{"id":"https://openalex.org/W1977062989","doi":"https://doi.org/10.1155/2012/105250","title":"Parametric Yield\u2010Driven Resource Binding in High\u2010Level Synthesis with Multi\u2010<i>V</i><sub>th</sub>/<i>V</i><sub>dd</sub>Library and Device Sizing","display_name":"Parametric Yield\u2010Driven Resource Binding in High\u2010Level Synthesis with Multi\u2010<i>V</i><sub>th</sub>/<i>V</i><sub>dd</sub>Library and Device Sizing","publication_year":2012,"publication_date":"2012-01-01","ids":{"openalex":"https://openalex.org/W1977062989","doi":"https://doi.org/10.1155/2012/105250","mag":"1977062989"},"language":"en","primary_location":{"id":"doi:10.1155/2012/105250","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2012/105250","pdf_url":"https://downloads.hindawi.com/journals/jece/2012/105250.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://downloads.hindawi.com/journals/jece/2012/105250.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100722125","display_name":"Yibo Chen","orcid":"https://orcid.org/0000-0001-6054-207X"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yibo Chen","raw_affiliation_strings":["Department of Computer Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA","Department of Computer Science and Engineering, The Pennsylvania State University, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA","institution_ids":["https://openalex.org/I130769515"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, The Pennsylvania State University, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100445061","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0001-6108-5157"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Wang","raw_affiliation_strings":["Department of Electronics Engineering, Tsinghua University, Beijing 100084, China","Department of Electronics Engineering; Tsinghua University; Beijing China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, Tsinghua University, Beijing 100084, China","institution_ids":["https://openalex.org/I99065089"]},{"raw_affiliation_string":"Department of Electronics Engineering; Tsinghua University; Beijing China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100385336","display_name":"Yuan Xie","orcid":"https://orcid.org/0000-0003-2093-1788"},"institutions":[{"id":"https://openalex.org/I130769515","display_name":"Pennsylvania State University","ror":"https://ror.org/04p491231","country_code":"US","type":"education","lineage":["https://openalex.org/I130769515"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuan Xie","raw_affiliation_strings":["Department of Computer Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA","Department of Computer Science and Engineering, The Pennsylvania State University, PA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Engineering, The Pennsylvania State University, University Park, PA 16802, USA","institution_ids":["https://openalex.org/I130769515"]},{"raw_affiliation_string":"Department of Computer Science and Engineering, The Pennsylvania State University, PA","institution_ids":["https://openalex.org/I130769515"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052483871","display_name":"Andr\u00e9s Takach","orcid":"https://orcid.org/0000-0003-2366-2667"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"Andres Takach","raw_affiliation_strings":["Design Creation and Synthesis, Mentor Graphics Corporation, Wilsonville, OR 97070, USA","Design Creation and Synthesis, Mentor Graphics Corporation, Wilsonville, OR#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Design Creation and Synthesis, Mentor Graphics Corporation, Wilsonville, OR 97070, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Design Creation and Synthesis, Mentor Graphics Corporation, Wilsonville, OR#TAB#","institution_ids":["https://openalex.org/I105695857"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100722125"],"corresponding_institution_ids":["https://openalex.org/I130769515"],"apc_list":{"value":925,"currency":"USD","value_usd":925},"apc_paid":{"value":925,"currency":"USD","value_usd":925},"fwci":0.2123,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59944159,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2012","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.6846376657485962},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.6431832909584045},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6029728651046753},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5875546336174011},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5675324201583862},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5672915577888489},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.5275252461433411},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5061432719230652},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.45964717864990234},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.448652982711792},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.44436439871788025},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4216739237308502},