{"id":"https://openalex.org/W7162774415","doi":"https://doi.org/10.1155/jece/8886698","title":"A Novel Hybrid Platform Based on Deep Learning for Fault Detection and Localization in a Smart Distribution Grid","display_name":"A Novel Hybrid Platform Based on Deep Learning for Fault Detection and Localization in a Smart Distribution Grid","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7162774415","doi":"https://doi.org/10.1155/jece/8886698"},"language":"en","primary_location":{"id":"doi:10.1155/jece/8886698","is_oa":true,"landing_page_url":"https://doi.org/10.1155/jece/8886698","pdf_url":null,"source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1155/jece/8886698","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040316126","display_name":"Felix Ghislain Yem Souhe","orcid":"https://orcid.org/0000-0002-1257-8470"},"institutions":[{"id":"https://openalex.org/I163423212","display_name":"University of Douala","ror":"https://ror.org/02zr5jr81","country_code":"CM","type":"education","lineage":["https://openalex.org/I163423212"]}],"countries":["CM"],"is_corresponding":true,"raw_author_name":"Felix Ghislain Yem Souhe","raw_affiliation_strings":["Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","Laboratory of Technology and Applied Sciences ,  University Institute of Technology ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm"],"raw_orcid":"https://orcid.org/0000-0002-1257-8470","affiliations":[{"raw_affiliation_string":"Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]},{"raw_affiliation_string":"Laboratory of Technology and Applied Sciences ,  University Institute of Technology ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065979978","display_name":"Gabriel Ekemb","orcid":null},"institutions":[{"id":"https://openalex.org/I163423212","display_name":"University of Douala","ror":"https://ror.org/02zr5jr81","country_code":"CM","type":"education","lineage":["https://openalex.org/I163423212"]}],"countries":["CM"],"is_corresponding":false,"raw_author_name":"Gabriel Ekemb","raw_affiliation_strings":["Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm"],"raw_orcid":"https://orcid.org/0009-0006-2741-9313","affiliations":[{"raw_affiliation_string":"Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065359747","display_name":"Camille Franklin Mbey","orcid":"https://orcid.org/0000-0003-0867-2357"},"institutions":[{"id":"https://openalex.org/I163423212","display_name":"University of Douala","ror":"https://ror.org/02zr5jr81","country_code":"CM","type":"education","lineage":["https://openalex.org/I163423212"]}],"countries":["CM"],"is_corresponding":false,"raw_author_name":"Camille Franklin Mbey","raw_affiliation_strings":["Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm"],"raw_orcid":"https://orcid.org/0000-0003-0867-2357","affiliations":[{"raw_affiliation_string":"Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003880676","display_name":"Vinny Junior Foba Kakeu","orcid":"https://orcid.org/0000-0001-7848-3004"},"institutions":[{"id":"https://openalex.org/I163423212","display_name":"University of Douala","ror":"https://ror.org/02zr5jr81","country_code":"CM","type":"education","lineage":["https://openalex.org/I163423212"]}],"countries":["CM"],"is_corresponding":false,"raw_author_name":"Vinny Junior Foba Kakeu","raw_affiliation_strings":["Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm"],"raw_orcid":"https://orcid.org/0000-0001-7848-3004","affiliations":[{"raw_affiliation_string":"Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5089608173","display_name":"Alexandre Teplaira Boum","orcid":"https://orcid.org/0000-0002-3783-3343"},"institutions":[{"id":"https://openalex.org/I163423212","display_name":"University of Douala","ror":"https://ror.org/02zr5jr81","country_code":"CM","type":"education","lineage":["https://openalex.org/I163423212"]}],"countries":["CM"],"is_corresponding":false,"raw_author_name":"Alexandre Teplaira Boum","raw_affiliation_strings":["Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm"],"raw_orcid":"https://orcid.org/0000-0002-3783-3343","affiliations":[{"raw_affiliation_string":"Laboratory of Computer Engineering and Automation ,  Advanced Teacher Training College for Technical Education ,  University of Douala ,  Douala ,  Cameroon , univ-douala.cm","institution_ids":["https://openalex.org/I163423212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5040316126"],"corresponding_institution_ids":["https://openalex.org/I163423212"],"apc_list":{"value":1100,"currency":"USD","value_usd":1100},"apc_paid":{"value":1100,"currency":"USD","value_usd":1100},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.49571123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2026","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9312000274658203,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9312000274658203,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.01889999955892563,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.009600000455975533,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7231000065803528},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6349999904632568},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6035000085830688},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5598999857902527},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5123999714851379},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.43130001425743103},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4056999981403351},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.38580000400543213},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.37700000405311584}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7231000065803528},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6349999904632568},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6349999904632568},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6035000085830688},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5598999857902527},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5123999714851379},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.47589999437332153},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.43130001425743103},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4056999981403351},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.40459999442100525},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.38580000400543213},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.37700000405311584},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.3587999939918518},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3465999960899353},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3425000011920929},{"id":"https://openalex.org/C173414695","wikidata":"https://www.wikidata.org/wiki/Q5510276","display_name":"Fusion mechanism","level":4,"score":0.34049999713897705},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.3337000012397766},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3271999955177307},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.32690000534057617},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.31380000710487366},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.31360000371932983},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2937999963760376},{"id":"https://openalex.org/C136389625","wikidata":"https://www.wikidata.org/wiki/Q334384","display_name":"Supervised learning","level":3,"score":0.2854999899864197},{"id":"https://openalex.org/C2781121602","wikidata":"https://www.wikidata.org/wiki/Q3504403","display_name":"Modular neural network","level":4,"score":0.28189998865127563},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.27309998869895935},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.27090001106262207},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26339998841285706},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.26100000739097595},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.25049999356269836}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/jece/8886698","is_oa":true,"landing_page_url":"https://doi.org/10.1155/jece/8886698","pdf_url":null,"source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/jece/8886698","is_oa":true,"landing_page_url":"https://doi.org/10.1155/jece/8886698","pdf_url":null,"source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869","https://openalex.org/P4310320595"],"host_organization_lineage_names":["Hindawi Publishing Corporation","Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W3010965565","https://openalex.org/W3033048952","https://openalex.org/W3177937894","https://openalex.org/W3200759122","https://openalex.org/W3205316013","https://openalex.org/W4206395738","https://openalex.org/W4220770305","https://openalex.org/W4284966409","https://openalex.org/W4285791481","https://openalex.org/W4377292722","https://openalex.org/W4380537703","https://openalex.org/W4388834351","https://openalex.org/W4389195345","https://openalex.org/W4391058744","https://openalex.org/W4391096217","https://openalex.org/W4391341344","https://openalex.org/W4393146059","https://openalex.org/W4399874348","https://openalex.org/W4400033210","https://openalex.org/W4401542870","https://openalex.org/W4401623178","https://openalex