{"id":"https://openalex.org/W2158218013","doi":"https://doi.org/10.1155/2001/28741","title":"Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis","display_name":"Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis","publication_year":2000,"publication_date":"2000-09-11","ids":{"openalex":"https://openalex.org/W2158218013","doi":"https://doi.org/10.1155/2001/28741","mag":"2158218013"},"language":"en","primary_location":{"id":"doi:10.1155/2001/28741","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2001/28741","pdf_url":"https://downloads.hindawi.com/archive/2001/028741.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://downloads.hindawi.com/archive/2001/028741.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110217608","display_name":"W.B. Jone","orcid":null},"institutions":[{"id":"https://openalex.org/I63135867","display_name":"University of Cincinnati","ror":"https://ror.org/01e3m7079","country_code":"US","type":"education","lineage":["https://openalex.org/I63135867"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. B. Jone","raw_affiliation_strings":["Department of Electrical and Computer Engineering and Computer Science, University of Cincinnati"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and Computer Science, University of Cincinnati","institution_ids":["https://openalex.org/I63135867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110161796","display_name":"Der\u2010Chen Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"D. C. Huang","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung-Cheng University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103574741","display_name":"S. C. Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I148099254","display_name":"National Chung Cheng University","ror":"https://ror.org/0028v3876","country_code":"TW","type":"education","lineage":["https://openalex.org/I148099254"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"S. C. Chang","raw_affiliation_strings":["Department of Computer Science and Information Engineering, National Chung-Cheng University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Information Engineering, National Chung-Cheng University","institution_ids":["https://openalex.org/I148099254"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101921227","display_name":"S.R. Das","orcid":"https://orcid.org/0000-0002-0668-1981"},"institutions":[{"id":"https://openalex.org/I153718931","display_name":"University of Ottawa","ror":"https://ror.org/03c4mmv16","country_code":"CA","type":"education","lineage":["https://openalex.org/I153718931"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"S. R. Das","raw_affiliation_strings":["School of Information Technology and Engineering, University of Ottawa"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Technology and Engineering, University of Ottawa","institution_ids":["https://openalex.org/I153718931"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3044,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.66308484,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"12","issue":"4","first_page":"457","last_page":"474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pseudorandom-number-generator","display_name":"Pseudorandom number generator","score":0.8986179828643799},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6141167283058167},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.5529600977897644},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5353821516036987},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4892590045928955},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.44540655612945557},{"id":"https://openalex.org/keywords/pseudorandomness","display_name":"Pseudorandomness","score":0.43180131912231445},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.42551130056381226},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4204173982143402},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3219519853591919},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1826973557472229},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07337638735771179}],"concepts":[{"id":"https://openalex.org/C140642157","wikidata":"https://www.wikidata.org/wiki/Q1623338","display_name":"Pseudorandom number generator","level":2,"score":0.8986179828643799},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6141167283058167},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5529600977897644},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5353821516036987},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4892590045928955},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.44540655612945557},{"id":"https://openalex.org/C19086982","wikidata":"https://www.wikidata.org/wiki/Q2115856","display_name":"Pseudorandomness","level":3,"score":0.43180131912231445},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.42551130056381226},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4204173982143402},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3219519853591919},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1826973557472229},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07337638735771179},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/2001/28741","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2001/28741","pdf_url":"https://downloads.hindawi.com/archive/2001/028741.