{"id":"https://openalex.org/W2765692787","doi":"https://doi.org/10.1155/2017/3417562","title":"Highly Sensitive Reentrant Cavity-Microstrip Patch Antenna Integrated Wireless Passive Pressure Sensor for High Temperature Applications","display_name":"Highly Sensitive Reentrant Cavity-Microstrip Patch Antenna Integrated Wireless Passive Pressure Sensor for High Temperature Applications","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2765692787","doi":"https://doi.org/10.1155/2017/3417562","mag":"2765692787"},"language":"en","primary_location":{"id":"doi:10.1155/2017/3417562","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/3417562","pdf_url":null,"source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1155/2017/3417562","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067335477","display_name":"Fei Lu","orcid":"https://orcid.org/0000-0003-0521-4457"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Lu","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035946662","display_name":"Yanjie Guo","orcid":"https://orcid.org/0000-0002-8958-1977"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanjie Guo","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002509281","display_name":"Qiulin Tan","orcid":"https://orcid.org/0000-0001-7877-9278"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Qiulin Tan","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":"https://orcid.org/0000-0001-7877-9278","affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026359540","display_name":"Tanyong Wei","orcid":"https://orcid.org/0000-0002-1611-012X"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tanyong Wei","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066533833","display_name":"Guozhu Wu","orcid":"https://orcid.org/0000-0003-0723-6908"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guozhu Wu","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":"https://orcid.org/0000-0003-0723-6908","affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Haixing Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haixing Wang","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101846633","display_name":"Lei Zhang","orcid":"https://orcid.org/0000-0003-3545-9439"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Zhang","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060710710","display_name":"Xiaowei Guo","orcid":"https://orcid.org/0000-0001-6855-5959"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Guo","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054341902","display_name":"Jijun Xiong","orcid":"https://orcid.org/0000-0003-1560-9858"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jijun Xiong","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5002509281"],"corresponding_institution_ids":["https://openalex.org/I135714990"],"apc_list":{"value":2100,"currency":"USD","value_usd":2100},"apc_paid":{"value":2100,"currency":"USD","value_usd":2100},"fwci":0.2624,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.56954785,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"2017","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11249","display_name":"Wireless Power Transfer Systems","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7193293571472168},{"id":"https://openalex.org/keywords/pressure-sensor","display_name":"Pressure sensor","score":0.6143503785133362},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.5641737580299377},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.560196042060852},{"id":"https://openalex.org/keywords/microstrip-antenna","display_name":"Microstrip antenna","score":0.5145227313041687},{"id":"https://openalex.org/keywords/patch-antenna","display_name":"Patch antenna","score":0.4977753460407257},{"id":"https://openalex.org/keywords/ceramic","display_name":"Ceramic","score":0.4895511567592621},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4888133704662323},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.467360258102417},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.44845008850097656},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.4379638731479645},{"id":"https://openalex.org/keywords/pressure-measurement","display_name":"Pressure measurement","score":0.432463139295578},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36513960361480713},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29847365617752075},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18461757898330688},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16287106275558472},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1479874551296234},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1001647412776947},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09865608811378479}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7193293571472168},{"id":"https://openalex.org/C41325743","wikidata":"https://www.wikidata.org/wiki/Q1261040","display_name":"Pressure