{"id":"https://openalex.org/W2069341517","doi":"https://doi.org/10.1155/2014/309193","title":"Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application","display_name":"Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application","publication_year":2014,"publication_date":"2014-01-01","ids":{"openalex":"https://openalex.org/W2069341517","doi":"https://doi.org/10.1155/2014/309193","mag":"2069341517"},"language":"en","primary_location":{"id":"doi:10.1155/2014/309193","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2014/309193","pdf_url":"https://downloads.hindawi.com/journals/jece/2014/309193.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://downloads.hindawi.com/journals/jece/2014/309193.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037220593","display_name":"Agust\u00edn Miguel Laprovitta","orcid":"https://orcid.org/0000-0003-1683-9655"},"institutions":[{"id":"https://openalex.org/I130054616","display_name":"Universidad Cat\u00f3lica de C\u00f3rdoba","ror":"https://ror.org/04hehwn14","country_code":"AR","type":"education","lineage":["https://openalex.org/I130054616"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Agust\u00edn Laprovitta","raw_affiliation_strings":["Communication Laboratory, Engineering Faculty, Universidad Cat\u00f3lica de C\u00f3rdoba, Avenida Armada Argentina 3555, 5017 C\u00f3rdoba, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Communication Laboratory, Engineering Faculty, Universidad Cat\u00f3lica de C\u00f3rdoba, Avenida Armada Argentina 3555, 5017 C\u00f3rdoba, Argentina","institution_ids":["https://openalex.org/I130054616"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026425794","display_name":"Gabriela Peretti","orcid":"https://orcid.org/0000-0003-1489-7982"},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]},{"id":"https://openalex.org/I3131778735","display_name":"National University of Villa Mar\u00eda","ror":"https://ror.org/031m0fr54","country_code":"AR","type":"education","lineage":["https://openalex.org/I3131778735"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Gabriela Peretti","raw_affiliation_strings":["Mechatronics Research Group, Facultad Regional Villa Mar\u00eda, Universidad Tecnol\u00f3gica Nacional, Avenida Universidad 450, 5900 Villa Mar\u00eda, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechatronics Research Group, Facultad Regional Villa Mar\u00eda, Universidad Tecnol\u00f3gica Nacional, Avenida Universidad 450, 5900 Villa Mar\u00eda, Argentina","institution_ids":["https://openalex.org/I3131778735","https://openalex.org/I128590013"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013614627","display_name":"Eduardo Romero","orcid":"https://orcid.org/0000-0001-8378-950X"},"institutions":[{"id":"https://openalex.org/I128590013","display_name":"National Technological University","ror":"https://ror.org/04t730v47","country_code":"AR","type":"education","lineage":["https://openalex.org/I128590013"]},{"id":"https://openalex.org/I3131778735","display_name":"National University of Villa Mar\u00eda","ror":"https://ror.org/031m0fr54","country_code":"AR","type":"education","lineage":["https://openalex.org/I3131778735"]}],"countries":["AR"],"is_corresponding":true,"raw_author_name":"Eduardo Romero","raw_affiliation_strings":["Mechatronics Research Group, Facultad Regional Villa Mar\u00eda, Universidad Tecnol\u00f3gica Nacional, Avenida Universidad 450, 5900 Villa Mar\u00eda, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechatronics Research Group, Facultad Regional Villa Mar\u00eda, Universidad Tecnol\u00f3gica Nacional, Avenida Universidad 450, 5900 Villa Mar\u00eda, Argentina","institution_ids":["https://openalex.org/I3131778735","https://openalex.org/I128590013"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013614627"],"corresponding_institution_ids":["https://openalex.org/I128590013","https://openalex.org/I3131778735"],"apc_list":{"value":1400,"currency":"USD","value_usd":1400},"apc_paid":{"value":1400,"currency":"USD","value_usd":1400},"fwci":0.315,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.61050477,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"2014","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9811999797821045,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7043692469596863},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6170511841773987},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5514782071113586},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5456536412239075},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.5380806922912598},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5149391293525696},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.43992382287979126},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.4350104033946991},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.434207558631897},{"id":"https://openalex.org/keywords/repeatability","display_name":"Repeatability","score":0.4217834770679474},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3644556701183319},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30228787660598755},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.23805838823318481},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.10668796300888062},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.103221595287