{"id":"https://openalex.org/W2134421465","doi":"https://doi.org/10.1198/004017005000000553","title":"Wavelet-Based Data Reduction Techniques for Process Fault Detection","display_name":"Wavelet-Based Data Reduction Techniques for Process Fault Detection","publication_year":2006,"publication_date":"2006-01-17","ids":{"openalex":"https://openalex.org/W2134421465","doi":"https://doi.org/10.1198/004017005000000553","mag":"2134421465"},"language":"en","primary_location":{"id":"doi:10.1198/004017005000000553","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017005000000553","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033748503","display_name":"Myong K. Jeong","orcid":"https://orcid.org/0000-0002-4124-5253"},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Myong K Jeong","raw_affiliation_strings":["Department of Industrial and Information Engineering, The University of Tennessee, Knoxville, TN 37996"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Industrial and Information Engineering, The University of Tennessee, Knoxville, TN 37996","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033869327","display_name":"Jye\u2010Chyi Lu","orcid":"https://orcid.org/0000-0001-6628-1544"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jye-Chyi Lu","raw_affiliation_strings":["School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014880531","display_name":"Xiaoming Huo","orcid":"https://orcid.org/0000-0003-0101-1206"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoming Huo","raw_affiliation_strings":["School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029550725","display_name":"Brani Vidakovi\u0107","orcid":"https://orcid.org/0000-0001-9155-9325"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brani Vidakovic","raw_affiliation_strings":["School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Industrial and Systems Engineering, The Georgia Institute of Technology, Atlanta, GA 30332","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100368441","display_name":"Di Chen","orcid":"https://orcid.org/0000-0001-8757-3204"},"institutions":[{"id":"https://openalex.org/I4210127098","display_name":"UCB Pharma (United States)","ror":"https://ror.org/028qka468","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127098","https://openalex.org/I85722119"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Di Chen","raw_affiliation_strings":["Biostatics US, UCB Pharma, Inc. Smyrna, GA 30080"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Biostatics US, UCB Pharma, Inc. Smyrna, GA 30080","institution_ids":["https://openalex.org/I4210127098"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":5.2783,"has_fulltext":false,"cited_by_count":66,"citation_normalized_percentile":{"value":0.96231486,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"48","issue":"1","first_page":"26","last_page":"40"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6194339394569397},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6188153028488159},{"id":"https://openalex.org/keywords/data-reduction","display_name":"Data reduction","score":0.6027201414108276},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.6007605791091919},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.6004469394683838},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.551814079284668},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5270735621452332},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.47875919938087463},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.43567901849746704},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.42861849069595337},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3970867097377777},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3257829546928406},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.29066890478134155},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2165946662425995}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6194339394569397},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6188153028488159},{"id":"https://openalex.org/C153914771","wikidata":"https://www.wikidata.org/wiki/Q5227343","display_name":"Data reduction","level":2,"score":0.6027201414108276},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.6007605791091919},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.6004469394683838},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.551814079284668},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5270735621452332},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.47875919938087463},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.43567901849746704},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.42861849069595337},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3970867097377777},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3257829546928406},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29066890478134155},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2165946662425995},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1198/004017005000000553","is_oa":false,"landing_page_url":"https://doi.org/10.1198/004017005000000553","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.142.188","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.142.188","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.isye.gatech.edu/~brani/isyestat/04-11.pdf","raw_type":"text"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.155.605","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.155.605","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.isye.gatech.edu/faculty/Xiaoming_Huo/publication/files/tech-06.pdf","raw_type":"text"},{"id":"pmh:oai:smartech.gatech.edu:1853/25856","is_oa":false,"landing_page_url":"http://hdl.handle.net/1853/25856","pdf_url":null,"source":{"id":"https://openalex.org/S4377196313","display_name":"SMARTech Repository (Georgia Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I130701444","host_organization_name":"Georgia Institute of Technology","host_organization_lineage":["https://openalex.org/I130701444"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Technical Report"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W197497516","https://openalex.org/W1480376833","https://openalex.org/W1520616765","https://openalex.org/W1554944419","https://openalex.org/W1594031697","https://openalex.org/W1964269369","https://openalex.org/W1970352604","https://openalex.org/W1986045603","https://openalex.org/W2017334578","https://openalex.org/W2018650779","https://openalex.org/W2021315680","https://openalex.org/W2031117787","https://openalex.org/W2053914621","https://openalex.org/W2059859443","https://openalex.org/W2062346812","https://openalex.org/W2079724595","https://openalex.org/W2085881268","https://openalex.org/W2115755118","https://openalex.org/W2120433189","https://openalex.org/W2130551426","https://openalex.org/W2135346934","https://openalex.org/W2140170995","https://openalex.org/W2143304716","https://openalex.org/W2143783457","https://openalex.org/W2147573997","https://openalex.org/W2158940042","https://openalex.org/W2164116144","https://openalex.org/W2188883141","https://openalex.org/W2797333853","https://openalex.org/W2994971859","https://openalex.org/W3000332379","https://openalex.org/W3037248615","https://openalex.org/W3085162807","https://openalex.org/W4255521522"],"related_works":["https://openalex.org/W2953058328","https://openalex.org/W1542224353","https://openalex.org/W1661087619","https://openalex.org/W2750730210","https://openalex.org/W2116854923","https://openalex.org/W2236974868","https://openalex.org/W4312766348","https://openalex.org/W2730764323","https://openalex.org/W4233939244","https://openalex.org/W2133587243"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"new":[3],"data":[4,20,32,90,94,100,120,133],"reduction":[5,33,101,121],"methods":[6,23,44,82,96],"based":[7],"on":[8,70],"the":[9,29,40,43,46,54,80,87,99,116,119,125,129],"discrete":[10],"wavelet":[11],"transform":[12],"to":[13,27,128,135],"handle":[14],"potentially":[15],"large":[16],"and":[17,34,45,77,92,141],"complicated":[18],"nonstationary":[19],"curves.":[21],"The":[22],"minimize":[24],"objective":[25],"functions":[26],"balance":[28],"trade-off":[30],"between":[31],"modeling":[35],"accuracy.":[36],"Theoretic":[37],"investigations":[38],"provide":[39],"optimality":[41],"of":[42,49,53,60,118,124],"large-sample":[47],"distribution":[48],"a":[50,106,136],"closed-form":[51],"estimate":[52],"thresholding":[55],"parameter.":[56],"An":[57],"upper":[58],"bound":[59],"errors":[61],"in":[62],"signal":[63],"approximation":[64],"(or":[65],"estimation)":[66],"is":[67],"derived.":[68],"Based":[69],"evaluation":[71],"studies":[72],"with":[73,86,105],"popular":[74],"testing":[75],"curves":[76],"real-life":[78],"datasets,":[79],"proposed":[81],"demonstrate":[83],"their":[84],"competitiveness":[85],"existing":[88],"engineering":[89,126],"compression":[91],"statistical":[93],"denoising":[95],"for":[97,110,139],"achieving":[98],"goals.":[102],"Further":[103],"experimentation":[104],"tree-based":[107],"classification":[108],"procedure":[109],"identifying":[111],"process":[112,143],"fault":[113],"classes":[114],"illustrates":[115],"potential":[117],"tools.":[122],"Extension":[123],"scalogram":[127],"reduced-size":[130],"semiconductor":[131],"fabrication":[132],"leads":[134],"visualization":[137],"tool":[138],"monitoring":[140],"understanding":[142],"problems.":[144]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":12},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":2}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}