{"id":"https://openalex.org/W3134701563","doi":"https://doi.org/10.1155/2021/5542889","title":"An Improved Prediction Model of IGBT Junction Temperature Based on Backpropagation Neural Network and Kalman Filter","display_name":"An Improved Prediction Model of IGBT Junction Temperature Based on Backpropagation Neural Network and Kalman Filter","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3134701563","doi":"https://doi.org/10.1155/2021/5542889","mag":"3134701563"},"language":"en","primary_location":{"id":"doi:10.1155/2021/5542889","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2021/5542889","pdf_url":"https://downloads.hindawi.com/journals/complexity/2021/5542889.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://downloads.hindawi.com/journals/complexity/2021/5542889.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000420568","display_name":"Yu Dou","orcid":"https://orcid.org/0000-0002-1773-3847"},"institutions":[{"id":"https://openalex.org/I153648349","display_name":"University of Leicester","ror":"https://ror.org/04h699437","country_code":"GB","type":"education","lineage":["https://openalex.org/I153648349"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Yu Dou","raw_affiliation_strings":["School of Engineering, University of Leicester, Leicester LE1 7RH, UK","School of Engineering, University of Leicester, Leicester LE1 7RH"],"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Leicester, Leicester LE1 7RH, UK","institution_ids":["https://openalex.org/I153648349"]},{"raw_affiliation_string":"School of Engineering, University of Leicester, Leicester LE1 7RH","institution_ids":["https://openalex.org/I153648349"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5000420568"],"corresponding_institution_ids":["https://openalex.org/I153648349"],"apc_list":{"value":2300,"currency":"USD","value_usd":2300},"apc_paid":{"value":2300,"currency":"USD","value_usd":2300},"fwci":1.5231,"has_fulltext":true,"cited_by_count":26,"citation_normalized_percentile":{"value":0.82073433,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"2021","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.8865671157836914},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7666378021240234},{"id":"https://openalex.org/keywords/backpropagation","display_name":"Backpropagation","score":0.7409658432006836},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.6871894001960754},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6277987957000732},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.533793568611145},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5229859352111816},{"id":"https://openalex.org/keywords/extended-kalman-filter","display_name":"Extended Kalman filter","score":0.5203075408935547},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4589274227619171},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44230595231056213},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41771331429481506},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.33793991804122925},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23761272430419922},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19801899790763855},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14123550057411194}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.8865671157836914},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7666378021240234},{"id":"https://openalex.org/C155032097","wikidata":"https://www.wikidata.org/wiki/Q798503","display_name":"Backpropagation","level":3,"score":0.7409658432006836},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.6871894001960754},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6277987957000732},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.533793568611145},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5229859352111816},{"id":"https://openalex.org/C206833254","wikidata":"https://www.wikidata.org/wiki/Q5421817","display_name":"Extended Kalman filter","level":3,"score":0.5203075408935547},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4589274227619171},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44230595231056213},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41771331429481506},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33793991804122925},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23761272430419922},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19801899790763855},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14123550057411194},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1155/2021/5542889","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2021/5542889","pdf_url":"https://downloads.hindawi.com/journals/complexity/2021/5542889.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:hin:complx:5542889","is_oa":false,"landing_page_url":"http://downloads.hindawi.com/journals/complexity/2021/5542889.xml","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:doaj.org/article:46faa132f31149a185f0c4635efbbe46","is_oa":true,"landing_page_url":"https://doaj.org/article/46faa132f31149a185f0c4635efbbe46","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Complexity, Vol 2021 (2021)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2021/5542889","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2021/5542889","pdf_url":"https://downloads.hindawi.com/journals/complexity/2021/5542889.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.44999998807907104,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3134701563.pdf","grobid_xml":"https://content.openalex.org/works/W3134701563.grobid-xml"},"referenced_works_count":25,"referenced_works":["https://openalex.org/W1235516772","https://openalex.org/W1893237865","https://openalex.org/W1905166220","https://openalex.org/W1966222907","https://openalex.org/W2022747340","https://openalex.org/W2026012753","https://openalex.org/W2042575274","https://openalex.org/W2049976258","https://openalex.org/W2058049784","https://openalex.org/W2058923565","https://openalex.org/W2078825375","https://openalex.org/W2095022378","https://openalex.org/W2143930673","https://openalex.org/W2150705456","https://openalex.org/W2205144585","https://openalex.org/W2546909542","https://openalex.org/W2775167078","https://openalex.org/W2791704810","https://openalex.org/W2800058394","https://openalex.org/W2973352049","https://openalex.org/W3092240850","https://openalex.org/W3092427676","https://openalex.org/W3095136980","https://openalex.org/W3113065111","https://openalex.org/W4241233199"],"related_works":["https://openalex.org/W2941586664","https://openalex.org/W2026438159","https://openalex.org/W4280496678","https://openalex.org/W2952153532","https://openalex.org/W2894661039","https://openalex.org/W2973352049","https://openalex.org/W4285161724","https://openalex.org/W3211169310","https://openalex.org/W4388199707","https://openalex.org/W4386863821"],"abstract_inverted_index":{"With":[0],"the":[1,14,25,28,38,49,54,65,80,90,129,132,143,150,153,159,161],"rapid":[2],"development":[3],"of":[4,27,42,52,131,145,152,163],"emerging":[5],"technologies":[6],"such":[7,69],"as":[8,24,70],"electric":[9],"vehicles":[10],"and":[11,40,57,73,124,136,149],"high\u2010speed":[12],"railways,":[13],"insulated":[15],"gate":[16],"bipolar":[17],"transistor":[18],"(IGBT)":[19],"is":[20,34,103,156],"becoming":[21],"increasingly":[22],"important":[23],"core":[26],"power":[29,170],"electronic":[30],"devices.":[31],"Therefore,":[32],"it":[33],"imperative":[35],"to":[36,88,105],"maintain":[37],"stability":[39],"reliability":[41],"IGBT":[43,108],"under":[44],"different":[45],"circumstances.":[46],"By":[47],"predicting":[48,67],"junction":[50,109],"temperature":[51],"IGBT,":[53],"operating":[55],"condition":[56],"aging":[58],"degree":[59],"can":[60,85,113],"be":[61,86,114],"roughly":[62],"evaluated.":[63],"However,":[64],"current":[66],"approaches":[68],"optical,":[71],"physical,":[72],"electrical":[74],"methods":[75],"have":[76],"various":[77],"shortcomings.":[78],"Hence,":[79],"backpropagation":[81],"(BP)":[82],"neural":[83,120,134,164],"network":[84,121,135],"applied":[87],"avoid":[89],"difficulties":[91],"encountered":[92],"by":[93],"conventional":[94],"approaches.":[95],"In":[96,158],"this":[97],"article,":[98],"an":[99],"advanced":[100],"prediction":[101],"model":[102],"proposed":[104],"obtain":[106],"accurate":[107],"temperature.":[110],"This":[111],"method":[112],"divided":[115],"into":[116],"three":[117],"phases,":[118],"BP":[119,133],"estimation,":[122],"interpolation,":[123],"Kalman":[125,137,154],"filter":[126,138,155],"prediction.":[127],"First,":[128],"validities":[130],"are":[139,147],"verified,":[140],"respectively.":[141],"Then,":[142],"performances":[144],"them":[146],"compared,":[148],"superiority":[151],"proved.":[157],"future,":[160],"application":[162],"networks":[165],"or":[166],"deep":[167],"learning":[168],"in":[169],"electronics":[171],"will":[172],"create":[173],"more":[174],"possibilities.":[175]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":10},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}
