{"id":"https://openalex.org/W4387642465","doi":"https://doi.org/10.1177/01423312231198567","title":"A back propagation neural network-based adaptive sampling strategy for uncertainty surfaces","display_name":"A back propagation neural network-based adaptive sampling strategy for uncertainty surfaces","publication_year":2023,"publication_date":"2023-10-14","ids":{"openalex":"https://openalex.org/W4387642465","doi":"https://doi.org/10.1177/01423312231198567"},"language":"en","primary_location":{"id":"doi:10.1177/01423312231198567","is_oa":false,"landing_page_url":"https://doi.org/10.1177/01423312231198567","pdf_url":null,"source":{"id":"https://openalex.org/S24148485","display_name":"Transactions of the Institute of Measurement and Control","issn_l":"0142-3312","issn":["0142-3312","1477-0369"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Institute of Measurement and Control","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101991128","display_name":"Feng Gao","orcid":"https://orcid.org/0000-0002-3031-0021"},"institutions":[{"id":"https://openalex.org/I4210131919","display_name":"Xi'an University of Technology","ror":"https://ror.org/038avdt50","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131919"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Gao","raw_affiliation_strings":["School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]},{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102870996","display_name":"Zheng Yuan","orcid":"https://orcid.org/0000-0002-2148-9891"},"institutions":[{"id":"https://openalex.org/I4210131919","display_name":"Xi'an University of Technology","ror":"https://ror.org/038avdt50","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131919"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Zheng","raw_affiliation_strings":["School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]},{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019443077","display_name":"Yan Li","orcid":"https://orcid.org/0000-0002-0368-3850"},"institutions":[{"id":"https://openalex.org/I4210131919","display_name":"Xi'an University of Technology","ror":"https://ror.org/038avdt50","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131919"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yan Li","raw_affiliation_strings":["School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China"],"raw_orcid":"https://orcid.org/0000-0002-0368-3850","affiliations":[{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]},{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100363908","display_name":"Wenqiang Li","orcid":"https://orcid.org/0000-0002-9592-4454"},"institutions":[{"id":"https://openalex.org/I4210131919","display_name":"Xi'an University of Technology","ror":"https://ror.org/038avdt50","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210131919"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenqiang Li","raw_affiliation_strings":["School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi\u2019an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]},{"raw_affiliation_string":"School of Mechanical and Precision Instrument Engineering, Xi'an University of Technology, China","institution_ids":["https://openalex.org/I4210131919"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5019443077"],"corresponding_institution_ids":["https://openalex.org/I4210131919"],"apc_list":null,"apc_paid":null,"fwci":0.564,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61259096,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"46","issue":"5","first_page":"1012","last_page":"1023"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/weighting","display_name":"Weighting","score":0.6976000070571899},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6487610936164856},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6218454837799072},{"id":"https://openalex.org/keywords/adaptive-sampling","display_name":"Adaptive sampling","score":0.6172073483467102},{"id":"https://openalex.org/keywords/jackknife-resampling","display_name":"Jackknife resampling","score":0.5932875871658325},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5607955455780029},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5389218330383301},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.530971884727478},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.4707627594470978},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4633050560951233},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.46145427227020264},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41596999764442444},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.40244555473327637},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21325331926345825},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19062912464141846},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.13150006532669067},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.08104333281517029}],"concepts":[{"id":"https://openalex.org/C183115368","wikidata":"https://www.wikidata.org/wiki/Q856577","display_name":"Weighting","level":2,"score":0.6976000070571899},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6487610936164856},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6218454837799072},{"id":"https://openalex.org/C2781395549","wikidata":"https://www.wikidata.org/wiki/Q4680762","display_name":"Adaptive