{"id":"https://openalex.org/W2226271122","doi":"https://doi.org/10.1155/2016/5923825","title":"A Distance Compensated Approach Used in Wireless Passive Pressure Sensor Readout System for High Temperature Application","display_name":"A Distance Compensated Approach Used in Wireless Passive Pressure Sensor Readout System for High Temperature Application","publication_year":2015,"publication_date":"2015-11-16","ids":{"openalex":"https://openalex.org/W2226271122","doi":"https://doi.org/10.1155/2016/5923825","mag":"2226271122"},"language":"en","primary_location":{"id":"doi:10.1155/2016/5923825","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2016/5923825","pdf_url":"https://downloads.hindawi.com/journals/js/2016/5923825.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://downloads.hindawi.com/journals/js/2016/5923825.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101623358","display_name":"Yingping Hong","orcid":"https://orcid.org/0000-0003-2575-7539"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingping Hong","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022346472","display_name":"Ting Liang","orcid":"https://orcid.org/0000-0002-8769-4388"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ting Liang","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102147702","display_name":"Tingli Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingli Zheng","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066401231","display_name":"Qun Cao","orcid":null},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qun Cao","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100739058","display_name":"Wendong Zhang","orcid":"https://orcid.org/0000-0003-1762-9246"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wendong Zhang","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100684670","display_name":"Wenyi Liu","orcid":"https://orcid.org/0000-0002-7021-5854"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyi Liu","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101608532","display_name":"Huixin Zhang","orcid":"https://orcid.org/0000-0002-1529-6874"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huixin Zhang","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054341902","display_name":"Jijun Xiong","orcid":"https://orcid.org/0000-0003-1560-9858"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jijun Xiong","raw_affiliation_strings":["Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]},{"raw_affiliation_string":"Science and Technology on Electronic Test & Measurement Laboratory, North University of China, Taiyuan 030051, China","institution_ids":["https://openalex.org/I135714990"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5054341902"],"corresponding_institution_ids":["https://openalex.org/I135714990"],"apc_list":{"value":2375,"currency":"USD","value_usd":2375},"apc_paid":{"value":2375,"currency":"USD","value_usd":2375},"fwci":0.3208,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.66599505,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"2016","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.7202817797660828},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.5651108026504517},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.536352276802063},{"id":"https://openalex.org/keywords/inductive-coupling","display_name":"Inductive coupling","score":0.5246325135231018},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5215368270874023},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5179880857467651},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5141502022743225},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49384957551956177},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4702564477920532},{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.45265477895736694},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4286339282989502},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3717877268791199},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3635672330856323},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3292992413043976},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24123987555503845},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.1968429684638977},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15833988785743713},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15776944160461426},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11160364747047424}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.7202817797660828},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.5651108026504517},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.536352276802063},{"id":"https://openalex.org/C177872590","wikidata":"https://www.wikidata.org/wiki/Q1498289","display_name":"Inductive coupling","level":2,"score":0.5246325135231018},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5215368270874023},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5179880857467651},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5141502022743225},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49384957551956177},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4702564477920532},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.45265477895736694},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4286339282989502},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3717877268791199},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3635672330856323},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3292992413043976},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24123987555503845},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.1968429684638977},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15833988785743713},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15776944160461426},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11160364747047424},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/2016/5923825","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2016/5923825","pdf_url":"https://downloads.hindawi.com/journals/js/2016/5923825.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/2016/5923825","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2016/5923825","pdf_url":"https://downloads.hindawi.com/journals/js/2016/5923825.pdf","source":{"id":"https://openalex.org/S96783963","display_name":"Journal of Sensors","issn_l":"1687-725X","issn":["1687-725X","1687-7268"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Sensors","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7200000286102295}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2226271122.pdf","grobid_xml":"https://content.openalex.org/works/W2226271122.grobid-xml"},"referenced_works_count":11,"referenced_works":["https://openalex.org/W1972399686","https://openalex.org/W1996826330","https://openalex.org/W2022737769","https://openalex.org/W2061995989","https://openalex.org/W2084368982","https://openalex.org/W2087021802","https://openalex.org/W2114823893","https://openalex.org/W2115584060","https://openalex.org/W2152677897","https://openalex.org/W2164356070","https://openalex.org/W2567330260"],"related_works":["https://openalex.org/W1972557159","https://openalex.org/W562823126","https://openalex.org/W2117520483","https://openalex.org/W4235041402","https://openalex.org/W2132557366","https://openalex.org/W2163514044","https://openalex.org/W2367425854","https://openalex.org/W2610865200","https://openalex.org/W3188988031","https://openalex.org/W2129117421"],"abstract_inverted_index":{"This":[0,128],"paper":[1],"proposed":[2],"a":[3,9,34,40,44,95,146,177],"distance":[4,84,96,153],"compensated":[5,97],"measurement":[6,36],"system":[7,37,144],"for":[8],"wireless":[10],"passive":[11],"sensor":[12,27,60],"based":[13,104],"on":[14,81,105],"the":[15,52,59,73,82,88,106,110,121,124,137,151,167],"high":[16,23,67],"temperature":[17,24,68],"cofired":[18],"ceramics":[19],"(HTCC)":[20],"applied":[21],"to":[22,51,87,149],"environment.":[25,70],"The":[26,101],"model":[28],"is":[29,48,85,99,103,159],"provided":[30],"and":[31,43,61,76,94,134,166,186],"fabricated.":[32],"Also,":[33],"telemetric":[35,139],"consists":[38],"of":[39,54,72,90,109],"readout":[41,62,114,143],"instrumentation":[42],"heat":[45,55,91],"insulation":[46,56,92],"unit":[47,115],"described":[49],"due":[50],"thickness":[53,89],"material":[57],"between":[58,123],"unit\u2019s":[63],"inductance":[64,75,141],"coils":[65],"in":[66,136,170],"testing":[69,111],"Consideration":[71],"leakage":[74],"parasitic":[77],"parameters":[78],"which":[79,116],"depend":[80],"coupling":[83,142,152,158],"equivalent":[86],"material,":[93],"method":[98,129],"presented.":[100],"compensation":[102],"mathematical":[107],"feature":[108],"results":[112,168],"from":[113],"show":[117],"us":[118],"information":[119],"about":[120],"relation":[122],"extracted":[125],"resonant":[126],"frequencies.":[127],"can":[130],"be":[131],"used":[132],"simply":[133],"reliably":[135],"other":[138],"mutual":[140],"as":[145],"viable":[147],"solution":[148],"compensate":[150],"related":[154],"error":[155],"when":[156],"inductive":[157],"varied.":[160],"It":[161],"has":[162],"been":[163],"experimentally":[164],"tested,":[165],"are":[169,188],"good":[171],"agreement":[172],"with":[173],"those":[174],"measured":[175],"by":[176],"reference":[178],"impedance":[179],"analysis":[180],"instrument.":[181],"Theoretical":[182],"explanations,":[183],"experimental":[184],"results,":[185],"discussion":[187],"reported.":[189]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}