{"id":"https://openalex.org/W2025300703","doi":"https://doi.org/10.1198/004017006000000138","title":"Extreme (X-)Testing With Binary Data and Applications to Reliability Demonstration","display_name":"Extreme (X-)Testing With Binary Data and Applications to Reliability Demonstration","publication_year":2006,"publication_date":"2006-08-01","ids":{"openalex":"https://openalex.org/W2025300703","doi":"https://doi.org/10.1198/004017006000000138","mag":"2025300703"},"language":"en","primary_location":{"id":"doi:10.1198/004017006000000138","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017006000000138","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076830112","display_name":"David Mease","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133369","display_name":"Decision Sciences (United States)","ror":"https://ror.org/03gcvf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210133369"]},{"id":"https://openalex.org/I51504820","display_name":"San Jose State University","ror":"https://ror.org/04qyvz380","country_code":"US","type":"education","lineage":["https://openalex.org/I51504820"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"David Mease","raw_affiliation_strings":["Department of Marketing and Decision Sciences San Jose State University San Jose, CA 95192-0069"],"affiliations":[{"raw_affiliation_string":"Department of Marketing and Decision Sciences San Jose State University San Jose, CA 95192-0069","institution_ids":["https://openalex.org/I51504820","https://openalex.org/I4210133369"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5078363534","display_name":"Vijayan N. Nair","orcid":"https://orcid.org/0000-0002-6511-7432"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijayan N Nair","raw_affiliation_strings":["Department of Statistics University of Michigan Ann Arbor, MI 48109-1107"],"affiliations":[{"raw_affiliation_string":"Department of Statistics University of Michigan Ann Arbor, MI 48109-1107","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5076830112"],"corresponding_institution_ids":["https://openalex.org/I4210133369","https://openalex.org/I51504820"],"apc_list":null,"apc_paid":null,"fwci":0.2787,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.53956149,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"48","issue":"3","first_page":"399","last_page":"410"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9904000163078308,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7940558195114136},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7617920637130737},{"id":"https://openalex.org/keywords/sample-size-determination","display_name":"Sample size determination","score":0.605635941028595},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.515958845615387},{"id":"https://openalex.org/keywords/binary-number","display_name":"Binary number","score":0.4977850914001465},{"id":"https://openalex.org/keywords/accelerated-life-testing","display_name":"Accelerated life testing","score":0.4695701599121094},{"id":"https://openalex.org/keywords/statistical-power","display_name":"Statistical power","score":0.43534162640571594},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.43445777893066406},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4188617169857025},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.4155942499637604},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2967127859592438},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2725171744823456},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1270897388458252},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.09364885091781616}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7940558195114136},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7617920637130737},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.605635941028595},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.515958845615387},{"id":"https://openalex.org/C48372109","wikidata":"https://www.wikidata.org/wiki/Q3913","display_name":"Binary number","level":2,"score":0.4977850914001465},{"id":"https://openalex.org/C158379689","wikidata":"https://www.wikidata.org/wiki/Q3533504","display_name":"Accelerated life testing","level":3,"score":0.4695701599121094},{"id":"https://openalex.org/C96608239","wikidata":"https://www.wikidata.org/wiki/Q1199823","display_name":"Statistical power","level":2,"score":0.43534162640571594},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.43445777893066406},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4188617169857025},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4155942499637604},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2967127859592438},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2725171744823456},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1270897388458252},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.09364885091781616},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1198/004017006000000138","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017006000000138","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320309652","display_name":"University of Michigan","ror":"https://ror.org/00jmfr291"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W98782214","https://openalex.org/W578754772","https://openalex.org/W600016741","https://openalex.org/W613512160","https://openalex.org/W1515752257","https://openalex.org/W1580788756","https://openalex.org/W1827572317","https://openalex.org/W1970043413","https://openalex.org/W2026609738","https://openalex.org/W2050938663","https://openalex.org/W2078251327","https://openalex.org/W2151038992","https://openalex.org/W2169730590","https://openalex.org/W2795854098","https://openalex.org/W2804669208","https://openalex.org/W3015317271","https://openalex.org/W3147894994","https://openalex.org/W4231816276","https://openalex.org/W4233372406"],"related_works":["https://openalex.org/W1989415248","https://openalex.org/W977438452","https://openalex.org/W3041891053","https://openalex.org/W139386289","https://openalex.org/W2107645900","https://openalex.org/W3183286355","https://openalex.org/W4225365170","https://openalex.org/W2971193366","https://openalex.org/W1663268383","https://openalex.org/W2049509720"],"abstract_inverted_index":{"Reliability":[0],"demonstration":[1,39,125],"techniques":[2],"are":[3,70,127,133,159,172,179,190],"used":[4,191],"to":[5,28,35,52,56,73,79,90,137,153,166,174,187,192],"formally":[6],"verify":[7],"that":[8,68,85],"the":[9,25,58,91,194,198],"reliability":[10,26,38,83,93,124,188],"of":[11,22,106,116,123,130,197],"a":[12,15,19,81,100],"product":[13],"meets":[14],"specified":[16],"target":[17,27,84],"with":[18,111,135],"certain":[20],"degree":[21],"confidence.":[23],"When":[24],"be":[29,87],"demonstrated":[30],"is":[31,55,76,162],"very":[32],"high":[33],"(close":[34],"1),":[36],"traditional":[37],"plans":[40,126],"require":[41],"extremely":[42],"large":[43],"sample":[44,119,141],"sizes":[45],"or":[46,109,155],"have":[47],"low":[48],"power.":[49],"One":[50],"solution":[51],"this":[53,104],"problem":[54],"inflate":[57],"failure":[59],"probability":[60],"by":[61],"testing":[62,168],"products":[63],"under":[64,94,149],"extreme":[65,107],"conditions":[66],"so":[67],"they":[69],"more":[71],"likely":[72],"fail.":[74],"It":[75],"sufficient":[77],"then":[78],"demonstrate":[80],"lower":[82],"can":[86],"mapped":[88],"back":[89],"required":[92],"standard":[95],"conditions.":[96],"This":[97],"article":[98],"develops":[99],"general":[101,195],"framework":[102],"for":[103],"type":[105],"testing,":[108],"\u201cX-testing,\u201d":[110],"binary":[112],"data.":[113],"The":[114],"effects":[115],"X-testing":[117,161],"on":[118],"size":[120,142],"and":[121,144],"power":[122,146],"discussed.":[128],"Properties":[129],"various":[131],"X-transforms":[132,151],"studied":[134],"respect":[136],"zero-failure":[138],"plans,":[139,143],"fixed":[140,145],"plans.":[147],"Conditions":[148],"which":[150],"lead":[152],"inadmissible":[154],"uniformly":[156],"efficient":[157],"tests":[158],"obtained.":[160],"similar":[163],"in":[164,185],"spirit":[165],"accelerated":[167],"as":[169],"both":[170],"methods":[171],"intended":[173],"induce":[175],"failures,":[176],"but":[177],"there":[178],"some":[180],"key":[181],"differences.":[182],"Several":[183],"applications,":[184],"addition":[186],"demonstration,":[189],"illustrate":[193],"usefulness":[196],"approach.":[199]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}