{"id":"https://openalex.org/W3166790959","doi":"https://doi.org/10.1177/09596518211020534","title":"Fault isolation of analog circuit using an optimized ensemble empirical mode decomposition approach based on multi-objective optimization","display_name":"Fault isolation of analog circuit using an optimized ensemble empirical mode decomposition approach based on multi-objective optimization","publication_year":2021,"publication_date":"2021-06-03","ids":{"openalex":"https://openalex.org/W3166790959","doi":"https://doi.org/10.1177/09596518211020534","mag":"3166790959"},"language":"en","primary_location":{"id":"doi:10.1177/09596518211020534","is_oa":false,"landing_page_url":"https://doi.org/10.1177/09596518211020534","pdf_url":null,"source":{"id":"https://openalex.org/S4210196624","display_name":"Proceedings of the Institution of Mechanical Engineers Part I Journal of Systems and Control Engineering","issn_l":"0959-6518","issn":["0959-6518","2041-3041"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Institution of Mechanical Engineers, Part I: Journal of Systems and Control Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024590568","display_name":"Alireza Moezi","orcid":null},"institutions":[{"id":"https://openalex.org/I9256017","display_name":"Islamic Azad University of Najafabad","ror":"https://ror.org/015j7c446","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433","https://openalex.org/I9256017"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Alireza Moezi","raw_affiliation_strings":["Department of Electrical Engineering, Islamic Azad University, Najafabad, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036895669","display_name":"Seyed Mohamad Kargar","orcid":"https://orcid.org/0000-0003-3876-0438"},"institutions":[{"id":"https://openalex.org/I9256017","display_name":"Islamic Azad University of Najafabad","ror":"https://ror.org/015j7c446","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433","https://openalex.org/I9256017"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Seyed Mohamad Kargar","raw_affiliation_strings":["Department of Electrical Engineering, Islamic Azad University, Najafabad, Iran","Smart Microgrid Research Center, Islamic Azad University, Najafabad, Iran"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]},{"raw_affiliation_string":"Smart Microgrid Research Center, Islamic Azad University, Najafabad, Iran","institution_ids":["https://openalex.org/I9256017"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036895669"],"corresponding_institution_ids":["https://openalex.org/I9256017"],"apc_list":null,"apc_paid":null,"fwci":0.6016,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66323413,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"235","issue":"9","first_page":"1555","last_page":"1570"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hilbert\u2013huang-transform","display_name":"Hilbert\u2013Huang transform","score":0.7641257047653198},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.625525712966919},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6198830008506775},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.599673330783844},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5822644233703613},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5566283464431763},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5493865609169006},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5199336409568787},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.5164135098457336},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4315231442451477},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4154423177242279},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.36859679222106934},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21777650713920593},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.0754595696926117}],"concepts":[{"id":"https://openalex.org/C25570617","wikidata":"https://www.wikidata.org/wiki/Q1006462","display_name":"Hilbert\u2013Huang transform","level":3,"score":0.7641257047653198},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.625525712966919},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6198830008506775},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.599673330783844},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5822644233703613},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5566283464431763},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5493865609169006},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5199336409568787},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.5164135098457336},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4315231442451477},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4154423177242279},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.36859679222106934},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21777650713920593},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0754595696926117},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1177/09596518211020534","is_oa":false,"landing_page_url":"https://doi.org/10.1177/09596518211020534","pdf_url":null,"source":{"id":"https://openalex.org/S4210196624","display_name":"Proceedings of the Institution of Mechanical Engineers Part I Journal of Systems and Control Engineering","issn_l":"0959-6518","issn":["0959-6518","2041-3041"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Institution of Mechanical Engineers, Part I: Journal of Systems and Control Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1545133867","https://openalex.org/W1966804228","https://openalex.org/W2007221293","https://openalex.org/W2022231562","https://openalex.org/W2033853870","https://openalex.org/W2050704781","https://openalex.org/W2063812485","https://openalex.org/W2079201387","https://openalex.org/W2102832680","https://openalex.org/W2126105956","https://openalex.org/W2132029223","https://openalex.org/W2135663228","https://openalex.org/W2158572650","https://openalex.org/W2169774607","https://openalex.org/W2415351794","https://openalex.org/W2518269126","https://openalex.org/W2525089770","https://openalex.org/W2554566531","https://openalex.org/W2616627863","https://openalex.org/W2890512926","https://openalex.org/W2901240338","https://openalex.org/W2993182897","https://openalex.org/W3025979551","https://openalex.org/W4232791633","https://openalex.org/W4250891750"],"related_works":["https://openalex.org/W3014107421","https://openalex.org/W2081563414","https://openalex.org/W2363056446","https://openalex.org/W2359718298","https://openalex.org/W2377062149","https://openalex.org/W2076661204","https://openalex.org/W2380939102","https://openalex.org/W2089603224","https://openalex.org/W2329112433","https://openalex.org/W2375192119"],"abstract_inverted_index":{"This":[0],"article":[1,16],"proposed":[2,165],"a":[3,37,168],"practical":[4],"approach":[5,25],"to":[6,72,132,159],"isolating":[7],"faults":[8],"in":[9,56,82],"analog":[10,61],"circuits.":[11,63],"The":[12,91,104],"contribution":[13],"of":[14,60,86,93,145],"this":[15],"is":[17,26,36,70],"twofold.":[18],"First,":[19],"the":[20,30,65,79,83,107,113,122,142,146,154,160,164,173,177],"optimized":[21],"empirical":[22],"mode":[23,42,54],"decomposition":[24],"presented":[27],"based":[28],"on":[29],"Hellinger":[31],"distance":[32],"such":[33],"that":[34],"there":[35],"minimum":[38],"dependency":[39],"between":[40],"intrinsic":[41,53],"functions.":[43,103],"Features":[44],"with":[45,167],"high":[46,84],"distinction":[47],"could":[48],"be":[49],"extracted":[50,111,152],"by":[51,153],"employing":[52],"functions":[55],"fault":[57,87],"detection":[58,88],"problem":[59],"benchmark":[62],"Second,":[64],"non-dominated":[66],"sorting":[67],"genetic":[68],"algorithm":[69],"employed":[71,131],"retain":[73],"excellent":[74],"features":[75,94,105],"and":[76,89,95,116,126,141,148,176],"speed":[77],"up":[78],"execution,":[80],"resulting":[81],"accuracy":[85],"isolation.":[90],"number":[92],"mean":[96],"squared":[97],"error":[98],"are":[99,109,130,139,151],"selected":[100],"as":[101],"objective":[102],"from":[106],"data":[108],"also":[110,181],"using":[112],"fast":[114],"Fourier":[115],"wavelet":[117],"transforms":[118],"for":[119],"comparison.":[120],"Finally,":[121],"support":[123],"vector":[124,171],"machine":[125],"artificial":[127],"neural":[128],"network":[129],"isolate":[133],"faults.":[134],"Two":[135],"circuits":[136,150],"under":[137],"test":[138],"simulated,":[140],"output":[143],"signals":[144],"faulty":[147],"fault-free":[149],"Monte":[155],"Carlo":[156],"analysis.":[157],"According":[158],"obtained":[161],"simulation":[162],"results,":[163],"method":[166],"low-dimensional":[169],"feature":[170],"outperformed":[172],"previous":[174],"methods,":[175],"computational":[178],"time":[179],"has":[180],"reduced":[182],"significantly.":[183]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}