323}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7043692469596863},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6170511841773987},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5514782071113586},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5456536412239075},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.5380806922912598},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5149391293525696},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.43992382287979126},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.4350104033946991},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.434207558631897},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.4217834770679474},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3644556701183319},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30228787660598755},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.23805838823318481},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.10668796300888062},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.103221595287323},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1155/2014/309193","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2014/309193","pdf_url":"https://downloads.hindawi.com/journals/jece/2014/309193.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},{"id":"pmh:oai:pa.bibdigital.uccor.edu.ar:4187","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S7407055304","display_name":"Academic Production","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Laprovitta, Agust\u00edn Miguel ORCID: https://orcid.org/0000-0003-1683-9655 <https://orcid.org/0000-0003-1683-9655>, Peretti, Gabriela and Romero, Eduardo  (2014) Applying the Analog Configurability Test Approach in a Wireless Sensor Network Application.  Journal of electrical and computer engineering, 2014.   ISSN 2090-0155","raw_type":"info:eu-repo/semantics/acceptedVersion"},{"id":"pmh:oai:doaj.org/article:96434120d4394f4eaf55e2986d6155c8","is_oa":true,"landing_page_url":"https://doaj.org/article/96434120d4394f4eaf55e2986d6155c8","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electrical and Computer Engineering, Vol 2014 (2014)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1155/2014/309193","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2014/309193","pdf_url":"https://downloads.hindawi.com/journals/jece/2014/309193.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2069341517.pdf","grobid_xml":"https://content.openalex.org/works/W2069341517.grobid-xml"},"referenced_works_count":15,"referenced_works":["https://openalex.org/W65805465","https://openalex.org/W322255140","https://openalex.org/W565729072","https://openalex.org/W986743132","https://openalex.org/W1495288325","https://openalex.org/W1502761083","https://openalex.org/W1762004504","https://openalex.org/W1977382189","https://openalex.org/W1983320508","https://openalex.org/W1994122417","https://openalex.org/W2049924211","https://openalex.org/W2098410292","https://openalex.org/W2129416419","https://openalex.org/W2138044595","https://openalex.org/W2164064335"],"related_works":["https://openalex.org/W2893816048","https://openalex.org/W4288084846","https://openalex.org/W3168747143","https://openalex.org/W2315867670","https://openalex.org/W1968795594","https://openalex.org/W2237675924","https://openalex.org/W4256621282","https://openalex.org/W2755432716","https://openalex.org/W1605170656","https://openalex.org/W2144897418"],"abstract_inverted_index":{"This":[0,34],"work":[1],"addresses":[2],"the":[3,6,30,64,90,96,131,139,142],"application":[4,42,114,149],"of":[5,20,55,60,141],"analog":[7,15],"configurability":[8],"test":[9,35,52,82,91,104,145],"(ACT)":[10],"approach":[11,105],"for":[12,40,63,137],"an":[13,80,110],"embedded":[14,28,81,111],"configurable":[16],"circuit":[17,143],"(EACC),":[18],"composed":[19],"operational":[21],"amplifiers":[22],"and":[23,66,99],"interconnection":[24],"resources":[25],"that":[26,84,130],"are":[27],"in":[29,146],"MSP430xG461x":[31],"microcontrollers":[32],"family.":[33],"strategy":[36,155],"is":[37,106,135],"particularly":[38],"useful":[39,136],"in-field":[41],"requiring":[43],"reliability,":[44],"safe":[45],"operation,":[46],"or":[47],"fault":[48],"tolerance":[49],"characteristics.":[50],"Our":[51,116],"proposal":[53],"consists":[54],"programming":[56],"a":[57,73,147,153,157],"reduced":[58],"set":[59],"available":[61],"configurations":[62],"EACC":[65],"testing":[67,138],"its":[68],"functionality":[69,140],"by":[70,151],"measuring":[71],"only":[72],"few":[74],"key":[75],"parameters.":[76],"The":[77,103],"processor":[78],"executes":[79],"routine":[83],"sequentially":[85],"programs":[86],"selected":[87],"configurations,":[88],"sets":[89],"stimulus,":[92],"acquires":[93],"data":[94],"from":[95],"internal":[97],"ADC,":[98],"performs":[100],"required":[101],"calculations.":[102],"experimentally":[107],"evaluated":[108],"using":[109,152],"system-based":[112],"real":[113,148],"board.":[115],"experimental":[117],"results":[118,128],"show":[119,129],"very":[120,124,158],"good":[121],"repeatability,":[122],"with":[123],"low":[125,159],"errors.":[126],"These":[127],"ACT":[132],"proposed":[133],"here":[134],"under":[144],"context":[150],"simple":[154],"at":[156],"cost.":[160]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}