{"id":"https://openalex.org/W2113127353","doi":"https://doi.org/10.1145/1629911.1630043","title":"Improving testability and soft-error resilience through retiming","display_name":"Improving testability and soft-error resilience through retiming","publication_year":2009,"publication_date":"2009-07-26","ids":{"openalex":"https://openalex.org/W2113127353","doi":"https://doi.org/10.1145/1629911.1630043","mag":"2113127353"},"language":"en","primary_location":{"id":"doi:10.1145/1629911.1630043","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1629911.1630043","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual Design Automation Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045475274","display_name":"Smita Krishnaswamy","orcid":"https://orcid.org/0000-0001-5823-1985"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Smita Krishnaswamy","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Heights, NY","IBM T.J. Watson Research Center, Rt. 134, Yorktown Heights, NY 10598, USA"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Heights, NY","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Rt. 134, Yorktown Heights, NY 10598, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065370018","display_name":"Igor L. Markov","orcid":"https://orcid.org/0000-0002-3826-527X"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Igor L. Markov","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI","University of Michigan, EECS Department, Ann Arbor, 41809, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"University of Michigan, EECS Department, Ann Arbor, 41809, USA","institution_ids":["https://openalex.org/I27837315"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101995490","display_name":"John P. Hayes","orcid":"https://orcid.org/0000-0002-4747-492X"},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John P. Hayes","raw_affiliation_strings":["University of Michigan, Ann Arbor, MI","University of Michigan, EECS Department, Ann Arbor, 41809, USA"],"affiliations":[{"raw_affiliation_string":"University of Michigan, Ann Arbor, MI","institution_ids":["https://openalex.org/I27837315"]},{"raw_affiliation_string":"University of Michigan, EECS Department, Ann Arbor, 41809, USA","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5045475274"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":1.072,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.78570752,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"508","last_page":"513"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/retiming","display_name":"Retiming","score":0.9576591849327087},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.8702394962310791},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.6964385509490967},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.5861455798149109},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5835487246513367},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5513371229171753},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.4826224744319916},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4118087887763977},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.37495607137680054},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2561977803707123},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21563482284545898}],"concepts":[{"id":"https://openalex.org/C41112130","wikidata":"https://www.wikidata.org/wiki/Q2146175","display_name":"Retiming","level":2,"score":0.9576591849327087},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.8702394962310791},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.6964385509490967},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.5861455798149109},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5835487246513367},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5513371229171753},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.4826224744319916},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4118087887763977},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37495607137680054},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2561977803707123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21563482284545898},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1629911.1630043","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1629911.1630043","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 46th Annual Design Automation Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.217.3298","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.217.3298","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.eecs.umich.edu/~imarkov/pubs/conf/dac09-retime.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2178033679","display_name":null,"funder_award_id":"FA8750-05-1-0282","funder_id":"https://openalex.org/F4320338294","funder_display_name":"Air Force Research Laboratory"}],"funders":[{"id":"https://openalex.org/F4320338294","display_name":"Air Force Research Laboratory","ror":"https://ror.org/02e2egq70"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1541483005","https://openalex.org/W1870528983","https://openalex.org/W1999638666","https://openalex.org/W2028027538","https://openalex.org/W2050431855","https://openalex.org/W2054867164","https://openalex.org/W2087656024","https://openalex.org/W2096198922","https://openalex.org/W2104402818","https://openalex.org/W2108918590","https://openalex.org/W2117648153","https://openalex.org/W2124869915","https://openalex.org/W2126468650","https://openalex.org/W2134540026","https://openalex.org/W2144384460","https://openalex.org/W2160410291","https://openalex.org/W2161033118","https://openalex.org/W2162318113","https://openalex.org/W2169213530","https://openalex.org/W2171078653","https://openalex.org/W6681058566"],"related_works":["https://openalex.org/W2106178922","https://openalex.org/W4250455229","https://openalex.org/W4248668797","https://openalex.org/W2111485030","https://openalex.org/W2144384460","https://openalex.org/W2125651818","https://openalex.org/W2109248381","https://openalex.org/W2168652618","https://openalex.org/W2127247647","https://openalex.org/W2166402441"],"abstract_inverted_index":{"State":[0],"elements":[1],"are":[2],"increasingly":[3],"vulnerable":[4],"to":[5,9,42,53,79,83,102,118,124],"soft":[6],"errors":[7,18],"due":[8,52],"their":[10,72],"decreasing":[11,106],"size,":[12],"and":[13,45,71,77,109,146],"the":[14,33,48,54,62,66,81,142],"fact":[15],"that":[16,94],"latched":[17],"cannot":[19],"be":[20,80],"completely":[21],"eliminated":[22],"by":[23],"electrical":[24],"or":[25],"timing":[26],"masking.":[27],"Most":[28],"prior":[29],"methods":[30],"of":[31,56,68,139,144,150],"reducing":[32],"soft-error":[34],"rate":[35],"(SER)":[36],"involve":[37],"combinational":[38,111],"redesign,":[39],"which":[40,134],"tends":[41],"add":[43],"area":[44],"decrease":[46,138],"testability,":[47],"latter":[49],"a":[50],"concern":[51],"prevalence":[55],"manufacturing":[57],"defects.":[58],"Our":[59,88],"work":[60],"explores":[61],"fundamental":[63],"relations":[64],"between":[65],"SER":[67,143],"sequential":[69],"circuits":[70],"testability":[73],"in":[74,141],"scan":[75],"mode,":[76],"appears":[78],"first":[82],"improve":[84],"both":[85],"through":[86],"retiming.":[87],"retiming":[89],"methodology":[90],"relocates":[91],"registers":[92,96,119],"so":[93],"1)":[95],"become":[97,113],"less":[98],"observable":[99,115],"with":[100,116,122],"respect":[101,117,123],"primary":[103,125],"outputs,":[104],"thereby":[105,127],"overall":[107],"SER,":[108],"2)":[110],"nodes":[112],"more":[114],"(but":[120],"not":[121],"outputs),":[126],"increasing":[128],"scan-testability.":[129],"We":[130],"present":[131],"experimental":[132],"results":[133],"show":[135],"an":[136,147],"average":[137,148],"42%":[140],"latches,":[145],"improvement":[149],"31%":[151],"random-pattern":[152],"testability.":[153]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}