{"id":"https://openalex.org/W2617847831","doi":"https://doi.org/10.1155/2017/1605943","title":"Close Range Photogrammetry for Direct Multiple Feature Positioning Measurement without Targets","display_name":"Close Range Photogrammetry for Direct Multiple Feature Positioning Measurement without Targets","publication_year":2017,"publication_date":"2017-01-01","ids":{"openalex":"https://openalex.org/W2617847831","doi":"https://doi.org/10.1155/2017/1605943","mag":"2617847831"},"language":"en","primary_location":{"id":"doi:10.1155/2017/1605943","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/1605943","pdf_url":"http://downloads.hindawi.com/journals/js/2017/1605943.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"http://downloads.hindawi.com/journals/js/2017/1605943.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036866411","display_name":"Gorka Kortaberria","orcid":"https://orcid.org/0000-0001-9487-7425"},"institutions":[{"id":"https://openalex.org/I4210136402","display_name":"Tekniker","ror":"https://ror.org/033vryh36","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"Gorka Kortaberria","raw_affiliation_strings":["Mechanical Engineering Unit, IK4-Tekniker, Eibar, Spain"],"raw_orcid":"https://orcid.org/0000-0001-9487-7425","affiliations":[{"raw_affiliation_string":"Mechanical Engineering Unit, IK4-Tekniker, Eibar, Spain","institution_ids":["https://openalex.org/I4210136402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060952347","display_name":"Aitor Olarra","orcid":"https://orcid.org/0000-0001-7723-1948"},"institutions":[{"id":"https://openalex.org/I4210136402","display_name":"Tekniker","ror":"https://ror.org/033vryh36","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Aitor Olarra","raw_affiliation_strings":["Mechanical Engineering Unit, IK4-Tekniker, Eibar, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechanical Engineering Unit, IK4-Tekniker, Eibar, Spain","institution_ids":["https://openalex.org/I4210136402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091482754","display_name":"Alberto Tellaeche","orcid":"https://orcid.org/0000-0001-9236-1951"},"institutions":[{"id":"https://openalex.org/I4210136402","display_name":"Tekniker","ror":"https://ror.org/033vryh36","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Alberto Tellaeche","raw_affiliation_strings":["Smart and Autonomous Systems Unit, IK4-Tekniker, Eibar, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Smart and Autonomous Systems Unit, IK4-Tekniker, Eibar, Spain","institution_ids":["https://openalex.org/I4210136402"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031654416","display_name":"Rikardo M\u00ednguez","orcid":"https://orcid.org/0000-0003-4682-3814"},"institutions":[{"id":"https://openalex.org/I169108374","display_name":"University of the Basque Country","ror":"https://ror.org/000xsnr85","country_code":"ES","type":"education","lineage":["https://openalex.org/I169108374"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Rikardo Minguez","raw_affiliation_strings":["Department of Graphic Design and Engineering Projects, UPV/EHU, Bilbao, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Graphic Design and Engineering Projects, UPV/EHU, Bilbao, Spain","institution_ids":["https://openalex.org/I169108374"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5036866411"],"corresponding_institution_ids":["https://openalex.org/I4210136402"],"apc_list":{"value":2100,"currency":"USD","value_usd":2100},"apc_paid":{"value":2100,"currency":"USD","value_usd":2100},"fwci":1.2206,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.7781765,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"2017","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11211","display_name":"3D Surveying and Cultural Heritage","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/1907","display_name":"Geology"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photogrammetry","display_name":"Photogrammetry","score":0.9104448556900024},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.597771167755127},{"id":"https://openalex.org/keywords/laser-tracker","display_name":"Laser tracker","score":0.5958090424537659},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5723738670349121},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5571726560592651},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.523418664932251},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4781690239906311},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.47524523735046387},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.4602154493331909},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.3443159759044647},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3166451156139374},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.25101011991500854},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10336655378341675},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.07448768615722656}],"concepts":[{"id":"https://openalex.org/C117455697","wikidata":"https://www.wikidata.org/wiki/Q190149","display_name":"Photogrammetry","level":2,"score":0.9104448556900024},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.597771167755127},{"id":"https://openalex.org/C43210895","wikidata":"https://www.wikidata.org/wiki/Q2447583","display_name":"Laser