{"id":"https://openalex.org/W4410125335","doi":"https://doi.org/10.1145/3734796","title":"An Analytical Solution for Transient Electromigration Stress in Multisegment Straight-line Interconnects Based on a Stress-wave Model","display_name":"An Analytical Solution for Transient Electromigration Stress in Multisegment Straight-line Interconnects Based on a Stress-wave Model","publication_year":2025,"publication_date":"2025-05-06","ids":{"openalex":"https://openalex.org/W4410125335","doi":"https://doi.org/10.1145/3734796"},"language":"en","primary_location":{"id":"doi:10.1145/3734796","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3734796","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064836620","display_name":"Mohammad Abdullah Al Shohel","orcid":"https://orcid.org/0000-0001-6845-4306"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]},{"id":"https://openalex.org/I2800403580","display_name":"University of Minnesota System","ror":"https://ror.org/03grvy078","country_code":"US","type":"education","lineage":["https://openalex.org/I2800403580"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Abdullah Al Shohel","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, United States","University of Minnesota,  Minneapolis, United States"],"raw_orcid":"https://orcid.org/0000-0001-6845-4306","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, United States","institution_ids":["https://openalex.org/I130238516"]},{"raw_affiliation_string":"University of Minnesota,  Minneapolis, United States","institution_ids":["https://openalex.org/I2800403580"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069179438","display_name":"Vidya A. Chhabria","orcid":"https://orcid.org/0000-0002-3273-0724"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vidya A. Chhabria","raw_affiliation_strings":["School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, United States"],"raw_orcid":"https://orcid.org/0000-0002-3273-0724","affiliations":[{"raw_affiliation_string":"School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, United States","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008228117","display_name":"Nestor Evmorfopoulos","orcid":"https://orcid.org/0000-0002-6968-0222"},"institutions":[{"id":"https://openalex.org/I145722265","display_name":"University of Thessaly","ror":"https://ror.org/04v4g9h31","country_code":"GR","type":"education","lineage":["https://openalex.org/I145722265"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Nestor Evmorfopoulos","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Thessaly, Volos Greece","University of Thessaly,  Volos, Greece"],"raw_orcid":"https://orcid.org/0000-0002-6968-0222","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Thessaly, Volos Greece","institution_ids":["https://openalex.org/I145722265"]},{"raw_affiliation_string":"University of Thessaly,  Volos, Greece","institution_ids":["https://openalex.org/I145722265"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068714995","display_name":"Sachin S. Sapatnekar","orcid":"https://orcid.org/0000-0002-5353-2364"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]},{"id":"https://openalex.org/I2800403580","display_name":"University of Minnesota System","ror":"https://ror.org/03grvy078","country_code":"US","type":"education","lineage":["https://openalex.org/I2800403580"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sachin S. Sapatnekar","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis United States","Electrical and Computer Engineering, University of Minnesota, Minneapolis, United States"],"raw_orcid":"https://orcid.org/0000-0002-5353-2364","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis United States","institution_ids":["https://openalex.org/I130238516","https://openalex.org/I2800403580"]},{"raw_affiliation_string":"Electrical and Computer Engineering, University of Minnesota, Minneapolis, United States","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4672,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.53153038,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"30","issue":"4","first_page":"1","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.991599977016449,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9513060450553894},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7614555358886719},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6780107617378235},{"id":"https://openalex.org/keywords/stress-wave","display_name":"Stress wave","score":0.6339563727378845},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6079611778259277},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5771753787994385},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5415812134742737},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.4501389265060425},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.33766281604766846},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3133898377418518},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2269442081451416},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1882435381412506},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.18775275349617004}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9513060450553894},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7614555358886719},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6780107617378235},{"id":"https://openalex.org/C2993434580","wikidata":"https://www.wikidata.org/wiki/Q14097093","display_name":"Stress