{"id":"https://openalex.org/W1971605693","doi":"https://doi.org/10.1145/1499310.1499364","title":"Guidance for test selection based on the cost of errors","display_name":"Guidance for test selection based on the cost of errors","publication_year":1984,"publication_date":"1984-01-01","ids":{"openalex":"https://openalex.org/W1971605693","doi":"https://doi.org/10.1145/1499310.1499364","mag":"1971605693"},"language":"en","primary_location":{"id":"doi:10.1145/1499310.1499364","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1499310.1499364","pdf_url":null,"source":{"id":"https://openalex.org/S4210208138","display_name":"AFIPS conference proceedings","issn_l":"0095-6880","issn":["0095-6880"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the July 9-12, 1984, national computer conference and exposition on - AFIPS '84","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109911038","display_name":"David A. Gustafson","orcid":null},"institutions":[{"id":"https://openalex.org/I189590672","display_name":"Kansas State University","ror":"https://ror.org/05p1j8758","country_code":"US","type":"education","lineage":["https://openalex.org/I189590672"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"David A. Gustafson","raw_affiliation_strings":["Kansas State University, Manhattan Kansas#TAB#"],"affiliations":[{"raw_affiliation_string":"Kansas State University, Manhattan Kansas#TAB#","institution_ids":["https://openalex.org/I189590672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5109911038"],"corresponding_institution_ids":["https://openalex.org/I189590672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.22727273,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"423","last_page":"423"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6973352432250977},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6051379442214966},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4993133544921875},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4951530992984772},{"id":"https://openalex.org/keywords/control-flow-graph","display_name":"Control flow graph","score":0.4786897301673889},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4765351712703705},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.4657260775566101},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.44827720522880554},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.43256521224975586},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3296172022819519},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.31978297233581543},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.16909533739089966},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.16264238953590393},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.15278038382530212},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1478751301765442}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6973352432250977},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6051379442214966},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4993133544921875},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4951530992984772},{"id":"https://openalex.org/C27458966","wikidata":"https://www.wikidata.org/wiki/Q1187693","display_name":"Control flow graph","level":2,"score":0.4786897301673889},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4765351712703705},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4657260775566101},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.44827720522880554},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.43256521224975586},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3296172022819519},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.31978297233581543},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.16909533739089966},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.16264238953590393},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.15278038382530212},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1478751301765442},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/1499310.1499364","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1499310.1499364","pdf_url":null,"source":{"id":"https://openalex.org/S4210208138","display_name":"AFIPS conference proceedings","issn_l":"0095-6880","issn":["0095-6880"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the July 9-12, 1984, national computer conference and exposition on - AFIPS '84","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2006159725","https://openalex.org/W2009338371","https://openalex.org/W2082006924","https://openalex.org/W2132840411","https://openalex.org/W2149614712","https://openalex.org/W2171955286"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W4226182203","https://openalex.org/W4238386252","https://openalex.org/W234065253","https://openalex.org/W3185885951","https://openalex.org/W111546663","https://openalex.org/W2047750899","https://openalex.org/W1966392103","https://openalex.org/W3088925126","https://openalex.org/W3144822727"],"abstract_inverted_index":{"A":[0],"continual":[1],"problem":[2],"in":[3,14,36,43,74],"the":[4,29,33,52,71,75],"area":[5],"of":[6,32,87],"software":[7,38,45,76],"testing":[8,18],"is":[9],"deciding":[10],"if":[11],"and":[12],"where":[13],"a":[15,37,44,63,67],"program":[16],"additional":[17,88],"should":[19],"be":[20,48,82],"done.":[21],"Recent":[22],"work":[23],"by":[24,61],"Cheung":[25],"has":[26],"indicated":[27],"that":[28],"relative":[30],"reliability":[31],"individual":[34,72],"nodes":[35,73],"flow":[39,77],"graph,":[40],"or":[41],"modules":[42],"structure,":[46],"can":[47,81],"used":[49,83],"to":[50,57,70,84],"guide":[51,85],"testing.":[53],"This":[54,79],"paper":[55],"attempts":[56],"aid":[58],"this":[59],"process":[60],"suggesting":[62],"method":[64],"for":[65],"assigning":[66],"cost":[68,80],"factor":[69],"graph.":[78],"selection":[86],"tests.":[89]},"counts_by_year":[{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}