{"id":"https://openalex.org/W7164030990","doi":"https://doi.org/10.1145/3748522.3779737","title":"An Empirical Study on Spectrum Based Fault Localization Heuristics","display_name":"An Empirical Study on Spectrum Based Fault Localization Heuristics","publication_year":2026,"publication_date":"2026-03-23","ids":{"openalex":"https://openalex.org/W7164030990","doi":"https://doi.org/10.1145/3748522.3779737"},"language":null,"primary_location":{"id":"doi:10.1145/3748522.3779737","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3748522.3779737","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st ACM/SIGAPP Symposium on Applied Computing","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1145/3748522.3779737","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5123849975","display_name":"V. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vishal Singh","raw_affiliation_strings":["Computer Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, India"],"raw_orcid":"https://orcid.org/0000-0003-3255-895X","affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062486002","display_name":"Prantik Chatterjee","orcid":"https://orcid.org/0000-0002-3320-9543"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Prantik Chatterjee","raw_affiliation_strings":["Computer Science and Engineering, Indian Institute of Technology Kanpur and MathWorks, Kanpur, India"],"raw_orcid":"https://orcid.org/0000-0002-3320-9543","affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, Indian Institute of Technology Kanpur and MathWorks, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014601092","display_name":"Subhajit Roy","orcid":"https://orcid.org/0000-0002-3394-023X"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Subhajit Roy","raw_affiliation_strings":["Computer Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, India"],"raw_orcid":"https://orcid.org/0000-0002-3394-023X","affiliations":[{"raw_affiliation_string":"Computer Science and Engineering, Indian Institute of Technology Kanpur, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.96158826,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1683","last_page":"1685"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9074000120162964,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9074000120162964,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.04349999874830246,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.024700000882148743,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.6219000220298767},{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.6146000027656555},{"id":"https://openalex.org/keywords/empirical-research","display_name":"Empirical research","score":0.5978999733924866},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5350000262260437},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4779999852180481},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.46860000491142273},{"id":"https://openalex.org/keywords/equivalence","display_name":"Equivalence (formal languages)","score":0.46619999408721924},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3547999858856201}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6725999712944031},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.6219000220298767},{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.6146000027656555},{"id":"https://openalex.org/C120936955","wikidata":"https://www.wikidata.org/wiki/Q2155640","display_name":"Empirical research","level":2,"score":0.5978999733924866},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5350000262260437},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.47940000891685486},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4779999852180481},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.46860000491142273},{"id":"https://openalex.org/C2780069185","wikidata":"https://www.wikidata.org/wiki/Q7977945","display_name":"Equivalence (formal languages)","level":2,"score":0.46619999408721924},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35839998722076416},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3547999858856201},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.33709999918937683},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.33169999718666077},{"id":"https://openalex.org/C1009929","wikidata":"https://www.wikidata.org/wiki/Q179550","display_name":"Software bug","level":3,"score":0.3303000032901764},{"id":"https://openalex.org/C194051981","wikidata":"https://www.wikidata.org/wiki/Q1337691","display_name":"Economic shortage","level":3,"score":0.30889999866485596},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.3059000074863434},{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.2935999929904938},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.29350000619888306},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.2782999873161316},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27799999713897705},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.26510000228881836},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.2606000006198883},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.2587999999523163},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.2558000087738037}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3748522.3779737","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3748522.3779737","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st ACM/SIGAPP Symposium on Applied Computing","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3748522.3779737","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3748522.3779737","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 41st ACM/SIGAPP Symposium on Applied Computing","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2010833880","https://openalex.org/W2036853814","https://openalex.org/W2053060859","https://openalex.org/W2070249305","https://openalex.org/W2343875716","https://openalex.org/W2620081107","https://openalex.org/W2742985481"],"related_works":[],"abstract_inverted_index":{"Spectrum-based":[0],"fault":[1,16,80,88],"localization":[2,17],"(SBFL)":[3],"is":[4,33],"a":[5,55,62,76,92],"simple,":[6],"effective":[7],"and":[8,24,60,99],"scalable":[9],"approach,":[10],"and,":[11,116],"hence,":[12],"bestowed":[13],"with":[14],"multiple":[15],"metrics.":[18,73,112],"Though":[19],"there":[20],"have":[21],"been":[22],"analytical":[23],"empirical":[25,50],"studies,":[26],"the":[27,36,46,49,69],"relative":[28],"effectiveness":[29],"of":[30,58,65,71,94],"these":[31],"metrics":[32,135],"still":[34],"unknown\u2014while":[35],"theoretical":[37],"studies":[38,51,123],"were":[39,52],"made":[40,120],"under":[41,61,124,138],"strong":[42,125],"assumptions":[43],"to":[44,86],"keep":[45],"analysis":[47],"tractable,":[48],"conducted":[53],"on":[54,91],"small":[56],"set":[57,64,93],"programs/faults":[59],"limited":[63],"factors":[66],"that":[67,83,136],"impact":[68],"performance":[70],"SBFL":[72,111,134],"We":[74],"design":[75],"stochastic":[77],"sampler":[78],"for":[79],"spectrums,":[81],"Odin,":[82,105],"allows":[84],"us":[85],"sample":[87],"spectrums":[89],"based":[90],"carefully":[95],"selected":[96],"control":[97],"parameters":[98],"make":[100],"statistically":[101],"significant":[102],"inferences.":[103],"Using":[104],"we":[106,128],"study":[107,114],"37":[108],"most":[109],"popular":[110],"Our":[113],"validate\u2014":[115],"in":[117,121],"fact,":[118],"generalize\u2014inferences":[119],"prior":[122],"assumptions.":[126],"Moreover,":[127],"discover":[129],"novel":[130],"equivalence":[131],"relations":[132],"between":[133],"hold":[137],"all":[139],"experimental":[140],"configurations.":[141]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2026-06-10T00:00:00"}