{"id":"https://openalex.org/W2052580664","doi":"https://doi.org/10.1155/1994/27973","title":"Resolution Enhancement in IDDQ Testingfor Large ICs","display_name":"Resolution Enhancement in IDDQ Testingfor Large ICs","publication_year":1994,"publication_date":"1994-01-01","ids":{"openalex":"https://openalex.org/W2052580664","doi":"https://doi.org/10.1155/1994/27973","mag":"2052580664"},"language":"en","primary_location":{"id":"doi:10.1155/1994/27973","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1994/27973","pdf_url":"https://downloads.hindawi.com/archive/1994/027973.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://downloads.hindawi.com/archive/1994/027973.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025456381","display_name":"Yashwant K. Malaiya","orcid":"https://orcid.org/0000-0002-1825-1671"},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yashwant K. Malaiya","raw_affiliation_strings":["Dept. of Computer Science, Colorado State University, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Computer Science, Colorado State University, USA","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026739162","display_name":"Anura P. Jayasumana","orcid":"https://orcid.org/0000-0002-8335-655X"},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Anura P. Jayasumana","raw_affiliation_strings":["Dept. of Electrical Engineering, Colorado State University, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Colorado State University, USA","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080468123","display_name":"C.Q. Tong","orcid":null},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carol Q. Tong","raw_affiliation_strings":["Dept. of Electrical Engineering, Colorado State University, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Colorado State University, USA","institution_ids":["https://openalex.org/I92446798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039310510","display_name":"S.M. Menon","orcid":null},"institutions":[{"id":"https://openalex.org/I92446798","display_name":"Colorado State University","ror":"https://ror.org/03k1gpj17","country_code":"US","type":"education","lineage":["https://openalex.org/I92446798"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sankaran M. Menon","raw_affiliation_strings":["Dept. of Electrical Engineering, Colorado State University, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical Engineering, Colorado State University, USA","institution_ids":["https://openalex.org/I92446798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5025456381"],"corresponding_institution_ids":["https://openalex.org/I92446798"],"apc_list":null,"apc_paid":null,"fwci":0.3974,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.66226468,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":"4","first_page":"277","last_page":"284"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.9968211650848389},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6671707034111023},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5994574427604675},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5481378436088562},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49505677819252014},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4603417217731476},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.432958722114563},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40012359619140625},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3862058222293854},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2540404498577118},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12550964951515198}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9968211650848389},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6671707034111023},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5994574427604675},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5481378436088562},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49505677819252014},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4603417217731476},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.432958722114563},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40012359619140625},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3862058222293854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2540404498577118},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12550964951515198},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/1994/27973","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1994/27973","pdf_url":"https://downloads.hindawi.com/archive/1994/027973.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/1994/27973","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1994/27973","pdf_url":"https://downloads.hindawi.com/archive/1994/027973.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.5299999713897705}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337345","display_name":"Office of Naval Research","ror":"https://ror.org/00rk2pe57"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2052580664.pdf","grobid_xml":"https://content.openalex.org/works/W2052580664.grobid-xml"},"referenced_works_count":24,"referenced_works":["https://openalex.org/W186179651","https://openalex.org/W1486681309","https://openalex.org/W1493667071","https://openalex.org/W1511344426","https://openalex.org/W2020876958","https://openalex.org/W2031085139","https://openalex.org/W2059638984","https://openalex.org/W2076301774","https://openalex.org/W2101344359","https://openalex.org/W2102383741","https://openalex.org/W2111156521","https://openalex.org/W2111261370","https://openalex.org/W2123088779","https://openalex.org/W2137285106","https://openalex.org/W2148843359","https://openalex.org/W2159892588","https://openalex.org/W2163598532","https://openalex.org/W4230394883","https://openalex.org/W4233728567","https://openalex.org/W4255251068","https://openalex.org/W6642089476","https://openalex.org/W6655300791","https://openalex.org/W6679484504","https://openalex.org/W6683869884"],"related_works":["https://openalex.org/W2052580664","https://openalex.org/W2141986687","https://openalex.org/W2501578203","https://openalex.org/W2113108952","https://openalex.org/W2040773997","https://openalex.org/W2102383741","https://openalex.org/W2075762290","https://openalex.org/W2111156521","https://openalex.org/W1913902722","https://openalex.org/W2912670917"],"abstract_inverted_index":{"Current":[0],"drawn":[1],"by":[2,48,69],"a":[3,29],"static":[4],"CMOS":[5],"VLSI":[6],"integrated":[7],"circuit":[8],"during":[9],"quiescent":[10,42],"periods":[11],"is":[12,16,25,102,120],"extremely":[13],"small":[14],"and":[15,64,88],"normally":[17],"of":[18,21,31,51,54,99,113],"the":[19,41,100,110],"order":[20],"nanoamperes.":[22],"However,":[23],"it":[24,76],"remarkably":[26],"susceptible":[27],"to":[28,46,80,86,92,108],"number":[30],"failure":[32],"modes.":[33],"Many":[34],"faults":[35,56],"present":[36],"in":[37],"such":[38],"ICs":[39],"cause":[40],"power\u2010supply":[43],"current":[44],"(IDDQ)":[45],"increase":[47],"several":[49],"orders":[50],"magnitude.":[52],"Some":[53],"these":[55],"may":[57,77],"not":[58,66],"manifest":[59],"themselves":[60],"as":[61],"logical":[62],"faults,":[63],"would":[65],"be":[67,78,106],"detected":[68],"traditional":[70],"IC":[71],"test":[72],"techniques.In":[73],"large":[74],"ICs,":[75],"hard":[79],"distinguish":[81],"between":[82],"larger":[83],"IDDQ":[84,90],"due":[85,91],"defects":[87],"elevated":[89],"normal":[93],"parameter":[94],"variations.":[95],"A":[96,115],"statistical":[97],"characterization":[98],"problem":[101],"presented.":[103],"This":[104],"can":[105,123],"used":[107],"determine":[109],"optimal":[111],"size":[112],"partitions.":[114],"new":[116],"information":[117],"compression":[118],"scheme":[119],"presented":[121],"which":[122],"significantly":[124],"enhance":[125],"resolution.":[126]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}