sampling","level":3,"score":0.6172073483467102},{"id":"https://openalex.org/C81790035","wikidata":"https://www.wikidata.org/wiki/Q847158","display_name":"Jackknife resampling","level":3,"score":0.5932875871658325},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5607955455780029},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5389218330383301},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.530971884727478},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.4707627594470978},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4633050560951233},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.46145427227020264},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41596999764442444},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.40244555473327637},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21325331926345825},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19062912464141846},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.13150006532669067},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.08104333281517029},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1177/01423312231198567","is_oa":false,"landing_page_url":"https://doi.org/10.1177/01423312231198567","pdf_url":null,"source":{"id":"https://openalex.org/S24148485","display_name":"Transactions of the Institute of Measurement and Control","issn_l":"0142-3312","issn":["0142-3312","1477-0369"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Institute of Measurement and Control","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5324112198","display_name":null,"funder_award_id":"2021ZDLGY 10-07","funder_id":"https://openalex.org/F4320329783","funder_display_name":"Key Industry Innovation Chain of Shaanxi"},{"id":"https://openalex.org/G8786144700","display_name":null,"funder_award_id":"51775432","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320329783","display_name":"Key Industry Innovation Chain of Shaanxi","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1806147290","https://openalex.org/W1983577980","https://openalex.org/W1988671032","https://openalex.org/W1989767082","https://openalex.org/W2001600470","https://openalex.org/W2008127832","https://openalex.org/W2009095010","https://openalex.org/W2019133457","https://openalex.org/W2028349249","https://openalex.org/W2063461467","https://openalex.org/W2072328955","https://openalex.org/W2094738765","https://openalex.org/W2120379380","https://openalex.org/W2123460334","https://openalex.org/W2417436366","https://openalex.org/W2596233134","https://openalex.org/W2613748290","https://openalex.org/W2733773676","https://openalex.org/W2792985409","https://openalex.org/W2793605364","https://openalex.org/W2800800827","https://openalex.org/W2891727175","https://openalex.org/W2915622617","https://openalex.org/W3089452540","https://openalex.org/W3113217214","https://openalex.org/W3215565595"],"related_works":["https://openalex.org/W2038693912","https://openalex.org/W1991602789","https://openalex.org/W1582396021","https://openalex.org/W1988359706","https://openalex.org/W312558119","https://openalex.org/W4210985407","https://openalex.org/W2335441444","https://openalex.org/W138014004","https://openalex.org/W2075598034","https://openalex.org/W2984441180"],"abstract_inverted_index":{"Owing":[0],"to":[1,52,79,91,121],"the":[2,7,18,23,29,40,53,57,76,81,93,98,126,132,140,149,155],"lack":[3],"of":[4,10,22,56,97,151,160],"prior":[5],"knowledge,":[6],"accurate":[8],"reconstruction":[9,141,159],"surfaces":[11,162],"with":[12,75,103,163],"high":[13,164],"uncertainty":[14],"is":[15,45,70,89,113,135],"dependent":[16],"on":[17],"reasonable":[19],"real-time":[20],"selection":[21,124],"next":[24],"best":[25],"point":[26,128],"(NBP)":[27],"during":[28],"sampling":[30,87,106],"process.":[31],"In":[32,119],"this":[33],"study,":[34],"a":[35,63],"new":[36],"informative":[37],"criterion":[38,134],"called":[39],"MaxCWVar":[41,133],"weighting":[42],"shape":[43],"effect":[44],"proposed":[46,99],"for":[47,115,154],"NBP":[48,123],"selection.":[49],"The":[50,84],"responses":[51],"geometric":[54],"features":[55],"candidate":[58,82],"locations":[59],"are":[60],"predicted":[61],"by":[62,131],"back":[64],"propagation":[65],"neural":[66],"network":[67],"(BPNN),":[68],"which":[69],"then":[71],"used":[72],"in":[73],"combination":[74],"jackknife":[77],"method":[78],"estimate":[80],"uncertainty.":[83,165],"blade":[85],"cross-section":[86],"case":[88],"considered":[90],"validate":[92],"flexibility":[94],"and":[95,143,157],"effectiveness":[96],"method.":[100],"A":[101],"comparison":[102],"other":[104,122],"adaptive":[105],"strategies":[107],"shows":[108],"that":[109],"BPNN-based":[110],"response":[111],"prediction":[112],"well-suited":[114],"allocating":[116],"sample":[117,127],"points.":[118],"contrast":[120],"criteria,":[125],"distribution":[129],"recommended":[130],"preferable":[136],"as":[137],"it":[138],"improves":[139],"accuracy":[142],"modeling":[144],"efficiency.":[145],"This":[146],"study":[147],"promotes":[148],"exploration":[150],"metrological":[152],"methods":[153],"fast":[156],"intelligent":[158],"complex":[161]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}