{"id":"https://openalex.org/W2914283252","doi":"https://doi.org/10.1155/2019/8759873","title":"Power Loss Prediction for Aging Characteristics and Condition Monitoring for Parallel\u2010Connected Power Modules Using Nonlinear Autoregressive Neural Network","display_name":"Power Loss Prediction for Aging Characteristics and Condition Monitoring for Parallel\u2010Connected Power Modules Using Nonlinear Autoregressive Neural Network","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2914283252","doi":"https://doi.org/10.1155/2019/8759873","mag":"2914283252"},"language":"en","primary_location":{"id":"doi:10.1155/2019/8759873","is_oa":true,"landing_page_url":"http://doi.org/10.1155/2019/8759873","pdf_url":"https://downloads.hindawi.com/journals/complexity/2019/8759873.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://downloads.hindawi.com/journals/complexity/2019/8759873.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015496426","display_name":"Shengyou Xu","orcid":"https://orcid.org/0000-0001-6192-9508"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I4210136868","display_name":"New Technology (Israel)","ror":"https://ror.org/04k7ny084","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210136868"]}],"countries":["CN","IL"],"is_corresponding":true,"raw_author_name":"Shengyou Xu","raw_affiliation_strings":["School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044"],"raw_orcid":"https://orcid.org/0000-0001-6192-9508","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044","institution_ids":["https://openalex.org/I158842170","https://openalex.org/I4210136868"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023772429","display_name":"Xin Yang","orcid":"https://orcid.org/0000-0001-6922-2419"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Yang","raw_affiliation_strings":["School of Automation, Chongqing University, Chongqing 400044, China","School of Automation, Chongqing University, Chongqing 400044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Automation, Chongqing University, Chongqing 400044","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100428090","display_name":"Li Ran","orcid":"https://orcid.org/0000-0002-9626-6799"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]},{"id":"https://openalex.org/I4210136868","display_name":"New Technology (Israel)","ror":"https://ror.org/04k7ny084","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210136868"]}],"countries":["CN","GB","IL"],"is_corresponding":false,"raw_author_name":"Li Ran","raw_affiliation_strings":["School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","School of Engineering, Warwick University, Coventry CV4 7AL, UK","School of Engineering, Warwick University, Coventry CV4 7AL","School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Engineering, Warwick University, Coventry CV4 7AL, UK","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"School of Engineering, Warwick University, Coventry CV4 7AL","institution_ids":["https://openalex.org/I39555362"]},{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044","institution_ids":["https://openalex.org/I158842170","https://openalex.org/I4210136868"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014299872","display_name":"Minyou Chen","orcid":"https://orcid.org/0000-0001-7186-5704"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I4210136868","display_name":"New Technology (Israel)","ror":"https://ror.org/04k7ny084","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210136868"]}],"countries":["CN","IL"],"is_corresponding":false,"raw_author_name":"Minyou Chen","raw_affiliation_strings":["School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044","institution_ids":["https://openalex.org/I158842170","https://openalex.org/I4210136868"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050173955","display_name":"Wei Lai","orcid":"https://orcid.org/0000-0001-8418-3964"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]},{"id":"https://openalex.org/I4210136868","display_name":"New Technology (Israel)","ror":"https://ror.org/04k7ny084","country_code":"IL","type":"company","lineage":["https://openalex.org/I4210136868"]}],"countries":["CN","IL"],"is_corresponding":false,"raw_author_name":"Wei Lai","raw_affiliation_strings":["School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044, China","institution_ids":["https://openalex.org/I158842170"]},{"raw_affiliation_string":"School of Electrical Engineering, State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing 400044","institution_ids":["https://openalex.org/I158842170","https://openalex.org/I4210136868"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5015496426"],"corresponding_institution_ids":["https://openalex.org/I158842170","https://openalex.org/I4210136868"],"apc_list":{"value":2550,"currency":"USD","value_usd":2550},"apc_paid":{"value":2550,"currency":"USD","value_usd":2550},"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.00956562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"2019","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.710598886013031},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6792929768562317},{"id":"https://openalex.org/keywords/nonlinear-autoregressive-exogenous-model","display_name":"Nonlinear autoregressive exogenous model","score":0.609488308429718},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5519171357154846},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5469314455986023},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5448716282844543},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5415002107620239},{"id":"https://openalex.org/keywords/autoregressive-model","display_name":"Autoregressive model","score":0.5373116731643677},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.5146058797836304},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5134168863296509},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4108237028121948},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3216325044631958},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2126009166240692},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20954090356826782},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16122660040855408},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09243908524513245},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08575403690338135}],"concepts":[{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.710598886013031},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6792929768562317},{"id":"https://openalex.org/C42536954","wikidata":"https://www.wikidata.org/wiki/Q7049462","display_name":"Nonlinear autoregressive exogenous