wave","level":2,"score":0.6339563727378845},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6079611778259277},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5771753787994385},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5415812134742737},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.4501389265060425},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.33766281604766846},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3133898377418518},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2269442081451416},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1882435381412506},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.18775275349617004},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3734796","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3734796","pdf_url":null,"source":{"id":"https://openalex.org/S105046310","display_name":"ACM Transactions on Design Automation of Electronic Systems","issn_l":"1084-4309","issn":["1084-4309","1557-7309"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319798","host_organization_name":"Association for Computing Machinery","host_organization_lineage":["https://openalex.org/P4310319798"],"host_organization_lineage_names":["Association for Computing Machinery"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ACM Transactions on Design Automation of Electronic Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3563208509","display_name":null,"funder_award_id":"CCF-1714805, CCF-2212345, CCF-2437795","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320310194","display_name":"Fulbright Foundation in Greece","ror":"https://ror.org/05r2ts661"},{"id":"https://openalex.org/F4320332180","display_name":"Defense Advanced Research Projects Agency","ror":"https://ror.org/02caytj08"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W68714869","https://openalex.org/W1975354237","https://openalex.org/W1990215011","https://openalex.org/W1997860465","https://openalex.org/W2053008534","https://openalex.org/W2055479677","https://openalex.org/W2064477270","https://openalex.org/W2073954397","https://openalex.org/W2077036969","https://openalex.org/W2081786181","https://openalex.org/W2083090974","https://openalex.org/W2123446492","https://openalex.org/W2154031458","https://openalex.org/W2159543178","https://openalex.org/W2167456552","https://openalex.org/W2293477573","https://openalex.org/W2343272038","https://openalex.org/W2394569310","https://openalex.org/W2587645287","https://openalex.org/W2622562221","https://openalex.org/W2753722292","https://openalex.org/W2791362638","https://openalex.org/W2886791359","https://openalex.org/W3005862711","https://openalex.org/W3013474731","https://openalex.org/W3117305042","https://openalex.org/W3176277023","https://openalex.org/W4200421630","https://openalex.org/W4225327530","https://openalex.org/W4237566320","https://openalex.org/W4245316435","https://openalex.org/W4247406770","https://openalex.org/W4301047588","https://openalex.org/W4379619538","https://openalex.org/W4389160813"],"related_works":["https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W4406350055","https://openalex.org/W4239924455","https://openalex.org/W2001630809","https://openalex.org/W777979701","https://openalex.org/W2014796125","https://openalex.org/W4244925124","https://openalex.org/W2669128877","https://openalex.org/W1985471711"],"abstract_inverted_index":{"This":[0,86,125],"work":[1],"presents":[2],"an":[3],"analytical":[4,131],"approach":[5,71,163],"for":[6,94,137,156,201],"analyzing":[7,58],"electromigration":[8],"(EM)":[9],"in":[10,37,43,60,120],"modern":[11],"technologies":[12],"that":[13,82,109],"use":[14],"copper":[15],"dual":[16],"damascene":[17],"(Cu":[18],"DD)":[19],"interconnects.":[20],"In":[21,64],"these":[22],"technologies,":[23],"due":[24],"to":[25,55,115,129,149,166,187],"design":[26],"rule":[27],"and":[28,98,171,208],"methodology":[29],"constraints,":[30],"wires":[31],"are":[32],"typically":[33],"laid":[34],"out":[35],"unidirectionally":[36],"each":[38],"metal":[39],"layer;":[40],"since":[41],"EM":[42,59,135],"Cu":[44],"DD":[45],"interconnects":[46],"do":[47],"not":[48],"cross":[49],"layer":[50],"boundaries,":[51],"the":[52,79,100,116,151,168,172,197],"problem":[53],"reduces":[54],"one":[56],"of":[57,103,106,133,142,154,160,199],"multisegment":[61,123],"interconnect":[62,92],"lines.":[63],"contrast":[65],"with":[66,139,196],"traditional":[67],"empirical":[68],"methodologies,":[69],"our":[70],"is":[72,127,164],"based":[73],"on":[74,91,175],"physics-based":[75],"modeling,":[76],"directly":[77],"solving":[78],"differential":[80],"equations":[81],"model":[83],"EM-induced":[84],"stress.":[85],"article":[87],"places":[88],"a":[89,111,121,205],"focus":[90],"lines,":[93],"reasons":[95],"described":[96],"above,":[97],"introduces":[99],"new":[101],"concept":[102],"boundary":[104],"reflections":[105],"stress":[107,118,136,203],"flux":[108],"ascribes":[110],"physical":[112],"(wave-like)":[113],"analogy":[114],"transient":[117,134],"behavior":[119],"finite":[122],"line.":[124],"framework":[126],"used":[128],"derive":[130],"expressions":[132],"lines":[138],"any":[140,157],"number":[141,153,198],"segments,":[143],"which":[144],"can":[145],"also":[146],"be":[147],"tailored":[148],"include":[150],"appropriate":[152],"terms":[155],"desired":[158],"level":[159],"accuracy.":[161],"The":[162],"applied":[165],"both":[167],"nucleation":[169],"phase":[170,174],"postvoiding":[173],"large":[176],"power":[177],"grid":[178],"benchmarks.":[179],"These":[180],"experiments":[181],"demonstrate":[182],"excellent":[183],"accuracy":[184],"as":[185,191,193],"compared":[186],"accurate":[188],"numerical":[189],"solution,":[190],"well":[192],"linear":[194],"complexity":[195],"segments":[200],"evaluating":[202],"at":[204],"specified":[206],"point":[207],"time.":[209]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}