{"id":"https://openalex.org/W4415542889","doi":"https://doi.org/10.1155/int/3135134","title":"Feature Extraction Technique for Fault Detection in Microgrid Using Principal Component Analysis","display_name":"Feature Extraction Technique for Fault Detection in Microgrid Using Principal Component Analysis","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4415542889","doi":"https://doi.org/10.1155/int/3135134"},"language":"en","primary_location":{"id":"doi:10.1155/int/3135134","is_oa":true,"landing_page_url":"https://doi.org/10.1155/int/3135134","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1155/int/3135134","source":{"id":"https://openalex.org/S57950554","display_name":"International Journal of Intelligent Systems","issn_l":"0884-8173","issn":["0884-8173","1098-111X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1155/int/3135134","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092712088","display_name":"Sipho P Lafleni","orcid":"https://orcid.org/0009-0000-9242-3649"},"institutions":[{"id":"https://openalex.org/I165390105","display_name":"University of South Africa","ror":"https://ror.org/048cwvf49","country_code":"ZA","type":"education","lineage":["https://openalex.org/I165390105"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Sipho Pelican Lafleni","raw_affiliation_strings":["Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za","institution_ids":["https://openalex.org/I165390105"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086823457","display_name":"Tlotlollo Sidwell Hlalele","orcid":"https://orcid.org/0000-0003-0550-9597"},"institutions":[{"id":"https://openalex.org/I165390105","display_name":"University of South Africa","ror":"https://ror.org/048cwvf49","country_code":"ZA","type":"education","lineage":["https://openalex.org/I165390105"]}],"countries":["ZA"],"is_corresponding":true,"raw_author_name":"Tlotlollo Sidwell Hlalele","raw_affiliation_strings":["Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za","institution_ids":["https://openalex.org/I165390105"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074071660","display_name":"Mbuyu Sumbwanyambe","orcid":"https://orcid.org/0000-0003-1709-0607"},"institutions":[{"id":"https://openalex.org/I165390105","display_name":"University of South Africa","ror":"https://ror.org/048cwvf49","country_code":"ZA","type":"education","lineage":["https://openalex.org/I165390105"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Mbuyu Sumbwanyambe","raw_affiliation_strings":["Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Smart Systems Engineering ,  University of South Africa , Florida,  Johannesburg ,  South Africa ,  unisa.ac.za","institution_ids":["https://openalex.org/I165390105"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5086823457"],"corresponding_institution_ids":["https://openalex.org/I165390105"],"apc_list":{"value":2500,"currency":"USD","value_usd":2500},"apc_paid":{"value":2500,"currency":"USD","value_usd":2500},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.40238557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2025","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.7233999967575073},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7145000100135803},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.6923999786376953},{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.6330999732017517},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5241000056266785},{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.5232999920845032},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.39899998903274536}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7315999865531921},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.7233999967575073},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7145000100135803},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.6923999786376953},{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.6330999732017517},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5550000071525574},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5241000056266785},{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.5232999920845032},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.39899998903274536},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.3919999897480011},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.38519999384880066},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3776000142097473},{"id":"https://openalex.org/C111030470","wikidata":"https://www.wikidata.org/wiki/Q1430460","display_name":"Curse of dimensionality","level":2,"score":0.3472999930381775},{"id":"https://openalex.org/C2780150128","wikidata":"https://www.wikidata.org/wiki/Q21948731","display_name":"Extreme learning machine","level":3,"score":0.3336000144481659},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.32820001244544983},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3100000023841858},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.3003000020980835},{"id":"https://openalex.org/C59404180","wikidata":"https://www.wikidata.org/wiki/Q17013334","display_name":"Feature