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.389626145362854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3866700530052185},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2609097361564636},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24388647079467773},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12705788016319275},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.10053393244743347},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08749169111251831},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.07791760563850403}],"concepts":[{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.6846376657485962},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.6431832909584045},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6029728651046753},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5875546336174011},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5675324201583862},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5672915577888489},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.5275252461433411},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5061432719230652},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.45964717864990234},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.448652982711792},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.44436439871788025},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4216739237308502},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.389626145362854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3866700530052185},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2609097361564636},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24388647079467773},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12705788016319275},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.10053393244743347},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08749169111251831},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.07791760563850403},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1155/2012/105250","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2012/105250","pdf_url":"https://downloads.hindawi.com/journals/jece/2012/105250.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:411b344f9d994ff18a495012e706c9cd","is_oa":true,"landing_page_url":"https://doaj.org/article/411b344f9d994ff18a495012e706c9cd","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Electrical and Computer Engineering, Vol 2012 (2012)","raw_type":"article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-133754","is_oa":false,"landing_page_url":"http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=2090-0155&rft.volume=&rft.issue=&rft.date=2012&rft.spage=&rft.aulast=Chen&rft.aufirst=Yibo&rft.atitle=Parametric+yield-driven+resource+binding+in+high-level+synthesis+with+multi-V+th%2FV+dd+library+and+device+sizing&rft.title=Journal+of+Electrical+and+Computer+Engineering","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":{"id":"doi:10.1155/2012/105250","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2012/105250","pdf_url":"https://downloads.hindawi.com/journals/jece/2012/105250.pdf","source":{"id":"https://openalex.org/S174662166","display_name":"Journal of Electrical and Computer Engineering","issn_l":"2090-0147","issn":["2090-0147","2090-0155"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Electrical and Computer Engineering","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.4000000059604645}],"awards":[{"id":"https://openalex.org/G225601637","display_name":null,"funder_award_id":"0643902","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2992497945","display_name":null,"funder_award_id":"61028006","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G3632994126","display_name":"\u57fa\u4e8eFPGA\u7684\u5177\u6709\u6297\u8870\u8001\u673a\u5236\u7684\u673a\u5668\u5b66\u4e60","funder_award_id":"60870001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3915133575","display_name":null,"funder_award_id":"60870001","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G4095089701","display_name":null,"funder_award_id":"61028006","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5087598183","display_name":null,"funder_award_id":"0903432","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5120428","display_name":null,"funder_award_id":"0643902","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G5301363178","display_name":"SHF:  Small:  Collaborative Research:  Testing and Design-for-Testability Solutions for 3D Stacked Integrated Circuits","funder_award_id":"1017277","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G6323286609","display_name":null,"funder_award_id":"1017277","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"},{"id":"https://openalex.org/G6901979050","display_name":"ADAMS: Architecture and Design Automation for 3D Multi-core Systems","funder_award_id":"0903432","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7487829357","display_name":"CAREER:  Process Variation Aware Embedded MPSoC