.org/W4402571957","https://openalex.org/W4406215451","https://openalex.org/W4406983072","https://openalex.org/W4407566471","https://openalex.org/W4407938638","https://openalex.org/W4409494275","https://openalex.org/W4409812972","https://openalex.org/W4411466541","https://openalex.org/W4411822989","https://openalex.org/W4413600458","https://openalex.org/W4414080145","https://openalex.org/W4414445390","https://openalex.org/W4414554448","https://openalex.org/W4414825603","https://openalex.org/W4417456585","https://openalex.org/W7106850293","https://openalex.org/W7119205386","https://openalex.org/W7123335283","https://openalex.org/W7124311552","https://openalex.org/W7124957872","https://openalex.org/W7125510079","https://openalex.org/W7125519920","https://openalex.org/W7125808687","https://openalex.org/W7126372106","https://openalex.org/W7130507186","https://openalex.org/W7140084502","https://openalex.org/W7153598210"],"related_works":[],"abstract_inverted_index":{"The":[0,78,137,199,217,241],"reliability":[1],"of":[2,16,103,110,120,167,178,191,201],"smart":[3],"transmission":[4,183],"systems":[5],"critically":[6],"depends":[7],"on":[8,124],"the":[9,108,118,179,205,221,229,256,270],"rapid":[10],"and":[11,14,62,68,75,86,132,157,196,204,214,235,254,277,288],"accurate":[12,131],"detection":[13,61,213,234,252],"localization":[15,30,63,155,215,226,258],"faults.":[17],"However,":[18],"existing":[19],"approaches":[20,71],"face":[21],"inherent":[22],"limitations;":[23],"thus,":[24],"traveling\u2010wave":[25],"(TW)":[26],"methods":[27],"offer":[28],"high":[29,225],"accuracy":[31,276],"but":[32,42],"require":[33],"stringent":[34],"measurement":[35],"conditions,":[36],"while":[37,228],"data\u2010driven":[38],"models":[39],"provide":[40],"robustness":[41],"may":[43],"suffer":[44],"from":[45],"reduced":[46],"precision":[47],"under":[48,238],"certain":[49],"scenarios.":[50],"To":[51,159],"address":[52],"these":[53],"challenges,":[54],"this":[55,104],"paper":[56],"proposes":[57],"a":[58,73,82,87,129,143,161,164,188,250,281],"hybrid":[59,206,243,272],"fault":[60,134,168,192,236,286],"methodology":[64,273],"that":[65,220,269],"combines":[66,117],"physics\u2010based":[67],"deep":[69],"learning":[70],"within":[72,142],"unified":[74],"modular":[76,144],"framework.":[77],"proposed":[79,242,271],"method":[80],"integrates":[81],"TW":[83,222],"analytical":[84],"module":[85,203,223],"one\u2010dimensional":[88],"convolutional":[89],"neural":[90],"network":[91],"(1D\u2010CNN)":[92],"model,":[93],"designed":[94],"to":[95,127,260],"exploit":[96],"their":[97],"complementary":[98],"strengths.":[99],"A":[100],"key":[101],"contribution":[102],"work":[105],"lies":[106],"in":[107,185,290],"development":[109],"an":[111],"adaptive":[112],"decision":[113],"fusion":[114],"strategy,":[115],"which":[116],"outputs":[119],"both":[121,275],"modules":[122],"based":[123],"confidence":[125],"levels":[126],"produce":[128],"more":[130],"reliable":[133],"location":[135],"estimate.":[136],"entire":[138],"approach":[139,207,244],"is":[140,170,208],"implemented":[141],"platform":[145],"architecture,":[146],"enabling":[147],"clear":[148],"separation":[149],"between":[150],"data":[151],"acquisition,":[152],"preprocessing,":[153],"individual":[154,264],"modules,":[156],"decision\u2010making.":[158],"ensure":[160],"rigorous":[162],"evaluation,":[163],"large":[165],"dataset":[166],"scenarios":[169],"generated":[171],"using":[172,211],"high\u2010fidelity":[173],"electromagnetic":[174],"transient":[175],"simulations":[176],"(PSCAD/EMTDC)":[177],"Song":[180],"Loulou\u2013Logbaba":[181],"225\u2010kV":[182],"line":[184],"Cameroon,":[186],"covering":[187],"wide":[189],"range":[190],"types,":[193],"locations,":[194],"resistances,":[195],"operating":[197],"conditions.":[198,240],"performance":[200],"each":[202],"systematically":[209],"assessed":[210],"standard":[212],"metrics.":[216],"results":[218],"demonstrate":[219],"achieves":[224],"precision,":[227],"1D\u2010CNN":[230],"model":[231],"ensures":[232],"robust":[233],"classification":[237],"varying":[239],"significantly":[245],"improves":[246],"overall":[247],"performance,":[248],"achieving":[249],"100%":[251],"rate":[253],"reducing":[255],"average":[257],"error":[259],"0.017":[261],"km,":[262],"outperforming":[263],"methods.":[265],"These":[266],"findings":[267],"confirm":[268],"enhances":[274],"robustness,":[278],"making":[279],"it":[280],"promising":[282],"solution":[283],"for":[284],"advanced":[285],"monitoring":[287],"protection":[289],"modern":[291],"power":[292],"grids.":[293]},"counts_by_year":[],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2026-05-30T00:00:00"}