{"id":"https://openalex.org/W2809258611","doi":"https://doi.org/10.1177/0142331218776722","title":"Reliability evaluation of a fault-tolerant three-phase interleaved DC-DC boost converter","display_name":"Reliability evaluation of a fault-tolerant three-phase interleaved DC-DC boost converter","publication_year":2018,"publication_date":"2018-06-21","ids":{"openalex":"https://openalex.org/W2809258611","doi":"https://doi.org/10.1177/0142331218776722","mag":"2809258611"},"language":"en","primary_location":{"id":"doi:10.1177/0142331218776722","is_oa":false,"landing_page_url":"https://doi.org/10.1177/0142331218776722","pdf_url":null,"source":{"id":"https://openalex.org/S24148485","display_name":"Transactions of the Institute of Measurement and Control","issn_l":"0142-3312","issn":["0142-3312","1477-0369"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Institute of Measurement and Control","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010017080","display_name":"Tohid Rahimi","orcid":"https://orcid.org/0000-0002-5444-4139"},"institutions":[{"id":"https://openalex.org/I41832843","display_name":"University of Tabriz","ror":"https://ror.org/01papkj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I41832843"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Tohid Rahimi","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, University of Tabriz, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, University of Tabriz, Iran","institution_ids":["https://openalex.org/I41832843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081260960","display_name":"Seyed Hossein Hosseini","orcid":"https://orcid.org/0000-0002-3716-0126"},"institutions":[{"id":"https://openalex.org/I41832843","display_name":"University of Tabriz","ror":"https://ror.org/01papkj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I41832843"]},{"id":"https://openalex.org/I69050122","display_name":"Near East University","ror":"https://ror.org/02x8svs93","country_code":"CY","type":"education","lineage":["https://openalex.org/I69050122"]}],"countries":["CY","IR"],"is_corresponding":true,"raw_author_name":"Seyed Hossein Hosseini","raw_affiliation_strings":["Engineering Faculty, Near East University, Nicosia, North Cyprus, Mersin, Turkey","Faculty of Electrical and Computer Engineering, University of Tabriz, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Engineering Faculty, Near East University, Nicosia, North Cyprus, Mersin, Turkey","institution_ids":["https://openalex.org/I69050122"]},{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, University of Tabriz, Iran","institution_ids":["https://openalex.org/I41832843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055049104","display_name":"Mehran Sabahi","orcid":"https://orcid.org/0000-0002-4332-6460"},"institutions":[{"id":"https://openalex.org/I41832843","display_name":"University of Tabriz","ror":"https://ror.org/01papkj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I41832843"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mehran Sabahi","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, University of Tabriz, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, University of Tabriz, Iran","institution_ids":["https://openalex.org/I41832843"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050619915","display_name":"Gevork B. Gharehpetian","orcid":"https://orcid.org/0000-0003-1521-790X"},"institutions":[{"id":"https://openalex.org/I158248296","display_name":"Amirkabir University of Technology","ror":"https://ror.org/04gzbav43","country_code":"IR","type":"education","lineage":["https://openalex.org/I158248296"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Gevork B Gharehpetian","raw_affiliation_strings":["Electrical Engineering Department, Amirkabir University of Technology, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Amirkabir University of Technology, Iran","institution_ids":["https://openalex.org/I158248296"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064698212","display_name":"Mehdi Abapour","orcid":"https://orcid.org/0000-0003-0241-7021"},"institutions":[{"id":"https://openalex.org/I41832843","display_name":"University of Tabriz","ror":"https://ror.org/01papkj44","country_code":"IR","type":"education","lineage":["https://openalex.org/I41832843"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Mehdi Abapour","raw_affiliation_strings":["Faculty of Electrical and Computer Engineering, University of Tabriz, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Computer Engineering, University of Tabriz, Iran","institution_ids":["https://openalex.org/I41832843"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5081260960"],"corresponding_institution_ids":["https://openalex.org/I41832843","https://openalex.org/I69050122"],"apc_list":null,"apc_paid":null,"fwci":1.9523,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.86714512,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"41","issue":"5","first_page":"1278","last_page":"1289"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.8163458108901978},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6996575593948364},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5398477911949158},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5248503684997559},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.49685075879096985},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.49498146772384644},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4827686846256256},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47408735752105713},{"id":"https://openalex.org/keywords/three-phase","display_name":"Three-phase","score":0.4595235288143158},{"id":"https://openalex.org/keywords/boost-converter","display_name":"Boost