{"id":"https://openalex.org/W2069947399","doi":"https://doi.org/10.1198/004017007000000461","title":"Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam","display_name":"Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam","publication_year":2008,"publication_date":"2008-02-01","ids":{"openalex":"https://openalex.org/W2069947399","doi":"https://doi.org/10.1198/004017007000000461","mag":"2069947399"},"language":"en","primary_location":{"id":"doi:10.1198/004017007000000461","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017007000000461","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041470785","display_name":"Nicolas Hengartner","orcid":"https://orcid.org/0000-0002-4157-134X"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nicolas W Hengartner","raw_affiliation_strings":["Information Sciences Group, Los Alamos National Laboratory, Los Alamos, NM 87545","Information Sciences Group, Los Alamos National Laboratory , Los Alamos , NM , 87545"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Sciences Group, Los Alamos National Laboratory, Los Alamos, NM 87545","institution_ids":["https://openalex.org/I1343871089"]},{"raw_affiliation_string":"Information Sciences Group, Los Alamos National Laboratory , Los Alamos , NM , 87545","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056802695","display_name":"Sarah Michalak","orcid":"https://orcid.org/0000-0002-2482-1802"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sarah E Michalak","raw_affiliation_strings":["Statistical Sciences Group, Los Alamos National Laboratory, Los Alamos, NM 87545","Statistical Sciences Group, Los Alamos National Laboratory , Los Alamos , NM , 87545"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Statistical Sciences Group, Los Alamos National Laboratory, Los Alamos, NM 87545","institution_ids":["https://openalex.org/I1343871089"]},{"raw_affiliation_string":"Statistical Sciences Group, Los Alamos National Laboratory , Los Alamos , NM , 87545","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010913088","display_name":"B.E. Takala","orcid":null},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bruce E Takala","raw_affiliation_strings":["Accelerator Operations and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Accelerator Operations and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068263816","display_name":"S.A. Wender","orcid":"https://orcid.org/0000-0002-2446-5115"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephen A Wender","raw_affiliation_strings":["Neutron and Nuclear Science Group, Los Alamos National Laboratory, Los Alamos, NM 87545"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Neutron and Nuclear Science Group, Los Alamos National Laboratory, Los Alamos, NM 87545","institution_ids":["https://openalex.org/I1343871089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1343871089"],"apc_list":null,"apc_paid":null,"fwci":0.3019,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68038071,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"50","issue":"1","first_page":"8","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.7156609892845154},{"id":"https://openalex.org/keywords/cross-section","display_name":"Cross section (physics)","score":0.5078149437904358},{"id":"https://openalex.org/keywords/neutron-radiation","display_name":"Neutron radiation","score":0.46626362204551697},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.45175492763519287},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43046438694000244},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.3878445327281952},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33953285217285156},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.33699384331703186},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17553076148033142}],"concepts":[{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.7156609892845154},{"id":"https://openalex.org/C52234038","wikidata":"https://www.wikidata.org/wiki/Q17128025","display_name":"Cross section (physics)","level":2,"score":0.5078149437904358},{"id":"https://openalex.org/C30134620","wikidata":"https://www.wikidata.org/wiki/Q922364","display_name":"Neutron radiation","level":3,"score":0.46626362204551697},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.45175492763519287},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43046438694000244},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.3878445327281952},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33953285217285156},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.33699384331703186},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17553076148033142},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1198/004017007000000461","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017007000000461","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1480499088","https://openalex.org/W1534416612","https://openalex.org/W2026329473","https://openalex.org/W2116097016","https://openalex.org/W2143557070","https://openalex.org/W2147032860","https://openalex.org/W2159966346","https://openalex.org/W2161109877","https://openalex.org/W2496945377","https://openalex.org/W3187317723"],"related_works":["https://openalex.org/W2011020689","https://openalex.org/W2023134028","https://openalex.org/W250276870","https://openalex.org/W1992688329","https://openalex.org/W1976587555","https://openalex.org/W2924398351","https://openalex.org/W1996540282","https://openalex.org/W1863440224","https://openalex.org/W2168297886","https://openalex.org/W3012403021"],"abstract_inverted_index":{"Cosmic":[0],"ray\u2013induced":[1],"neutrons":[2],"can":[3],"cause":[4],"bit":[5,58,72,86,125],"flips":[6],"in":[7,29],"silicon-based":[8,63],"electronic":[9,64],"devices,":[10],"such":[11,37],"as":[12,38,74],"computer":[13],"memory.":[14],"To":[15],"estimate":[16],"the":[17,39,47,67,85,112,114,118,124],"frequency":[18],"of":[19,41,61,69,77,84,123],"occurrence,":[20],"a":[21,30,34,62,71,75,99,106],"device":[22,65],"may":[23],"be":[24],"tested":[25],"by":[26],"placing":[27],"it":[28],"neutron":[31,78,91],"beam":[32,92],"at":[33,46],"testing":[35],"facility,":[36],"Irradiation":[40],"Chips":[42],"and":[43],"Electronics":[44],"facility":[45],"Los":[48,53],"Alamos":[49,54],"Neutron":[50],"Science":[51],"Center,":[52],"National":[55],"Laboratory.":[56],"The":[57],"failure":[59,87,126],"cross-section":[60,88,127],"describes":[66],"probability":[68],"causing":[70],"flip":[73],"function":[76],"energy.":[79],"This":[80],"article":[81],"discusses":[82],"estimation":[83,122],"based":[89],"on":[90],"testing.":[93],"We":[94,104],"show":[95],"that":[96],"this":[97],"is":[98],"severely":[100],"ill-posed":[101],"inverse":[102],"problem.":[103],"present":[105],"general":[107],"methodology":[108],"for":[109],"evaluating,":[110],"before":[111],"experiment,":[113],"extent":[115],"to":[116],"which":[117],"experimental":[119],"protocol":[120],"permits":[121],"through":[128],"nonparametric":[129],"penalized":[130],"maximum":[131],"likelihood.":[132]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2026-08-15T07:11:24.734988","created_date":"2025-10-10T00:00:00"}