{"id":"https://openalex.org/W2036088742","doi":"https://doi.org/10.1145/2483028.2483064","title":"Efficient characterization of TSV-to-transistor noise coupling in 3D ICs","display_name":"Efficient characterization of TSV-to-transistor noise coupling in 3D ICs","publication_year":2013,"publication_date":"2013-05-02","ids":{"openalex":"https://openalex.org/W2036088742","doi":"https://doi.org/10.1145/2483028.2483064","mag":"2036088742"},"language":"en","primary_location":{"id":"doi:10.1145/2483028.2483064","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2483028.2483064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008029821","display_name":"Hailang Wang","orcid":"https://orcid.org/0009-0007-1481-2295"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hailang Wang","raw_affiliation_strings":["Stony Brook University, Stony Brook, NY, USA"],"affiliations":[{"raw_affiliation_string":"Stony Brook University, Stony Brook, NY, USA","institution_ids":["https://openalex.org/I59553526"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028973960","display_name":"Mohammad H. Asgari","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad H. Asgari","raw_affiliation_strings":["Columbia University, New York, NY, USA"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061262597","display_name":"Emre Salman","orcid":"https://orcid.org/0000-0001-6538-6803"},"institutions":[{"id":"https://openalex.org/I59553526","display_name":"Stony Brook University","ror":"https://ror.org/05qghxh33","country_code":"US","type":"education","lineage":["https://openalex.org/I59553526"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Emre Salman","raw_affiliation_strings":["Stony Brook University, Stony Brook, NY, USA"],"affiliations":[{"raw_affiliation_string":"Stony Brook University, Stony Brook, NY, USA","institution_ids":["https://openalex.org/I59553526"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5008029821"],"corresponding_institution_ids":["https://openalex.org/I59553526"],"apc_list":null,"apc_paid":null,"fwci":0.7094,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74426466,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"71","last_page":"76"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/admittance-parameters","display_name":"Admittance parameters","score":0.708686113357544},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6452022194862366},{"id":"https://openalex.org/keywords/admittance","display_name":"Admittance","score":0.6068463921546936},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.6051121950149536},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.595303475856781},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5047143697738647},{"id":"https://openalex.org/keywords/logarithm","display_name":"Logarithm","score":0.48220884799957275},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4809543490409851},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.4729083478450775},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4615056812763214},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.457777202129364},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4145902991294861},{"id":"https://openalex.org/keywords/substrate-coupling","display_name":"Substrate coupling","score":0.4142621159553528},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.340938925743103},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33142101764678955},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22282695770263672},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2184620499610901},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.211149662733078},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15811681747436523},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.1269966959953308},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.12151890993118286},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12058407068252563},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.07481426000595093},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.07329195737838745}],"concepts":[{"id":"https://openalex.org/C133833761","wikidata":"https://www.wikidata.org/wiki/Q16001847","display_name":"Admittance parameters","level":3,"score":0.708686113357544},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6452022194862366},{"id":"https://openalex.org/C108811297","wikidata":"https://www.wikidata.org/wiki/Q214518","display_name":"Admittance","level":3,"score":0.6068463921546936},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.6051121950149536},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.595303475856781},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5047143697738647},{"id":"https://openalex.org/C39927690","wikidata":"https://www.wikidata.org/wiki/Q11197","display_name":"Logarithm","level":2,"score":0.48220884799957275},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4809543490409851},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.4729083478450775},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4615056812763214},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.457777202129364},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4145902991294861},{"id":"https://openalex.org/C51674796","wikidata":"https://www.wikidata.org/wiki/Q7632167","display_name":"Substrate coupling","level":4,"score":0.4142621159553528},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.340938925743103},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33142101764678955},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22282695770263672},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2184620499610901},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.211149662733078},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15811681747436523},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.1269966959953308},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.12151890993118286},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12058407068252563},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.07481426000595093},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.07329195737838745},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/2483028.2483064","is_oa":false,"landing_page_url":"https://doi.org/10.1145/2483028.2483064","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W601886942","https://openalex.org/W2055070256","https://openalex.org/W2085945635","https://openalex.org/W2100776929","https://openalex.org/W2109314689","https://openalex.org/W2109622694","https://openalex.org/W2129785295","https://openalex.org/W2132686275","https://openalex.org/W2161803106","https://openalex.org/W2167539582","https://openalex.org/W2544180415","https://openalex.org/W6664227968"],"related_works":["https://openalex.org/W2563111511","https://openalex.org/W2913402129","https://openalex.org/W2161728531","https://openalex.org/W2044195815","https://openalex.org/W2541620444","https://openalex.org/W2057151759","https://openalex.org/W2368309484","https://openalex.org/W2066729819","https://openalex.org/W2460740512","https://openalex.org/W2024162929"],"abstract_inverted_index":{"A":[0,41],"methodology":[1,74],"is":[2,45,63,75],"proposed":[3,46],"to":[4,47,99],"characterize":[5],"TSV":[6,31,102,113],"induced":[7,103],"noise":[8,52,104],"coupling":[9,51],"in":[10],"three-dimensional":[11],"(3D)":[12],"integrated":[13],"circuits.":[14],"Different":[15],"substrate":[16,23,28,118],"biasing":[17],"schemes":[18],"(such":[19,34],"as":[20,35,105,112],"a":[21,54,66,78,106],"single":[22],"contact":[24],"versus":[25],"regularly":[26],"placed":[27],"contacts)":[29],"and":[30,37,93,115],"fabrication":[32],"methods":[33],"via-first":[36],"via-last)":[38],"are":[39,97],"considered.":[40],"compact":[42,61,91],"\u03c0":[43],"model":[44,62,92],"efficiently":[48],"estimate":[49],"the":[50,60,94],"at":[53],"victim":[55],"transistor.":[56],"Each":[57],"admittance":[58],"within":[59],"approximated":[64],"with":[65],"closed-form":[67,95],"expression":[68],"consisting":[69],"of":[70,108,117],"logarithmic":[71],"functions.":[72],"The":[73,90],"validated":[76],"using":[77],"3D":[79],"transmission":[80],"line":[81],"matrix":[82],"(3D-TLM)":[83],"method,":[84],"demonstrating,":[85],"on":[86],"average,":[87],"4.8%":[88],"error.":[89],"expressions":[96],"utilized":[98],"better":[100],"understand":[101],"function":[107],"multiple":[109],"parameters":[110],"such":[111],"type":[114],"placement":[116],"contacts.":[119]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}