model","level":3,"score":0.609488308429718},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5519171357154846},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5469314455986023},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5448716282844543},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5415002107620239},{"id":"https://openalex.org/C159877910","wikidata":"https://www.wikidata.org/wiki/Q2202883","display_name":"Autoregressive model","level":2,"score":0.5373116731643677},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.5146058797836304},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5134168863296509},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4108237028121948},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3216325044631958},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2126009166240692},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20954090356826782},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16122660040855408},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09243908524513245},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08575403690338135},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1155/2019/8759873","is_oa":true,"landing_page_url":"http://doi.org/10.1155/2019/8759873","pdf_url":"https://downloads.hindawi.com/journals/complexity/2019/8759873.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:hin:complx:8759873","is_oa":false,"landing_page_url":"http://downloads.hindawi.com/journals/8503/2019/8759873.xml","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:doaj.org/article:de71601e0d144487a50bcfa5d045932c","is_oa":false,"landing_page_url":"https://doaj.org/article/de71601e0d144487a50bcfa5d045932c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Complexity, Vol 2019 (2019)","raw_type":"article"},{"id":"pmh:oai:hindawi.com:10.1155/2019/8759873","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2019/8759873","pdf_url":null,"source":{"id":"https://openalex.org/S4306400340","display_name":"Hindawi Journal of Chemistry (Hindawi)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210126990","host_organization_name":"Hindawi (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210126990"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Research Article"}],"best_oa_location":{"id":"doi:10.1155/2019/8759873","is_oa":true,"landing_page_url":"http://doi.org/10.1155/2019/8759873","pdf_url":"https://downloads.hindawi.com/journals/complexity/2019/8759873.pdf","source":{"id":"https://openalex.org/S207319443","display_name":"Complexity","issn_l":"1076-2787","issn":["1076-2787","1099-0526"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Complexity","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8199999928474426,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G1486503701","display_name":null,"funder_award_id":"51477019","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2914283252.pdf","grobid_xml":"https://content.openalex.org/works/W2914283252.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1937891980","https://openalex.org/W1966994623","https://openalex.org/W1983818427","https://openalex.org/W2057482994","https://openalex.org/W2062759299","https://openalex.org/W2066211048","https://openalex.org/W2080496812","https://openalex.org/W2082619602","https://openalex.org/W2096915251","https://openalex.org/W2104891043","https://openalex.org/W2123174016","https://openalex.org/W2128422340","https://openalex.org/W2131062635","https://openalex.org/W2135904172","https://openalex.org/W2150763729","https://openalex.org/W2160945992","https://openalex.org/W2167320299","https://openalex.org/W2172040937","https://openalex.org/W2241932945","https://openalex.org/W2243758511","https://openalex.org/W2290511012","https://openalex.org/W2464895101","https://openalex.org/W2528388226","https://openalex.org/W2533670403","https://openalex.org/W2543472778","https://openalex.org/W2546726487"],"related_works":["https://openalex.org/W2606910468","https://openalex.org/W3116827148","https://openalex.org/W3120843198","https://openalex.org/W2154965898","https://openalex.org/W2036704594","https://openalex.org/W4226315710","https://openalex.org/W3083782034","https://openalex.org/W4287185323","https://openalex.org/W2117809914","https://openalex.org/W4411196841"],"abstract_inverted_index":{"Power":[0],"modules":[1,85,104,126],"connected":[2],"in":[3,112],"parallel":[4],"may":[5],"have":[6],"different":[7,21,26,29],"electrothermal":[8,22],"performance":[9,23],"variances":[10,24],"resulting":[11],"from":[12,120],"aging":[13,212],"because":[14],"of":[15,19,42,61,70,82,101,211,227,235],"the":[16,39,50,54,59,68,102,110,149,157,183,190,193,196,204,208,218,233,236],"nonuniform":[17],"rate":[18],"degradation;":[20],"mean":[25],"current":[27,75],"sharing,":[28,76],"junction":[30,77],"temperature,":[31,78],"and":[32,52,79,89,99,143,151,195,207],"power":[33,63,80,84,103,114,125,152,160,199],"losses,":[34],"which":[35],"will":[36],"directly":[37],"influence":[38],"overall":[40],"characteristics":[41],"them.":[43],"Thus,":[44],"it":[45],"is":[46,94,154,162,179,201],"essential":[47],"to":[48,57,117],"monitor":[49],"condition":[51,97,206],"evaluate":[53],"degradation":[55,119,209],"grade":[56,210],"improve":[58],"reliability":[60],"large\u2010scale":[62],"modules.":[64],"In":[65,122],"this":[66,123,228],"paper,":[67],"impact":[69],"thermal":[71,144],"resistance":[72],"difference":[73],"on":[74,182],"loss":[81,115,153,200],"parallel\u2010connected":[83],"has":[86],"been":[87],"discussed":[88],"analyzed.":[90],"Additionally,":[91],"a":[92,130,176,186],"methodology":[93],"proposed":[95,237],"for":[96,189],"monitoring":[98,177],"evaluation":[100],"without":[105],"intruding":[106],"them":[107],"by":[108,164,225],"recognizing":[109],"increase":[111],"external":[113,135],"due":[116],"internal":[118],"aging.":[121],"method,":[124],"are":[127,146],"deemed":[128],"as":[129,148,156],"whole":[131],"system":[132],"considering":[133],"only":[134],"factors":[136],"associated":[137],"with":[138,170],"them,":[139],"all":[140],"important":[141],"electrical":[142],"parameters":[145],"classified":[147],"inputs,":[150],"considered":[155],"output.":[158],"Firstly,":[159],"dissipation":[161],"predicted":[163,197],"models":[165],"using":[166],"NARX":[167],"(nonlinear":[168],"autoregressive":[169],"exogenous":[171],"input)":[172],"neural":[173],"network.":[174],"Then,":[175],"method":[178],"illustrated":[180],"based":[181],"prediction":[184],"model;":[185],"reasonable":[187],"criterion":[188],"error":[191],"between":[192],"normal":[194],"real\u2010time":[198,205],"established.":[202],"Finally,":[203],"can":[213,220],"be":[214],"evaluated":[215],"so":[216],"that":[217],"operator":[219],"take":[221],"suitable":[222],"operating":[223],"measures":[224],"means":[226],"approach.":[229],"Experimental":[230],"results":[231],"validated":[232],"effectiveness":[234],"methodology.":[238]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}