susceptible":[177],"insertion":[180,256],"hardware":[182,190,220,268],"trojans":[183,191,197,214,221,269],"by":[184,203],"untrusted":[185],"foundries.":[186],"In":[187],"many":[188],"cases,":[189],"destructive":[194],"software":[196,205],"as":[198,247],"cannot":[200],"be":[201,334],"remedied":[202],"patch":[206],"impossible":[209],"repair.":[211],"Process":[212],"reliability":[213],"new":[217],"class":[218],"inserted":[224],"through":[225,242],"modification":[226],"parameters":[229],"accelerate":[231],"aging":[233],"They":[237,321],"challenging":[239],"detect":[241,266],"traditional":[243],"trojan":[244],"detection":[245],"methods":[246],"have":[249],"zero":[250],"area":[251],"footprint":[252],"i.e.,":[253],"require":[254],"no":[255],"additional":[258],"circuitry.":[259],"The":[260],"PHM":[261],"modified":[264],"these":[267],"order":[271],"incorporate":[273],"security,":[275],"resulting":[276],"Secure":[281],"(PSHM)":[284],"framework.":[285],"Deep":[286],"neural":[287,340,357],"networks":[288,328,358],"achieve":[289,343],"state-of-the-art":[290,344],"performance":[291,345,375],"classification":[293],"regression":[295],"applications":[296,379],"but":[297,352],"black-box":[300],"approach,":[301],"concern":[305],"implementation.":[307],"Wavelets":[308],"approximations":[310],"cells":[312],"found":[313],"human":[316],"visual":[317],"cortex":[318],"cochlea.":[320],"were":[322,331],"develop":[325],"wavelet":[326],"scattering":[327],"(WSNs),":[329],"intended":[332],"interpretable":[336],"alternative":[337],"deep":[339,356],"networks.":[341],"WSNs":[342,367],"low":[347],"moderately":[349],"complex":[350,361],"datasets":[351],"inferior":[354],"extremely":[360],"datasets.":[362],"Improvements":[363],"overcome":[369],"their":[370],"shortcomings":[371],"terms":[373],"learnability.":[377],"Further":[378],"highlighted":[384],"rotating":[386],"machinery":[387],"vibration":[388],"analytics,":[389],"functional":[390],"safety":[391],"online":[392],"estimation":[393],"etc.":[394]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}