{"id":"https://openalex.org/W7128523640","doi":"https://doi.org/10.1145/3793551","title":"A Highly Cost-Effective Online Error Detection and Mitigation Scheme for CNN Hardware Accelerators Based on Approximate PE","display_name":"A Highly Cost-Effective Online Error Detection and Mitigation Scheme for CNN Hardware Accelerators Based on Approximate PE","publication_year":2026,"publication_date":"2026-02-10","ids":{"openalex":"https://openalex.org/W7128523640","doi":"https://doi.org/10.1145/3793551"},"language":"en","primary_location":{"id":"doi:10.1145/3793551","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3793551","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054134618","display_name":"Wei-Ji Chao","orcid":"https://orcid.org/0000-0001-9495-2907"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wei-Ji Chao","raw_affiliation_strings":["National Sun Yat-sen University Department of Electrical Engineering"],"raw_orcid":"https://orcid.org/0000-0001-9495-2907","affiliations":[{"raw_affiliation_string":"National Sun Yat-sen University Department of Electrical Engineering","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125526121","display_name":"Yen-Chieh Tseng","orcid":null},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yen-Chieh Tseng","raw_affiliation_strings":["National Sun Yat-sen University Department of Electrical Engineering"],"raw_orcid":"https://orcid.org/0009-0007-9593-8139","affiliations":[{"raw_affiliation_string":"National Sun Yat-sen University Department of Electrical Engineering","institution_ids":["https://openalex.org/I142974352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028476747","display_name":"Tong-Yu Hsieh","orcid":"https://orcid.org/0000-0002-7954-5569"},"institutions":[{"id":"https://openalex.org/I142974352","display_name":"National Sun Yat-sen University","ror":"https://ror.org/00mjawt10","country_code":"TW","type":"education","lineage":["https://openalex.org/I142974352"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tong-Yu Hsieh","raw_affiliation_strings":["National Sun Yat-sen University Institute of Integrated Circuit Design"],"raw_orcid":"https://orcid.org/0000-0002-7954-5569","affiliations":[{"raw_affiliation_string":"National Sun Yat-sen University Institute of Integrated Circuit Design","institution_ids":["https://openalex.org/I142974352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I142974352"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12393212,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"4","first_page":"1","last_page":"34"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7756999731063843,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.7756999731063843,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.05990000069141388,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14347","display_name":"Big Data and Digital Economy","score":0.03420000150799751,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8030999898910522},{"id":"https://openalex.org/keywords/triple-modular-redundancy","display_name":"Triple modular redundancy","score":0.7720999717712402},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6079999804496765},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5846999883651733},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5177000164985657},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.4652000069618225},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.420199990272522},{"id":"https://openalex.org/keywords/approximation-error","display_name":"Approximation error","score":0.39399999380111694}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8705999851226807},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8030999898910522},{"id":"https://openalex.org/C196371267","wikidata":"https://www.wikidata.org/wiki/Q3998979","display_name":"Triple modular redundancy","level":3,"score":0.7720999717712402},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6079999804496765},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5846999883651733},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5177000164985657},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.4652000069618225},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.4578000009059906},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4311999976634979},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.420199990272522},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.39399999380111694},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.3824999928474426},{"id":"https://openalex.org/C13164978","wikidata":"https://www.wikidata.org/wiki/Q600158","display_name":"Hardware