sensor","level":2,"score":0.6143503785133362},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.5641737580299377},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.560196042060852},{"id":"https://openalex.org/C170349913","wikidata":"https://www.wikidata.org/wiki/Q13402882","display_name":"Microstrip antenna","level":3,"score":0.5145227313041687},{"id":"https://openalex.org/C159238334","wikidata":"https://www.wikidata.org/wiki/Q1419428","display_name":"Patch antenna","level":3,"score":0.4977753460407257},{"id":"https://openalex.org/C134132462","wikidata":"https://www.wikidata.org/wiki/Q45621","display_name":"Ceramic","level":2,"score":0.4895511567592621},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4888133704662323},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.467360258102417},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.44845008850097656},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.4379638731479645},{"id":"https://openalex.org/C80264047","wikidata":"https://www.wikidata.org/wiki/Q7424019","display_name":"Pressure measurement","level":2,"score":0.432463139295578},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36513960361480713},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29847365617752075},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18461757898330688},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16287106275558472},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1479874551296234},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1001647412776947},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09865608811378479}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1155/2017/3417562","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/3417562","pdf_url":null,"source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:88109dbc661f49b99b6297a6eab1c6a9","is_oa":false,"landing_page_url":"https://doaj.org/article/88109dbc661f49b99b6297a6eab1c6a9","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Sensors, Vol 2017 (2017)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2017/3417562","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/3417562","pdf_url":null,"source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7009363432","display_name":null,"funder_award_id":"51425505","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8593013811","display_name":null,"funder_award_id":"61471324","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1994158506","https://openalex.org/W1998746560","https://openalex.org/W2040316253","https://openalex.org/W2079642705","https://openalex.org/W2088964518","https://openalex.org/W2095667151","https://openalex.org/W2096104109","https://openalex.org/W2165007495","https://openalex.org/W2168108786","https://openalex.org/W2171492618","https://openalex.org/W2558921691","https://openalex.org/W2573868722","https://openalex.org/W3104158909"],"related_works":["https://openalex.org/W2356602650","https://openalex.org/W2036381365","https://openalex.org/W2163475120","https://openalex.org/W4376608282","https://openalex.org/W3117866996","https://openalex.org/W3199475988","https://openalex.org/W2469918402","https://openalex.org/W2557065001","https://openalex.org/W2088974759","https://openalex.org/W2263368082"],"abstract_inverted_index":{"A":[0],"novel":[1],"reentrant":[2,21],"cavity-microstrip":[3],"patch":[4,49],"antenna":[5,50],"integrated":[6,44],"wireless":[7,56],"passive":[8],"pressure":[9,89,128,140],"sensor":[10,42,63,96,123,150],"was":[11,23,51,64,80,92,97],"proposed":[12,52,62,149],"in":[13,82,132,153],"this":[14,59],"paper":[15],"for":[16,118],"high":[17,67,119],"temperature":[18,68,115,120,134],"applications.":[19],"The":[20],"cavity":[22],"analyzed":[24],"from":[25],"aspects":[26],"of":[27,38,111,129,136,142,163],"distributed":[28],"model":[29],"and":[30,72,78],"equivalent":[31],"lumped":[32],"circuit":[33],"model,":[34],"on":[35],"the":[36,61,95,122,133,148],"basis":[37],"which":[39],"an":[40,108],"optimal":[41],"structure":[43],"with":[45,66,75,87,107,138,159],"a":[46,83,154,160],"rectangular":[47],"microstrip":[48],"to":[53,104],"better":[54],"transmit/receive":[55],"signals.":[57],"In":[58,145],"paper,":[60],"fabricated":[65],"resistant":[69],"alumina":[70],"ceramic":[71],"silver":[73],"metalization":[74],"weld":[76],"sealing,":[77],"it":[79],"measured":[81],"hermetic":[84],"metal":[85],"tank":[86],"nitrogen":[88],"loading.":[90],"It":[91],"verified":[93],"that":[94],"highly":[98],"sensitive,":[99],"keeping":[100],"stable":[101],"performance":[102],"up":[103],"300":[105],"kPa":[106,131],"average":[109],"sensitivity":[110,141],"981.8":[112],"kHz/kPa":[113],"at":[114],"25\u00b0C,":[116],"while,":[117],"measurement,":[121],"can":[124],"operate":[125],"properly":[126],"under":[127],"60\u2013120":[130],"range":[135],"25\u2013300\u00b0C":[137],"maximum":[139,161],"179.2":[143],"kHz/kPa.":[144],"practical":[146],"application,":[147],"is":[151],"used":[152],"method":[155],"called":[156],"table":[157],"lookup":[158],"error":[162],"5.78%.":[164]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}