{"id":"https://openalex.org/W4411369210","doi":"https://doi.org/10.1145/3732771.3742722","title":"Variability Fault Localization by Abstract Interpretation and its Application to SPL Repair","display_name":"Variability Fault Localization by Abstract Interpretation and its Application to SPL Repair","publication_year":2025,"publication_date":"2025-06-12","ids":{"openalex":"https://openalex.org/W4411369210","doi":"https://doi.org/10.1145/3732771.3742722"},"language":"en","primary_location":{"id":"doi:10.1145/3732771.3742722","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3732771.3742722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th ACM SIGPLAN International Conference on Software Language Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063086549","display_name":"Aleksandar S. Dimovski","orcid":"https://orcid.org/0000-0002-3601-2631"},"institutions":[{"id":"https://openalex.org/I4391012568","display_name":"Mother Teresa University","ror":"https://ror.org/04wnz0192","country_code":null,"type":"education","lineage":["https://openalex.org/I4391012568"]}],"countries":["MK"],"is_corresponding":true,"raw_author_name":"Aleksandar S. Dimovski","raw_affiliation_strings":["Mother Teresa University, Skopje, North Macedonia"],"affiliations":[{"raw_affiliation_string":"Mother Teresa University, Skopje, North Macedonia","institution_ids":["https://openalex.org/I4391012568"]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5063086549"],"corresponding_institution_ids":["https://openalex.org/I4391012568"],"apc_list":null,"apc_paid":null,"fwci":2.3818,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.87700407,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"175","last_page":"188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9912999868392944,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9610000252723694,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9042999744415283,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpretation","display_name":"Interpretation (philosophy)","score":0.6891887784004211},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5699101686477661},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5236099362373352},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4276917576789856},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.22276157140731812},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2038782238960266},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1425754427909851},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.1293739378452301}],"concepts":[{"id":"https://openalex.org/C527412718","wikidata":"https://www.wikidata.org/wiki/Q855395","display_name":"Interpretation (philosophy)","level":2,"score":0.6891887784004211},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5699101686477661},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5236099362373352},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4276917576789856},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.22276157140731812},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2038782238960266},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1425754427909851},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.1293739378452301}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3732771.3742722","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3732771.3742722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 18th ACM SIGPLAN International Conference on Software Language Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","display_name":"Climate action","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1480909796","https://openalex.org/W1501652040","https://openalex.org/W1518247129","https://openalex.org/W1611084195","https://openalex.org/W1789556332","https://openalex.org/W1839789313","https://openalex.org/W1982205631","https://openalex.org/W2043100293","https://openalex.org/W2049497188","https://openalex.org/W2080267935","https://openalex.org/W2116844130","https://openalex.org/W2129538349","https://openalex.org/W2144789370","https://openalex.org/W2163556509","https://openalex.org/W2172154252","https://openalex.org/W2208405779","https://openalex.org/W2249077347","https://openalex.org/W2556717355","https://openalex.org/W2771629016","https://openalex.org/W2789767897","https://openalex.org/W2901842721","https://openalex.org/W2909089478","https://openalex.org/W2921381765","https://openalex.org/W3042730451","https://openalex.org/W3146184629","https://openalex.org/W3160709053","https://openalex.org/W3186756382","https://openalex.org/W3199560344","https://openalex.org/W3217584556","https://openalex.org/W4235417919","https://openalex.org/W4240558819","https://openalex.org/W4244452926","https://openalex.org/W4248489389","https://openalex.org/W4252984174","https://openalex.org/W4362663227","https://openalex.org/W4387885404","https://openalex.org/W4387885581","https://openalex.org/W4400722116","https://openalex.org/W6893172109","https://openalex.org/W6910544132"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4313320911","https://openalex.org/W4327743144","https://openalex.org/W4245077728","https://openalex.org/W2390279801","https://openalex.org/W2607424049","https://openalex.org/W4390922876","https://openalex.org/W3183204001"],"abstract_inverted_index":{"Fault":[0],"localization":[1,51],"is":[2],"an":[3],"important":[4],"step":[5],"in":[6,29,67],"software":[7],"debugging":[8],"that":[9],"aims":[10],"to":[11,18,35],"isolate":[12],"and":[13],"localize":[14],"the":[15,23,36],"bugs":[16,40,66],"(errors)":[17],"a":[19,47],"small":[20],"part":[21],"of":[22,39,64],"program.":[24],"This":[25,44],"becomes":[26],"more":[27],"challenging":[28],"Software":[30],"Product":[31],"Lines":[32],"(SPLs)":[33],"due":[34],"variable":[37],"nature":[38],"(so-called":[41],"variability":[42,49,65],"bugs).":[43],"paper":[45],"introduces":[46],"novel":[48],"fault":[50],"algorithm":[52],"for":[53,61],"SPLs.":[54,68],"Moreover,":[55],"we":[56],"present":[57],"its":[58],"practical":[59],"application":[60],"automatic":[62],"repair":[63]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}