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/2001/28741","is_oa":true,"landing_page_url":"https://doi.org/10.1155/2001/28741","pdf_url":"https://downloads.hindawi.com/archive/2001/028741.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2158218013.pdf","grobid_xml":"https://content.openalex.org/works/W2158218013.grobid-xml"},"referenced_works_count":59,"referenced_works":["https://openalex.org/W207911391","https://openalex.org/W260727648","https://openalex.org/W1508214910","https://openalex.org/W1512074530","https://openalex.org/W1515082873","https://openalex.org/W1535549764","https://openalex.org/W1554885925","https://openalex.org/W1827975329","https://openalex.org/W1945783588","https://openalex.org/W1974608375","https://openalex.org/W1978303825","https://openalex.org/W1988192422","https://openalex.org/W1995595470","https://openalex.org/W2032743383","https://openalex.org/W2039507354","https://openalex.org/W2041753256","https://openalex.org/W2058885739","https://openalex.org/W2065734112","https://openalex.org/W2068178298","https://openalex.org/W2083152404","https://openalex.org/W2101380155","https://openalex.org/W2106571261","https://openalex.org/W2107262883","https://openalex.org/W2109678242","https://openalex.org/W2115648995","https://openalex.org/W2126693329","https://openalex.org/W2127085036","https://openalex.org/W2127131334","https://openalex.org/W2129892046","https://openalex.org/W2131198338","https://openalex.org/W2131531157","https://openalex.org/W2133222590","https://openalex.org/W2136260278","https://openalex.org/W2140179946","https://openalex.org/W2140981367","https://openalex.org/W2143258279","https://openalex.org/W2151773248","https://openalex.org/W2152063058","https://openalex.org/W2158102622","https://openalex.org/W2170725568","https://openalex.org/W2183435195","https://openalex.org/W2322524800","https://openalex.org/W4210732758","https://openalex.org/W4285719527","https://openalex.org/W4302458519","https://openalex.org/W6608442845","https://openalex.org/W6610511242","https://openalex.org/W6630468703","https://openalex.org/W6632211626","https://openalex.org/W6644814522","https://openalex.org/W6660823529","https://openalex.org/W6667029918","https://openalex.org/W6667610082","https://openalex.org/W6675025686","https://openalex.org/W6676038650","https://openalex.org/W6676363538","https://openalex.org/W6679231519","https://openalex.org/W6679869345","https://openalex.org/W6682331218"],"related_works":["https://openalex.org/W2082419723","https://openalex.org/W3203585077","https://openalex.org/W4241950541","https://openalex.org/W2185337847","https://openalex.org/W2176553175","https://openalex.org/W1994207320","https://openalex.org/W2343905204","https://openalex.org/W2143898630","https://openalex.org/W2064782508","https://openalex.org/W2077146536"],"abstract_inverted_index":{"Pseudorandom":[0],"testing":[1,19,139],"has":[2,20],"been":[3,21],"widely":[4],"used":[5],"in":[6],"built\u2010in":[7],"self\u2010testing":[8],"of":[9,60,92,100,123,168],"VLSI":[10],"circuits.":[11],"Although":[12,184],"the":[13,49,54,61,69,74,83,90,101,125,133,144,154,169,191,202],"defect":[14,62,78,86,134,170],"level":[15,63,79,135,171],"estimation":[16],"for":[17,137],"pseudorandom":[18,50,107,138],"performed":[22],"using":[23],"sequential":[24],"statical":[25],"analysis,":[26],"no":[27],"closed":[28,58,166],"form":[29,59,167],"can":[30],"be":[31],"accomplished":[32],"as":[33],"complex":[34],"combinatorial":[35],"enumerations":[36],"are":[37,187],"involved.":[38],"In":[39],"this":[40],"work,":[41],"a":[42,57,162],"Markov":[43,75,111],"model":[44,112],"is":[45,65,113,149,160,173,197],"employed":[46],"to":[47,116,176,200,204],"describe":[48],"test":[51,108],"behaviors.":[52],"For":[53],"first":[55],"time,":[56],"equation":[64,71,80,172],"derived":[66,175],"by":[67,140],"solving":[68],"differential":[70],"extracted":[72],"from":[73],"model.":[76],"The":[77,110],"clearly":[81],"describes":[82],"relationships":[84],"among":[85],"level,":[87],"fabrication":[88],"yield,":[89],"number":[91],"all":[93,118,178],"input":[94],"combinations,":[95],"circuit":[96],"detectability":[97],"(in":[98],"terms":[99],"worst":[102,126,145,155],"single":[103,119,127,146,156,179,192],"stuck\u2010at":[104,120,128,147,157,180],"fault),":[105],"and":[106],"length.":[109],"then":[114],"extended":[115],"consider":[117],"faults,":[121],"instead":[122],"only":[124,141],"fault.":[129],"Results":[130],"demonstrate":[131],"that":[132],"analysis":[136,159],"dealing":[142],"with":[143],"fault":[148,158,194,206],"not":[150,198],"adequate":[151],"(In":[152],"fact,":[153],"just":[161],"special":[163],"case).":[164],"A":[165],"successfully":[174],"incorporate":[177],"faults":[181],"into":[182],"consideration.":[183],"our":[185],"discussions":[186],"primarily":[188],"based":[189],"on":[190],"struck\u2010at":[193],"model,":[195],"it":[196],"difficult":[199],"extend":[201],"results":[203],"other":[205],"types.":[207]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}