{"id":"https://openalex.org/W2741581517","doi":"https://doi.org/10.1155/2017/6175429","title":"Research on Fault Diagnosis for Pumping Station Based on T-S Fuzzy Fault Tree and Bayesian Network","display_name":"Research on Fault Diagnosis for Pumping Station Based on T-S Fuzzy Fault Tree and Bayesian Network","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2741581517","doi":"https://doi.org/10.1155/2017/6175429","mag":"2741581517"},"language":"en","primary_location":{"id":"doi:10.1155/2017/6175429","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/6175429","pdf_url":"http://downloads.hindawi.com/journals/jece/2017/6175429.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"http://downloads.hindawi.com/journals/jece/2017/6175429.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016402616","display_name":"Zhuqing Bi","orcid":"https://orcid.org/0000-0002-3432-018X"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuqing Bi","raw_affiliation_strings":["College of Computer and Information Engineering, Hohai University, Nanjing 211100, China"],"affiliations":[{"raw_affiliation_string":"College of Computer and Information Engineering, Hohai University, Nanjing 211100, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100703823","display_name":"Chenming Li","orcid":"https://orcid.org/0000-0003-0959-7600"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chenming Li","raw_affiliation_strings":["College of Computer and Information Engineering, Hohai University, Nanjing 211100, China"],"affiliations":[{"raw_affiliation_string":"College of Computer and Information Engineering, Hohai University, Nanjing 211100, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051450820","display_name":"Xujie Li","orcid":"https://orcid.org/0000-0001-5486-5702"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xujie Li","raw_affiliation_strings":["College of Computer and Information Engineering, Hohai University, Nanjing 211100, China"],"affiliations":[{"raw_affiliation_string":"College of Computer and Information Engineering, Hohai University, Nanjing 211100, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044826967","display_name":"Hongmin Gao","orcid":"https://orcid.org/0000-0002-8404-2464"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongmin Gao","raw_affiliation_strings":["College of Computer and Information Engineering, Hohai University, Nanjing 211100, China"],"affiliations":[{"raw_affiliation_string":"College of Computer and Information Engineering, Hohai University, Nanjing 211100, China","institution_ids":["https://openalex.org/I163340411"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100703823"],"corresponding_institution_ids":["https://openalex.org/I163340411"],"apc_list":{"value":1400,"currency":"USD","value_usd":1400},"apc_paid":{"value":1400,"currency":"USD","value_usd":1400},"fwci":0.8145,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.74150927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"2017","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13050","display_name":"Oil and Gas Production Techniques","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9865000247955322,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.751703679561615},{"id":"https://openalex.org/keywords/fault-tree-analysis","display_name":"Fault tree analysis","score":0.7316068410873413},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.6349532604217529},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.6171654462814331},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6045587658882141},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5809973478317261},{"id":"https://openalex.org/keywords/conditional-probability","display_name":"Conditional probability","score":0.5740818381309509},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4549126923084259},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.45017218589782715},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.44936999678611755},{"id":"https://openalex.org/keywords/tree","display_name":"Tree (set theory)","score":0.4394463896751404},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4339964687824249},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.32793623208999634},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.30537864565849304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2539612650871277},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19488340616226196},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10432159900665283}],"concepts":[{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.751703679561615},{"id":"https://openalex.org/C107094494","wikidata":"https://www.wikidata.org/wiki/Q428453","display_name":"Fault tree