{"id":"https://openalex.org/W2155214620","doi":"https://doi.org/10.1147/rd.414.0515","title":"Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors","display_name":"Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors","publication_year":1997,"publication_date":"1997-07-01","ids":{"openalex":"https://openalex.org/W2155214620","doi":"https://doi.org/10.1147/rd.414.0515","mag":"2155214620"},"language":"en","primary_location":{"id":"doi:10.1147/rd.414.0515","is_oa":false,"landing_page_url":"https://doi.org/10.1147/rd.414.0515","pdf_url":null,"source":{"id":"https://openalex.org/S4210219925","display_name":"IBM Journal of Research and Development","issn_l":"0018-8646","issn":["0018-8646","2151-8556"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320652","host_organization_name":"IBM","host_organization_lineage":["https://openalex.org/P4310320652"],"host_organization_lineage_names":["IBM"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IBM Journal of Research and Development","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002706979","display_name":"Kenneth L. Shepard","orcid":"https://orcid.org/0000-0003-0665-6775"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"K. L. Shepard","raw_affiliation_strings":["IBM Research Division, IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Research Division, IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059769555","display_name":"Se\u00e1n Carey","orcid":"https://orcid.org/0000-0003-2697-9694"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. M. Carey","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111088957","display_name":"E. K. Cho","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. K. Cho","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080337591","display_name":"Brian Curran","orcid":"https://orcid.org/0000-0001-6189-7016"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"B. W. Curran","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062482907","display_name":"R. F. Hatch","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. F. Hatch","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077076596","display_name":"D. E. Hoffman","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. E. Hoffman","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028910568","display_name":"S. A. McCabe","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. A. McCabe","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030741704","display_name":"G. A. Northrop","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. A. Northrop","raw_affiliation_strings":["IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA"],"affiliations":[{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082814686","display_name":"R. Seigler","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"R. Seigler","raw_affiliation_strings":["System/390 Division, IBM, Poughkeepsie, NY, USA"],"affiliations":[{"raw_affiliation_string":"System/390 Division, IBM, Poughkeepsie, NY, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5002706979"],"corresponding_institution_ids":["https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":10.0946,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.98695759,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"41","issue":"4.5","first_page":"515","last_page":"547"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.7355412840843201},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6526027917861938},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5839313268661499},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5428131222724915},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.4833678603172302},{"id":"https://openalex.org/keywords/design-methods","display_name":"Design methods","score":0.45656073093414307},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4315968155860901},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.42487940192222595},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3316571116447449},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20504146814346313},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.12714830040931702}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.7355412840843201},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6526027917861938},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5839313268661499},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5428131222724915},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.4833678603172302},{"id":"https://openalex.org/C138852830","wikidata":"https://www.wikidata.org/wiki/Q2292993","display_name":"Design methods","level":2,"score":0.45656073093414307},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4315968155860901},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.42487940192222595},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3316571116447449},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20504146814346313},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.12714830040931702},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1147/rd.414.0515","is_oa":false,"landing_page_url":"https://doi.org/10.1147/rd.414.0515","pdf_url":null,"source":{"id":"https://openalex.org/S4210219925","display_name":"IBM Journal of Research and Development","issn_l":"0018-8646","issn":["0018-8646","2151-8556"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320652","host_organization_name":"IBM","host_organization_lineage":["https://openalex.org/P4310320652"],"host_organization_lineage_names":["IBM"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IBM Journal of Research and Development","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1817545098","https://openalex.org/W1947290622","https://openalex.org/W1984547399","https://openalex.org/W1986598762","https://openalex.org/W1994126939","https://openalex.org/W1998053565","https://openalex.org/W2012336463","https://openalex.org/W2013815172","https://openalex.org/W2035076177","https://openalex.org/W2060658721","https://openalex.org/W2064169027","https://openalex.org/W2074193689","https://openalex.org/W2080267935","https://openalex.org/W2096466247","https://openalex.org/W2102056218","https://openalex.org/W2102463881","https://openalex.org/W2112242460","https://openalex.org/W2115285859","https://openalex.org/W2115397206","https://openalex.org/W2119353548","https://openalex.org/W2131168529","https://openalex.org/W2131337789","https://openalex.org/W2134152592","https://openalex.org/W2136310485","https://openalex.org/W2136761163","https://openalex.org/W2136907476","https://openalex.org/W2142463909","https://openalex.org/W2142868932","https://openalex.org/W2145458600","https://openalex.org/W2147406633","https://openalex.org/W2152098049","https://openalex.org/W2153274745","https://openalex.org/W2163626738","https://openalex.org/W2164011120","https://openalex.org/W2166594395","https://openalex.org/W2166792218","https://openalex.org/W2167094252"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W4249526199","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811","https://openalex.org/W2164349885"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"the":[3,8,11,35,47],"design":[4,9,21,41,52,55],"methodology":[5],"employed":[6],"in":[7],"of":[10,19,23,37,45,49],"S/390\u00ae":[12],"Parallel":[13],"Enterprise":[14],"Server":[15],"G4":[16],"microprocessors.":[17],"Issues":[18],"verifying":[20],"metrics":[22],"area,":[24],"power,":[25],"noise,":[26],"timing,":[27],"testability,":[28],"and":[29,53],"functional":[30],"correctness":[31],"are":[32,57],"discussed":[33],"within":[34],"context":[36],"a":[38,50],"transistor-level":[39],"custom":[40],"approach.":[42],"Practical":[43],"issues":[44],"managing":[46],"complexity":[48],"7.8-million-transistor":[51],"encouraging":[54],"productivity":[56],"introduced.":[58]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}