{"id":"https://openalex.org/W4232493124","doi":"https://doi.org/10.1155/1993/26728","title":"Guest Editorial","display_name":"Guest Editorial","publication_year":1993,"publication_date":"1993-01-01","ids":{"openalex":"https://openalex.org/W4232493124","doi":"https://doi.org/10.1155/1993/26728"},"language":"en","primary_location":{"id":"doi:10.1155/1993/26728","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1993/26728","pdf_url":"https://downloads.hindawi.com/archive/1993/026728.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://downloads.hindawi.com/archive/1993/026728.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112765059","display_name":"Sunil Das","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Sunil R. Das","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5112765059"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.44489559,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.906499981880188,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.906499981880188,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.01119999960064888,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.005100000184029341,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4518324136734009}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4518324136734009}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1155/1993/26728","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1993/26728","pdf_url":"https://downloads.hindawi.com/archive/1993/026728.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1155/1993/26728","is_oa":true,"landing_page_url":"https://doi.org/10.1155/1993/26728","pdf_url":"https://downloads.hindawi.com/archive/1993/026728.pdf","source":{"id":"https://openalex.org/S81291924","display_name":"VLSI design","issn_l":"1026-7123","issn":["1026-7123","1065-514X","1563-5171"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319869","host_organization_name":"Hindawi Publishing Corporation","host_organization_lineage":["https://openalex.org/P4310319869"],"host_organization_lineage_names":["Hindawi Publishing Corporation"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4232493124.pdf","grobid_xml":"https://content.openalex.org/works/W4232493124.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2130043461","https://openalex.org/W2530322880"],"abstract_inverted_index":{"ith":[0],"advances":[1],"in":[2,34,75],"the":[3,10,19,35,44,59,66,73],"technology":[4],"of":[5,12,21,37,58,72],"electronic":[6],"digital":[7],"circuits":[8],"through":[9],"introduction":[11],"very":[13],"large":[14],"scale":[15],"integrated":[16],"(VLSI)":[17],"circuits,":[18],"problem":[20],"fault":[22,24],"detection,":[23],"analysis,":[25],"and":[26,69],"test":[27],"generation":[28],"has":[29],"become":[30],"a":[31,62],"prime":[32],"issue":[33],"domain":[36],"VLSI":[38,53],"design.":[39],"The":[40],"overwhelming":[41],"response":[42],"to":[43,65],"Call":[45],"For":[46],"Papers":[47],"for":[48],"this":[49,76],"Special":[50],"Issue":[51],"on":[52],"Testing":[54],"from":[55],"various":[56],"parts":[57],"world":[60],"is":[61],"brilliant":[63],"testimony":[64],"profound":[67],"interest":[68],"ever-increasing":[70],"activities":[71],"researchers":[74],"important":[77],"discipline.":[78]},"counts_by_year":[],"updated_date":"2026-03-03T08:47:05.690250","created_date":"2022-05-12T00:00:00"}