Synthesis","funder_award_id":"0643902","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8211000743","display_name":null,"funder_award_id":"61028006","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8531734111","display_name":null,"funder_award_id":"1017277","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8569784251","display_name":null,"funder_award_id":"60870001","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8801517144","display_name":null,"funder_award_id":"0903432","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1977062989.pdf","grobid_xml":"https://content.openalex.org/works/W1977062989.grobid-xml"},"referenced_works_count":45,"referenced_works":["https://openalex.org/W1527137186","https://openalex.org/W1537216112","https://openalex.org/W1537614317","https://openalex.org/W1604677972","https://openalex.org/W1970462492","https://openalex.org/W1984176385","https://openalex.org/W1986056825","https://openalex.org/W1989716769","https://openalex.org/W2052852883","https://openalex.org/W2069262460","https://openalex.org/W2078595070","https://openalex.org/W2087107264","https://openalex.org/W2099250769","https://openalex.org/W2106371135","https://openalex.org/W2110134128","https://openalex.org/W2111372718","https://openalex.org/W2119915231","https://openalex.org/W2122421989","https://openalex.org/W2131314867","https://openalex.org/W2136144284","https://openalex.org/W2138643012","https://openalex.org/W2139167511","https://openalex.org/W2140823559","https://openalex.org/W2141907973","https://openalex.org/W2142474790","https://openalex.org/W2146810400","https://openalex.org/W2149751454","https://openalex.org/W2151681416","https://openalex.org/W2152531251","https://openalex.org/W2154773290","https://openalex.org/W2160130898","https://openalex.org/W2165867688","https://openalex.org/W2170799790","https://openalex.org/W2197932458","https://openalex.org/W2490855483","https://openalex.org/W2546351422","https://openalex.org/W2810799211","https://openalex.org/W3149637621","https://openalex.org/W4230854430","https://openalex.org/W4239130802","https://openalex.org/W4239145761","https://openalex.org/W4246224033","https://openalex.org/W4246298810","https://openalex.org/W4247816723","https://openalex.org/W4253257278"],"related_works":["https://openalex.org/W2375311683","https://openalex.org/W2366062860","https://openalex.org/W2373777250","https://openalex.org/W2353956655","https://openalex.org/W2020653254","https://openalex.org/W2010454064","https://openalex.org/W2352072014","https://openalex.org/W217279133","https://openalex.org/W2393487946","https://openalex.org/W2373310108"],"abstract_inverted_index":{"The":[0],"ever\u2010increasing":[1],"chip":[2],"power":[3,39,70,127,176,183,209],"dissipation":[4,71],"in":[5,84,141],"SoCs":[6],"has":[7,16,64],"imposed":[8],"great":[9],"challenges":[10],"on":[11,67,99,138],"today\u2019s":[12],"circuit":[13,75],"design.":[14],"It":[15],"been":[17],"shown":[18],"that":[19,63,207],"multiple":[20],"threshold":[21],"and":[22,72,86,126,150,177,180],"supply":[23],"voltages":[24],"assignment":[25],"(multi\u2010":[26],"V":[27,30,47,50,102,105,115,118],"th":[28,48,103,116],"/":[29,49,104,117],"dd":[31,51,106,119],")":[32],"is":[33,78,122,136,169],"an":[34],"effective":[35],"way":[36],"to":[37,80,144,151],"reduce":[38],"dissipation.":[40],"However,":[41],"most":[42],"of":[43,74,96,148,159],"the":[44,59,69,94,100,109,139,142,146,153,160,174,191,215],"prior":[45],"multi\u2010":[46,101,114],"optimizations":[52,87],"are":[53,198],"performed":[54,137],"under":[55,185],"deterministic":[56,224],"conditions.":[57],"With":[58],"increasing":[60],"process":[61,97],"variability":[62],"significant":[65,208],"impact":[66,95,147],"both":[68],"performance":[73],"designs,":[76],"it":[77],"necessary":[79],"employ":[81],"statistical":[82],"approaches":[83],"analysis":[85],"for":[88,124,156],"low":[89],"power.":[90],"This":[91],"paper":[92],"studies":[93],"variations":[98,128],"technique":[107],"at":[108,129],"behavioral":[110],"synthesis":[111],"level.":[112],"A":[113,163],"resource":[120,166,192],"library":[121,143],"characterized":[123,175],"delay":[125,178],"different":[130],"voltage":[131,195],"combinations.":[132],"Meanwhile,":[133],"device":[134],"sizing":[135],"resources":[140,201],"mitigate":[145],"variation,":[149],"enlarge":[152],"design":[154,161],"space":[155],"better":[157],"quality":[158],"choice.":[162],"parametric":[164],"yield\u2010driven":[165],"binding":[167,193],"algorithm":[168],"then":[170],"proposed,":[171],"which":[172],"uses":[173],"distributions":[179],"efficiently":[181],"maximizes":[182],"yield":[184,188],"a":[186],"timing":[187],"constraint.":[189],"During":[190],"process,":[194],"level":[196],"converters":[197],"inserted":[199],"between":[200],"when":[202],"required.":[203],"Experimental":[204],"results":[205],"show":[206],"reduction":[210],"can":[211],"be":[212],"achieved":[213],"with":[214,220],"proposed":[216],"variation\u2010aware":[217],"framework,":[218],"compared":[219],"traditional":[221],"worstcase":[222],"based":[223],"approaches.":[225]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}