tracker","level":3,"score":0.5958090424537659},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5723738670349121},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5571726560592651},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.523418664932251},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4781690239906311},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.47524523735046387},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.4602154493331909},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3443159759044647},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3166451156139374},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.25101011991500854},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10336655378341675},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.07448768615722656},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1155/2017/1605943","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/1605943","pdf_url":"http://downloads.hindawi.com/journals/js/2017/1605943.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:d7c9b1f1bfcf4d19b2930a07832ac63d","is_oa":true,"landing_page_url":"https://doaj.org/article/d7c9b1f1bfcf4d19b2930a07832ac63d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Sensors, Vol 2017 (2017)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2017/1605943","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2017/1605943","pdf_url":"http://downloads.hindawi.com/journals/js/2017/1605943.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8799999952316284,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320311175","display_name":"Steadman Philippon Research Institute","ror":"https://ror.org/03msykc12"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2617847831.pdf","grobid_xml":"https://content.openalex.org/works/W2617847831.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1970589689","https://openalex.org/W1971306954","https://openalex.org/W1971810564","https://openalex.org/W1972099936","https://openalex.org/W2002484140","https://openalex.org/W2015573009","https://openalex.org/W2028349249","https://openalex.org/W2031395879","https://openalex.org/W2040800665","https://openalex.org/W2084955675","https://openalex.org/W2091688468","https://openalex.org/W2211390032","https://openalex.org/W2465146196","https://openalex.org/W2466561030","https://openalex.org/W2549885501","https://openalex.org/W3120910577","https://openalex.org/W4213215721"],"related_works":["https://openalex.org/W2365572566","https://openalex.org/W2394068580","https://openalex.org/W2525880111","https://openalex.org/W2051732542","https://openalex.org/W2369515111","https://openalex.org/W1902541973","https://openalex.org/W3049104455","https://openalex.org/W1188945172","https://openalex.org/W2560018626","https://openalex.org/W2883748225"],"abstract_inverted_index":{"The":[0],"main":[1],"objective":[2],"of":[3,43,55,99,108],"this":[4],"study":[5],"is":[6],"to":[7,12,18,52,63,68],"present":[8],"a":[9,69,79,94,100],"new":[10,59,70],"method":[11],"carry":[13],"out":[14],"measurements":[15],"so":[16],"as":[17],"improve":[19],"the":[20,25,37],"positioning":[21],"verification":[22],"step":[23],"in":[24],"wind":[26],"hub":[27],"part":[28],"dimensional":[29],"validation":[30,92],"process.":[31],"This":[32],"enhancement":[33],"will":[34],"speed":[35],"up":[36],"measuring":[38,80],"procedures":[39],"for":[40],"these":[41],"types":[42],"parts.":[44],"An":[45],"industrial":[46],"photogrammetry":[47,74],"based":[48,72,84],"system":[49,89],"was":[50,82],"applied":[51],"take":[53],"advantage":[54],"its":[56],"results,":[57],"and":[58,76,87],"functions":[60],"were":[61],"added":[62],"existing":[64],"capabilities.":[65],"In":[66],"addition":[67],"development":[71],"on":[73,85],"modelling":[75],"image":[77],"processing,":[78],"procedure":[81,96],"defined":[83],"optical":[86],"vision":[88],"considerations.":[90],"A":[91],"against":[93],"certified":[95],"by":[97],"means":[98],"laser-tracker":[101],"has":[102],"also":[103],"been":[104],"established":[105],"obtaining":[106],"deviations":[107],"\u00b10.125":[109],"\u03bc":[110],"m/m.":[111]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}