acceleration","level":3,"score":0.38019999861717224},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3513000011444092},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.33340001106262207},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.32030001282691956},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.3111000061035156},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.29739999771118164},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.28200000524520874},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.28060001134872437},{"id":"https://openalex.org/C3018824978","wikidata":"https://www.wikidata.org/wiki/Q2894891","display_name":"Error analysis","level":2,"score":0.2791000008583069},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.2736999988555908},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2721000015735626},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.2653999924659729},{"id":"https://openalex.org/C179799912","wikidata":"https://www.wikidata.org/wiki/Q205084","display_name":"Computational complexity theory","level":2,"score":0.2531999945640564}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3793551","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3793551","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2420537388","display_name":null,"funder_award_id":"NSTC 114-2218-E-110-008, NSTC 113-2221-E-110 -040 -MY3, NSTC 114-2634-F-110-001-MBK, NSTC 114-2640- E-110-004","funder_id":"https://openalex.org/F2461203286","funder_display_name":"National Science and Technology Council"}],"funders":[{"id":"https://openalex.org/F2461203286","display_name":"National Science and Technology Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2111013824","https://openalex.org/W2112796928","https://openalex.org/W2289252105","https://openalex.org/W2574407746","https://openalex.org/W2604319603","https://openalex.org/W2618530766","https://openalex.org/W2775429807","https://openalex.org/W2903175372","https://openalex.org/W2990865680","https://openalex.org/W3091745343","https://openalex.org/W3093826489","https://openalex.org/W3130516762","https://openalex.org/W3134434558","https://openalex.org/W4206119771","https://openalex.org/W4226335630","https://openalex.org/W4285282790","https://openalex.org/W7124164995"],"related_works":[],"abstract_inverted_index":{"Recent":[0],"advancements":[1],"in":[2,16,38,51,75,105],"artificial":[3],"intelligence":[4],"have":[5,27],"led":[6],"to":[7],"the":[8,31,108,130,152,166],"widespread":[9],"use":[10,33],"of":[11,34,84,132,155,165,176],"convolutional":[12],"neural":[13],"networks":[14],"(CNNs)":[15],"various":[17],"fields.":[18],"To":[19],"improve":[20],"hardware":[21,24,57],"performance,":[22],"numerous":[23],"accelerator":[25],"circuits":[26],"been":[28],"developed.":[29],"However,":[30],"extensive":[32],"processing":[35],"elements":[36],"(PEs)":[37],"these":[39,94],"accelerators":[40],"raises":[41],"potential":[42,91],"reliability":[43],"concerns.":[44],"Traditional":[45],"modular":[46],"redundancy":[47],"techniques,":[48],"while":[49,172],"effective":[50],"error":[52,71,140,153],"mitigation,":[53],"come":[54],"with":[55,107,169],"substantial":[56],"costs.":[58],"In":[59],"this":[60],"study,":[61],"we":[62,88,136],"introduce":[63],"a":[64,138],"cost-effective":[65],"scheme":[66,78],"designed":[67],"for":[68,93,128],"efficient":[69],"on-line":[70],"detection":[72],"and":[73,97,118,147],"mitigation":[74,141],"CNNs.":[76],"This":[77],"is":[79,126],"based":[80],"on":[81],"innovative":[82],"designs":[83,92,161],"approximate":[85,95,102,159],"PEs.":[86,156],"Specifically,":[87],"propose":[89,137],"two":[90],"PEs":[96],"evaluate":[98],"their":[99],"cost-effectiveness.":[100],"These":[101],"PEs,":[103,110],"used":[104],"conjunction":[106],"original":[109],"form":[111],"an":[112],"Approximate":[113,119],"Dual":[114],"PE":[115,121,133,160],"Redundancy":[116,122],"(ADPR)":[117],"Triple":[120],"(ATPR)":[123],"structure,":[124,149],"which":[125],"essential":[127],"verifying":[129],"quality":[131],"computations.":[134],"Additionally,":[135],"novel":[139],"technique":[142],"derived":[143],"from":[144],"our":[145,158],"ADPR":[146],"ATPR":[148],"significantly":[150],"enhancing":[151],"tolerance":[154],"Notably,":[157],"require":[162],"only":[163],"64%":[164],"area":[167],"compared":[168],"previous":[170],"designs,":[171],"maintaining":[173],"similar":[174],"levels":[175],"approximation":[177],"errors.":[178]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2026-02-11T00:00:00"}