{"id":"https://openalex.org/W3160329937","doi":"https://doi.org/10.1145/3448734.3450857","title":"Research on Fault Location Method of Distribution Network Based on Fault Indicator System","display_name":"Research on Fault Location Method of Distribution Network Based on Fault Indicator System","publication_year":2021,"publication_date":"2021-01-28","ids":{"openalex":"https://openalex.org/W3160329937","doi":"https://doi.org/10.1145/3448734.3450857","mag":"3160329937"},"language":"en","primary_location":{"id":"doi:10.1145/3448734.3450857","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3448734.3450857","pdf_url":null,"source":{"id":"https://openalex.org/S4306531993","display_name":"The 2nd International Conference on Computing and Data Science","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The 2nd International Conference on Computing and Data Science","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101531225","display_name":"Ye Wei","orcid":"https://orcid.org/0000-0001-5700-9071"},"institutions":[{"id":"https://openalex.org/I17442442","display_name":"State Grid Corporation of China (China)","ror":"https://ror.org/05twwhs70","country_code":"CN","type":"company","lineage":["https://openalex.org/I17442442"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Ye","raw_affiliation_strings":["State Grid Zhejiang Electric Power Corporation Information & Telecommunication Branch"],"affiliations":[{"raw_affiliation_string":"State Grid Zhejiang Electric Power Corporation Information & Telecommunication Branch","institution_ids":["https://openalex.org/I17442442"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048499969","display_name":"Guoyu Cui","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Guoyu Cui","raw_affiliation_strings":["Beijing Smart Chip Micro Electronics Technology Company Limited"],"affiliations":[{"raw_affiliation_string":"Beijing Smart Chip Micro Electronics Technology Company Limited","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100359050","display_name":"Tong Li","orcid":"https://orcid.org/0000-0003-1735-9055"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tong Li","raw_affiliation_strings":["State Grid Jilin Electric Power Company"],"affiliations":[{"raw_affiliation_string":"State Grid Jilin Electric Power Company","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100445456","display_name":"Dawei Wang","orcid":"https://orcid.org/0000-0003-1064-3715"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dawei Wang","raw_affiliation_strings":["Beijing Smart Chip Micro Electronics Technology Company Limited"],"affiliations":[{"raw_affiliation_string":"Beijing Smart Chip Micro Electronics Technology Company Limited","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108745654","display_name":"Jianzhong Peng","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jianzhong Peng","raw_affiliation_strings":["Jiangsu Linyang Energy Co Ltd"],"affiliations":[{"raw_affiliation_string":"Jiangsu Linyang Energy Co Ltd","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101531225"],"corresponding_institution_ids":["https://openalex.org/I17442442"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03960857,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9750000238418579,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9750000238418579,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9426000118255615,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14276","display_name":"Power Systems and Technologies","score":0.9352999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7636251449584961},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.6950817704200745},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6207572221755981},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5716925859451294},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5356758236885071},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5119251012802124},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.4590410888195038},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4413433372974396},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4316178858280182},{"id":"https://openalex.org/keywords/process-automation-system","display_name":"Process automation system","score":0.43138909339904785},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4213595390319824},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.41542771458625793},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38063013553619385},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3283931314945221},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12451928853988647}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7636251449584961},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.6950817704200745},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6207572221755981},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5716925859451294},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5356758236885071},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5119251012802124},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.4590410888195038},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4413433372974396},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4316178858280182},{"id":"https://openalex.org/C21457203","wikidata":"https://www.wikidata.org/wiki/Q4056293","display_name":"Process automation system","level":3,"score":0.43138909339904785},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4213595390319824},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.41542771458625793},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38063013553619385},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3283931314945221},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12451928853988647},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3448734.3450857","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3448734.3450857","pdf_url":null,"source":{"id":"https://openalex.org/S4306531993","display_name":"The 2nd International Conference on Computing and Data Science","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The 2nd International Conference on Computing and Data Science","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2381742191","https://openalex.org/W2390581407","https://openalex.org/W2384002254","https://openalex.org/W2167610914","https://openalex.org/W2204392445","https://openalex.org/W2365103596","https://openalex.org/W4387011833","https://openalex.org/W4248723619","https://openalex.org/W2380790276","https://openalex.org/W2907978340"],"abstract_inverted_index":{"Distribution":[0],"network":[1,12,18,67,95,119,142],"automation":[2,10],"is":[3,78],"a":[4,114,151],"combination":[5],"of":[6,16,41,60,64,72,83,139],"modern":[7],"communication,":[8],"computer,":[9],"and":[11,22,36,45,47,68,144],"technology,":[13],"real-time":[14],"monitoring":[15],"distribution":[17,43,66,94,118,141],"equipment":[19],"from":[20],"afar,":[21],"advanced":[23],"grid":[24,29],"management":[25],"technology":[26,33],"to":[27],"optimize":[28],"operation.":[30,76],"Using":[31],"this":[32,111],"can":[34,55,135],"quickly":[35],"accurately":[37],"identify":[38,107],"the":[39,42,49,58,61,65,70,73,80,84,89,92,101,127,145],"fault":[40,96,102,116,121,132],"network,":[44],"isolate":[46],"restore":[48],"power":[50,74,85,140],"supply":[51],"in":[52],"time,":[53],"which":[54,124],"greatly":[56],"reduce":[57],"time":[59],"line":[62],"failure":[63],"enhance":[69],"reliability":[71],"system":[75,104,134],"This":[77],"also":[79],"future":[81],"development":[82],"system.":[86],"Aiming":[87],"at":[88],"problem":[90],"that":[91],"previous":[93],"location":[97,122],"methods":[98],"based":[99],"on":[100],"indicator":[103,117,133],"cannot":[105],"effectively":[106],"single-phase":[108],"grounding":[109],"faults,":[110,143],"paper":[112],"adopts":[113],"digital":[115],"intelligent":[120],"system,":[123],"mainly":[125],"applies":[126],"signal":[128],"injection":[129],"method":[130],"The":[131],"reflect":[136],"various":[137],"types":[138],"application":[146],"cases":[147],"are":[148],"cited":[149],"for":[150],"comprehensive":[152],"analysis.":[153]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}