learning","level":2,"score":0.26190000772476196}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/int/3135134","is_oa":true,"landing_page_url":"https://doi.org/10.1155/int/3135134","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1155/int/3135134","source":{"id":"https://openalex.org/S57950554","display_name":"International Journal of Intelligent Systems","issn_l":"0884-8173","issn":["0884-8173","1098-111X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/int/3135134","is_oa":true,"landing_page_url":"https://doi.org/10.1155/int/3135134","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1155/int/3135134","source":{"id":"https://openalex.org/S57950554","display_name":"International Journal of Intelligent Systems","issn_l":"0884-8173","issn":["0884-8173","1098-111X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Intelligent Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320324956","display_name":"University of South Africa","ror":"https://ror.org/048cwvf49"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4415542889.pdf","grobid_xml":"https://content.openalex.org/works/W4415542889.grobid-xml"},"referenced_works_count":33,"referenced_works":["https://openalex.org/W1908991523","https://openalex.org/W1970058712","https://openalex.org/W1970572996","https://openalex.org/W2022856590","https://openalex.org/W2036508039","https://openalex.org/W2072857564","https://openalex.org/W2102195535","https://openalex.org/W2126584714","https://openalex.org/W2328043188","https://openalex.org/W2442309921","https://openalex.org/W2488793338","https://openalex.org/W2529655182","https://openalex.org/W2532797789","https://openalex.org/W2545628712","https://openalex.org/W2611159092","https://openalex.org/W2967051665","https://openalex.org/W2980424679","https://openalex.org/W2998506103","https://openalex.org/W3005105578","https://openalex.org/W3042003808","https://openalex.org/W3120780657","https://openalex.org/W3133126432","https://openalex.org/W3158079487","https://openalex.org/W3170709822","https://openalex.org/W4240053199","https://openalex.org/W4285167516","https://openalex.org/W4381954873","https://openalex.org/W4386257341","https://openalex.org/W4388391924","https://openalex.org/W4390665179","https://openalex.org/W4391103102","https://openalex.org/W4391616189","https://openalex.org/W4403608667"],"related_works":[],"abstract_inverted_index":{"With":[0],"the":[1,62,72,80,91,107,114,123,135,152,161,166,172,179,182],"increasing":[2],"integration":[3],"of":[4,20,55,68,82,93,103,116,125,139,165,181,191,197],"distributed":[5],"generation":[6],"into":[7],"traditional":[8],"distribution":[9],"grids,":[10],"microgrids":[11],"(MGs)":[12],"are":[13],"becoming":[14],"more":[15],"susceptible":[16],"to":[17,47,59,201],"various":[18],"types":[19],"faults,":[21],"such":[22],"as":[23],"open\u2010circuit,":[24],"short\u2010circuit,":[25],"symmetric,":[26],"and":[27,42,51,65,74,96,137,193],"asymmetric":[28],"faults.":[29],"These":[30],"faults":[31],"can":[32,150],"arise":[33],"from":[34],"equipment":[35],"failures,":[36],"abnormal":[37],"operating":[38],"conditions,":[39],"human":[40],"error,":[41],"environmental":[43],"factors,":[44],"often":[45],"leading":[46],"substantial":[48],"financial":[49],"losses":[50],"blackouts.":[52],"Traditional":[53],"methods":[54],"fault":[56,94,140,183],"analysis":[57,128],"struggle":[58],"cope":[60],"with":[61],"complexity,":[63],"diversity,":[64],"large":[66],"volumes":[67],"data":[69],"involved":[70],"in":[71,89,98,142],"detection":[73,95,141,184],"diagnosis":[75],"processes.":[76],"In":[77],"this":[78,104],"context,":[79],"application":[81],"machine":[83,117],"learning":[84,118],"techniques":[85],"has":[86],"shown":[87],"promise":[88],"enhancing":[90,160],"accuracy":[92,136,190],"classification":[97],"MGs.":[99,143],"A":[100],"critical":[101],"component":[102,127],"success":[105],"is":[106],"feature":[108,132,153,174],"extraction":[109,175],"process,":[110],"which":[111],"significantly":[112,177],"influences":[113],"performance":[115,180],"models.":[119],"This":[120],"study":[121],"proposes":[122],"use":[124],"principal":[126],"(PCA)":[129],"for":[130],"effective":[131],"extraction,":[133],"improving":[134],"efficiency":[138],"The":[144],"proposed":[145],"method":[146,176],"demonstrates":[147],"how":[148],"PCA":[149],"simplify":[151],"space":[154],"while":[155],"preserving":[156],"essential":[157],"information,":[158],"thereby":[159],"overall":[162],"diagnostic":[163],"capability":[164],"system.":[167],"Experimental":[168],"results":[169],"demonstrate":[170],"that":[171],"PCA\u2010based":[173],"improves":[178],"classifier":[185,203],"by":[186],"achieving":[187],"a":[188],"higher":[189],"99.7%":[192],"faster":[194],"processing":[195],"times":[196],"102.43":[198],"s":[199],"compared":[200],"other":[202],"methods.":[204]},"counts_by_year":[],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-25T00:00:00"}