{"id":"https://openalex.org/W2776658986","doi":"https://doi.org/10.1155/2017/8424012","title":"Characterization of Elastic and Plastic Behaviors in Steel Plate Based on Eddy Current Technique Using a Portable Impedance Analyzer","display_name":"Characterization of Elastic and Plastic Behaviors in Steel Plate Based on Eddy Current Technique Using a Portable Impedance Analyzer","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2776658986","doi":"https://doi.org/10.1155/2017/8424012","mag":"2776658986"},"language":"en","primary_location":{"id":"doi:10.1155/2017/8424012","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/8424012","pdf_url":"http://downloads.hindawi.com/journals/js/2017/8424012.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"http://downloads.hindawi.com/journals/js/2017/8424012.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030336313","display_name":"Fanlin Meng","orcid":"https://orcid.org/0000-0002-4866-0011"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Meng Fanlin","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051555626","display_name":"Xiucheng Liu","orcid":"https://orcid.org/0000-0002-1067-8734"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Liu Xiucheng","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1067-8734","affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103198674","display_name":"Heyun Wang","orcid":"https://orcid.org/0000-0001-9006-5614"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Heyun","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005076728","display_name":"Cunfu He","orcid":"https://orcid.org/0000-0002-3798-4723"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"He Cunfu","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076646726","display_name":"Bin Wu","orcid":"https://orcid.org/0000-0001-8144-6263"},"institutions":[{"id":"https://openalex.org/I37796252","display_name":"Beijing University of Technology","ror":"https://ror.org/037b1pp87","country_code":"CN","type":"education","lineage":["https://openalex.org/I37796252"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wu Bin","raw_affiliation_strings":["College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechanical Engineering and Applied Electronics Technology, Beijing University of Technology, Beijing, China","institution_ids":["https://openalex.org/I37796252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5051555626"],"corresponding_institution_ids":["https://openalex.org/I37796252"],"apc_list":{"value":2375,"currency":"USD","value_usd":2375},"apc_paid":{"value":2375,"currency":"USD","value_usd":2375},"fwci":0.5075,"has_fulltext":true,"cited_by_count":8,"citation_normalized_percentile":{"value":0.65208192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"2017","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7247148752212524},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.7106704711914062},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.6912971138954163},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6599699258804321},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.5399001836776733},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.5294318199157715},{"id":"https://openalex.org/keywords/phase-angle","display_name":"Phase angle (astronomy)","score":0.5111036896705627},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.47900670766830444},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4547925591468811},{"id":"https://openalex.org/keywords/ultimate-tensile-strength","display_name":"Ultimate tensile strength","score":0.44993236660957336},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.44227585196495056},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.39528578519821167},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.33165645599365234},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2068381905555725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18846994638442993},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16888532042503357},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.12312889099121094},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09851288795471191}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7247148752212524},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.7106704711914062},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.6912971138954163},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6599699258804321},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.5399001836776733},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.5294318199157715},{"id":"https://openalex.org/C170222088","wikidata":"https://www.wikidata.org/wiki/Q2059855","display_name":"Phase angle (astronomy)","level":2,"score":0.5111036896705627},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.47900670766830444},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4547925591468811},{"id":"https://openalex.org/C112950240","wikidata":"https://www.wikidata.org/wiki/Q76005","display_name":"Ultimate tensile strength","level":2,"score":0.44993236660957336},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.44227585196495056},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.39528578519821167},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.33165645599365234},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2068381905555725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18846994638442993},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16888532042503357},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.12312889099121094},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09851288795471191},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1155/2017/8424012","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/8424012","pdf_url":"http://downloads.hindawi.com/journals/js/2017/8424012.