analysis","level":2,"score":0.7316068410873413},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.6349532604217529},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.6171654462814331},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6045587658882141},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5809973478317261},{"id":"https://openalex.org/C44492722","wikidata":"https://www.wikidata.org/wiki/Q327069","display_name":"Conditional probability","level":2,"score":0.5740818381309509},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4549126923084259},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.45017218589782715},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.44936999678611755},{"id":"https://openalex.org/C113174947","wikidata":"https://www.wikidata.org/wiki/Q2859736","display_name":"Tree (set theory)","level":2,"score":0.4394463896751404},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4339964687824249},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.32793623208999634},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.30537864565849304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2539612650871277},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19488340616226196},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10432159900665283},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1155/2017/6175429","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/6175429","pdf_url":"http://downloads.hindawi.com/journals/jece/2017/6175429.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c0ef7da244f54e83833bfa7c970386c5","is_oa":true,"landing_page_url":"https://doaj.org/article/c0ef7da244f54e83833bfa7c970386c5","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electrical and Computer Engineering, Vol 2017 (2017)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2017/6175429","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/6175429","pdf_url":"http://downloads.hindawi.com/journals/jece/2017/6175429.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2741581517.pdf","grobid_xml":"https://content.openalex.org/works/W2741581517.grobid-xml"},"referenced_works_count":5,"referenced_works":["https://openalex.org/W1488009796","https://openalex.org/W2016398952","https://openalex.org/W2347027361","https://openalex.org/W2409825378","https://openalex.org/W3142455492"],"related_works":["https://openalex.org/W4319221757","https://openalex.org/W2380738857","https://openalex.org/W4323669679","https://openalex.org/W2363876627","https://openalex.org/W2390994030","https://openalex.org/W4245138339","https://openalex.org/W2899875829","https://openalex.org/W2002484325","https://openalex.org/W2137256417","https://openalex.org/W4285084075"],"abstract_inverted_index":{"According":[0],"to":[1,103,112,188],"the":[2,12,36,44,58,85,88,114,121,124,128,131,135,138,148,151,154,157,164,177,183,189,193],"characteristics":[3],"of":[4,52,95,99,120,130,137,147,156],"fault":[5,27,40,66,93,144],"diagnosis":[6,94,145],"for":[7,92],"pumping":[8,96,152],"station,":[9],"such":[10],"as":[11],"complex":[13,78],"structure,":[14],"multiple":[15],"mappings,":[16],"and":[17,29,49,54,80,116,171,182],"numerous":[18],"uncertainties,":[19],"a":[20,143],"new":[21],"approach":[22],"combining":[23],"T-S":[24,63],"fuzzy":[25,64],"gate":[26,65],"tree":[28,41,67],"Bayesian":[30,169],"network":[31,170],"(BN)":[32],"is":[33,90,110,140,159,180,196],"proposed.":[34],"On":[35,84],"one":[37],"hand,":[38,87],"traditional":[39,168],"method":[42,68,126,139,158],"needs":[43],"logical":[45],"relationship":[46],"between":[47],"events":[48,53,59],"probability":[50,118],"value":[51],"can":[55,69],"only":[56,81],"represent":[57],"with":[60,105,163],"two":[61,132,191],"states.":[62],"solve":[70],"these":[71],"disadvantages":[72],"but":[73],"still":[74],"has":[75],"weaknesses":[76],"in":[77,150],"reasoning":[79],"one-way":[82],"reasoning.":[83],"other":[86],"BN":[89],"suitable":[91],"station":[97],"because":[98],"its":[100],"powerful":[101],"ability":[102],"deal":[104],"uncertain":[106],"information.":[107],"However,":[108],"it":[109],"difficult":[111],"determine":[113],"structure":[115],"conditional":[117],"tables":[119],"BN.":[122],"Therefore,":[123],"proposed":[125],"integrates":[127],"advantages":[129],"methods.":[133],"Finally,":[134],"feasibility":[136],"verified":[141,160],"through":[142],"model":[146],"rotor":[149],"unit,":[153],"accuracy":[155],"by":[161],"comparing":[162],"methods":[165],"based":[166],"on":[167],"BP":[172],"neural":[173],"network,":[174],"respectively,":[175],"when":[176,192],"historical":[178,194],"data":[179,195],"sufficient,":[181],"results":[184],"are":[185],"more":[186],"superior":[187],"above":[190],"insufficient.":[197]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}