{"id":"https://openalex.org/W2112942664","doi":"https://doi.org/10.1145/347324.348926","title":"Comparison of delivered reliability of branch, data flow and operational testing","display_name":"Comparison of delivered reliability of branch, data flow and operational testing","publication_year":2000,"publication_date":"2000-08-01","ids":{"openalex":"https://openalex.org/W2112942664","doi":"https://doi.org/10.1145/347324.348926","mag":"2112942664"},"language":"en","primary_location":{"id":"doi:10.1145/347324.348926","is_oa":false,"landing_page_url":"https://doi.org/10.1145/347324.348926","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075123297","display_name":"Phyllis G. Frankl","orcid":null},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Phyllis G. Frankl","raw_affiliation_strings":["Polytechnic Univ., Brooklyn, NY","Polytechnic University, Brooklyn, NY,#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic Univ., Brooklyn, NY","institution_ids":[]},{"raw_affiliation_string":"Polytechnic University, Brooklyn, NY,#TAB#","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060932650","display_name":"Yuetang Deng","orcid":"https://orcid.org/0009-0003-7060-4109"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuetang Deng","raw_affiliation_strings":["Polytechnic Univ., Brooklyn, NY","Polytechnic University, Brooklyn, NY,#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnic Univ., Brooklyn, NY","institution_ids":[]},{"raw_affiliation_string":"Polytechnic University, Brooklyn, NY,#TAB#","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I57206974"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.19668737,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"124","last_page":"134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7669253349304199},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7280056476593018},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6802159547805786},{"id":"https://openalex.org/keywords/non-regression-testing","display_name":"Non-regression testing","score":0.6773921251296997},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6316974759101868},{"id":"https://openalex.org/keywords/software-performance-testing","display_name":"Software performance testing","score":0.5671578645706177},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5235443115234375},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5063446760177612},{"id":"https://openalex.org/keywords/keyword-driven-testing","display_name":"Keyword-driven testing","score":0.4843110144138336},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.45236796140670776},{"id":"https://openalex.org/keywords/risk-based-testing","display_name":"Risk-based testing","score":0.44967395067214966},{"id":"https://openalex.org/keywords/orthogonal-array-testing","display_name":"Orthogonal array testing","score":0.4380413591861725},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.43186846375465393},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.42855262756347656},{"id":"https://openalex.org/keywords/manual-testing","display_name":"Manual testing","score":0.427593469619751},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.4161004424095154},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.26137232780456543},{"id":"https://openalex.org/keywords/software-system","display_name":"Software system","score":0.18256309628486633},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16019466519355774},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.14815813302993774},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.10960164666175842}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7669253349304199},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7280056476593018},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6802159547805786},{"id":"https://openalex.org/C86469151","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Non-regression testing","level":5,"score":0.6773921251296997},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6316974759101868},{"id":"https://openalex.org/C178059732","wikidata":"https://www.wikidata.org/wiki/Q1982529","display_name":"Software performance testing","level":5,"score":0.5671578645706177},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5235443115234375},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5063446760177612},{"id":"https://openalex.org/C169168650","wikidata":"https://www.wikidata.org/wiki/Q1675637","display_name":"Keyword-driven testing","level":5,"score":0.4843110144138336},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.45236796140670776},{"id":"https://openalex.org/C37945671","wikidata":"https://www.wikidata.org/wiki/Q7336207","display_name":"Risk-based testing","level":5,"score":0.44967395067214966},{"id":"https://openalex.org/C158324730","wikidata":"https://www.wikidata.org/wiki/Q54862604","display_name":"Orthogonal array testing","level":5,"score":0.4380413591861725},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.43186846375465393},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.42855262756347656},{"id":"https://openalex.org/C182122060","wikidata":"https://www.wikidata.org/wiki/Q6752328","display_name":"Manual testing","level":5,"score":0.427593469619751},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.4161004424095154},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.26137232780456543},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.18256309628486633},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16019466519355774},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.14815813302993774},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.10960164666175842},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/347324.348926","is_oa":false,"landing_page_url":"https://doi.org/10.1145/347324.348926","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1963924029","https://openalex.org/W1964298660","https://openalex.org/W1980818933","https://openalex.org/W1985551847","https://openalex.org/W1996517887","https://openalex.org/W1996596150","https://openalex.org/W1996701120","https://openalex.org/W2028536280","https://openalex.org/W2038710499","https://openalex.org/W2053003592","https://openalex.org/W2071112258","https://openalex.org/W2097331548","https://openalex.org/W2111038766","https://openalex.org/W2119805979","https://openalex.org/W2121669067","https://openalex.org/W2124300773","https://openalex.org/W2125539770","https://openalex.org/W2134691366","https://openalex.org/W2167817931"],"related_works":["https://openalex.org/W2362944210","https://openalex.org/W4235263786","https://openalex.org/W3214776400","https://openalex.org/W2767512594","https://openalex.org/W17857273","https://openalex.org/W2376559135","https://openalex.org/W2886756146","https://openalex.org/W2186644673","https://openalex.org/W2952740084","https://openalex.org/W2183799055"],"abstract_inverted_index":{"Many":[0],"analytical":[1],"and":[2,67,102,143,160],"empirical":[3],"studies":[4],"of":[5,25,38,55,62,88,118],"software":[6,80],"testing":[7,33,39,56,120,133,141],"effectiveness":[8,90],"have":[9],"used":[10],"the":[11,23,36,45,53,60,63,79,83,86,137],"probability":[12],"that":[13,44,71,96,104,123],"a":[14,116,150],"test":[15,89],"set":[16],"exposes":[17],"at":[18],"least":[19],"one":[20],"fault":[21],"as":[22,115],"measure":[24,28,87],"effectiveness.":[26],"That":[27],"is":[29,40,47,57,81,149],"useful":[30],"for":[31],"evaluating":[32],"techniques":[34,121],"when":[35,78],"goal":[37,54],"to":[41,58,75,99,107],"gain":[42],"confidence":[43],"program":[46,64,148],"free":[48],"from":[49],"faults.":[50,164],"However,":[51],"if":[52],"improve":[59],"reliability":[61,111,129],"(by":[65],"discovering":[66],"removing":[68],"those":[69,94,103],"faults":[70,95],"are":[72,97,105],"most":[73],"likely":[74,98],"cause":[76,100],"failures":[77,101],"in":[82,122],"field)":[84],"then":[85],"must":[91],"distinguish":[92],"between":[93],"unlikely":[106],"do":[108],"so.":[109],"Delivered":[110],"was":[112],"previously":[113],"introduced":[114],"means":[117],"comparing":[119],"setting.":[124],"This":[125],"paper":[126],"empirically":[127],"compares":[128],"delivered":[130],"by":[131,157],"three":[132],"techniques,":[134],"branch":[135],"testing,":[136],"all-uses":[138],"data":[139],"flow":[140],"criterion,":[142],"operational":[144],"testing.":[145],"The":[146],"subject":[147],"moderate-sized":[151],"C-program":[152],"(about":[153],"10,000":[154],"LOC)":[155],"produced":[156],"professional":[158],"programmers":[159],"containing":[161],"naturally":[162],"occurring":[163]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}