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0539abb68a914d96adf377e07e52beeb","is_oa":false,"landing_page_url":"https://doaj.org/article/0539abb68a914d96adf377e07e52beeb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Sensors, Vol 2017 (2017)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2017/8424012","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/8424012","pdf_url":"http://downloads.hindawi.com/journals/js/2017/8424012.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1238782339","display_name":null,"funder_award_id":"2014M560029","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"},{"id":"https://openalex.org/G1665847237","display_name":null,"funder_award_id":"11402008","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G2777053518","display_name":null,"funder_award_id":"2014M560029","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3219076267","display_name":null,"funder_award_id":"3154030","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"},{"id":"https://openalex.org/G3245164570","display_name":null,"funder_award_id":"3154030","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G3504020862","display_name":null,"funder_award_id":"11527801","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G4833291160","display_name":null,"funder_award_id":"11527801","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5549783601","display_name":null,"funder_award_id":"11402008","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"},{"id":"https://openalex.org/G5818706331","display_name":null,"funder_award_id":"11402008","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6484700224","display_name":null,"funder_award_id":"3154030","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G682422471","display_name":null,"funder_award_id":"2014M560029","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G7261858074","display_name":null,"funder_award_id":"11527801","funder_id":"https://openalex.org/F4320334977","funder_display_name":"Beijing Municipal Natural Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320334977","display_name":"Beijing Municipal Natural Science Foundation","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2776658986.pdf","grobid_xml":"https://content.openalex.org/works/W2776658986.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W1619450335","https://openalex.org/W1942393545","https://openalex.org/W1966027206","https://openalex.org/W1967117415","https://openalex.org/W1969016247","https://openalex.org/W1971873959","https://openalex.org/W2008722221","https://openalex.org/W2014145480","https://openalex.org/W2015373825","https://openalex.org/W2026081515","https://openalex.org/W2033521448","https://openalex.org/W2061315679","https://openalex.org/W2065614817","https://openalex.org/W2083691959","https://openalex.org/W2086383542","https://openalex.org/W2091419017","https://openalex.org/W2113025730","https://openalex.org/W2140558396","https://openalex.org/W2141261997","https://openalex.org/W2147412268","https://openalex.org/W2166207675","https://openalex.org/W2235271548","https://openalex.org/W2309646221","https://openalex.org/W2367533128"],"related_works":["https://openalex.org/W2391061712","https://openalex.org/W2094171095","https://openalex.org/W4231462422","https://openalex.org/W2546380746","https://openalex.org/W2018394392","https://openalex.org/W2516888427","https://openalex.org/W2375936545","https://openalex.org/W2333316656","https://openalex.org/W2050511751","https://openalex.org/W2039908213"],"abstract_inverted_index":{"A":[0,54,136],"portable":[1,173],"impedance":[2,16,23,48,107,142,174],"analyzer":[3,24,175],"(PIA)":[4],"was":[5,35,150],"developed":[6,172],"based":[7],"on":[8,157],"a":[9,50],"TiePie-HS3":[10],"device":[11],"to":[12,37,152,179],"provide":[13],"the":[14,20,26,33,39,44,62,66,73,76,83,86,93,97,104,109,115,128,134,141,146,158,171,177,181],"comparable":[15],"measurement":[17],"accuracy":[18],"of":[19,29,43,56,68,75,96,106,111,117,145],"Agilent":[21],"4294a":[22],"in":[25,49,85,161,186,189],"frequency":[27],"range":[28],"0~250":[30],"kHz.":[31],"Then":[32],"PIA":[34],"applied":[36],"monitor":[38],"tensile":[40,87,159],"stress-induced":[41],"variation":[42,105,110,123,143],"eddy":[45,77,194],"current":[46,78,195],"sensor\u2019s":[47],"medium-carbon":[51],"steel":[52],"sample.":[53],"model":[55],"equivalent":[57],"magnetic":[58],"field":[59],"induced":[60],"by":[61,133],"elastic":[63,162,182],"stress":[64,88,160],"and":[65,89,114,126,163,183],"number":[67],"pinning":[69],"sites":[70],"indicated":[71],"that":[72,103],"inductance":[74],"loop":[79],"firstly":[80],"increased":[81],"with":[82,170,192],"increase":[84],"then":[90],"decreased":[91],"at":[92],"yield":[94,129],"point":[95],"material.":[98],"The":[99,166],"experimental":[100],"results":[101],"testified":[102],"amplitude,":[108],"phase":[112],"angle,":[113],"shift":[116],"two":[118,148],"featured":[119],"frequencies":[120],"demonstrated":[121],"opposite":[122],"trends":[124],"before":[125],"after":[127],"point,":[130],"as":[131],"predicated":[132],"model.":[135],"new":[137,167],"parameter,":[138],"which":[139],"combined":[140],"information":[144],"selected":[147],"frequencies,":[149],"found":[151],"exhibit":[153],"nearly":[154],"monotonous":[155],"dependency":[156],"plastic":[164,184],"stages.":[165],"parameter":[168],"together":[169],"provided":[176],"solution":[178],"identify":[180],"behaviors":[185],"ferromagnetic":[187],"materials":[188],"practical":[190],"applications":[191],"an":[193],"technique.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}