converter","score":0.44008925557136536},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4335947632789612},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.42063841223716736},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3939099609851837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3164389729499817},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19798418879508972},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17969542741775513},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14490380883216858},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.12279331684112549}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.8163458108901978},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6996575593948364},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5398477911949158},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5248503684997559},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.49685075879096985},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.49498146772384644},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4827686846256256},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47408735752105713},{"id":"https://openalex.org/C173871940","wikidata":"https://www.wikidata.org/wiki/Q471846","display_name":"Three-phase","level":3,"score":0.4595235288143158},{"id":"https://openalex.org/C78336795","wikidata":"https://www.wikidata.org/wiki/Q760134","display_name":"Boost converter","level":3,"score":0.44008925557136536},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4335947632789612},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.42063841223716736},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3939099609851837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3164389729499817},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19798418879508972},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17969542741775513},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14490380883216858},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.12279331684112549},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1177/0142331218776722","is_oa":false,"landing_page_url":"https://doi.org/10.1177/0142331218776722","pdf_url":null,"source":{"id":"https://openalex.org/S24148485","display_name":"Transactions of the Institute of Measurement and Control","issn_l":"0142-3312","issn":["0142-3312","1477-0369"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320017","host_organization_name":"SAGE Publishing","host_organization_lineage":["https://openalex.org/P4310320017"],"host_organization_lineage_names":["SAGE Publishing"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions of the Institute of Measurement and Control","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1963613440","https://openalex.org/W1970991611","https://openalex.org/W2001262230","https://openalex.org/W2007393355","https://openalex.org/W2050352690","https://openalex.org/W2077900870","https://openalex.org/W2078303421","https://openalex.org/W2078540822","https://openalex.org/W2097757537","https://openalex.org/W2123142631","https://openalex.org/W2134860205","https://openalex.org/W2171572436","https://openalex.org/W2179727534","https://openalex.org/W2322647736","https://openalex.org/W2333010560","https://openalex.org/W2346383857","https://openalex.org/W2460815364","https://openalex.org/W2510907976","https://openalex.org/W2539483467","https://openalex.org/W2552268753","https://openalex.org/W2573689980","https://openalex.org/W2611857796","https://openalex.org/W4252438413"],"related_works":["https://openalex.org/W2357657342","https://openalex.org/W2153432761","https://openalex.org/W1580144672","https://openalex.org/W2152623100","https://openalex.org/W2142042635","https://openalex.org/W4214878056","https://openalex.org/W1988127757","https://openalex.org/W2130594209","https://openalex.org/W1950809481","https://openalex.org/W2085988155"],"abstract_inverted_index":{"This":[0,75],"paper":[1,76],"focuses":[2],"on":[3],"the":[4,29,34,40,45,48,70,73,83,86,91],"reliability":[5,71,84],"improvement":[6],"of":[7,28,47,56,62,72,85,90],"a":[8,17],"three-phase":[9],"interleaved":[10],"DC-DC":[11],"boost":[12],"converter'.":[13],"In":[14],"this":[15],"paper,":[16],"new":[18],"reconfiguration":[19],"and":[20,59,94,102],"switching":[21,93],"strategy":[22,31],"is":[23,32],"proposed.":[24],"The":[25,88],"basic":[26],"principle":[27],"proposed":[30,92],"bypassing":[33],"faulty":[35,49],"phase":[36],"(faulty":[37],"switch),":[38],"thus,":[39],"other":[41],"phases":[42],"can":[43,68],"share":[44],"responsibility":[46],"phase.":[50],"Meanwhile,":[51],"three":[52],"redundant":[53],"structures":[54],"consisting":[55],"parallel,":[57],"standby":[58],"series":[60],"configurations":[61],"power":[63],"switches":[64],"are":[65,98],"considered,":[66],"which":[67],"improve":[69],"converter.":[74],"uses":[77],"Markov":[78],"chain":[79],"method":[80],"to":[81],"evaluate":[82],"system.":[87],"feasibility":[89],"fault":[95],"management":[96],"strategies":[97],"verified":[99],"by":[100],"simulation":[101],"experimental":[103],"results.":[104]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-05-05T06:06:40.768181","created_date":"2025-10-10T00:00:00"}