{"id":"https://openalex.org/W7092209394","doi":"https://doi.org/10.1145/3725843.3756089","title":"DRAM Fault Classification through Large-Scale Field Monitoring for Robust Memory RAS Management","display_name":"DRAM Fault Classification through Large-Scale Field Monitoring for Robust Memory RAS Management","publication_year":2025,"publication_date":"2025-10-17","ids":{"openalex":"https://openalex.org/W7092209394","doi":"https://doi.org/10.1145/3725843.3756089"},"language":null,"primary_location":{"id":"doi:10.1145/3725843.3756089","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3725843.3756089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 58th IEEE/ACM International Symposium on Microarchitecture","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Hoiju Chung","orcid":"https://orcid.org/0009-0003-0475-9911"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Hoiju Chung","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0003-0475-9911","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Euisang Oh","orcid":"https://orcid.org/0009-0004-1330-0528"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Euisang Oh","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0004-1330-0528","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Seungmin Baek","orcid":"https://orcid.org/0009-0001-4801-8969"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Seungmin Baek","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0001-4801-8969","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hyeongshin Yoon","orcid":"https://orcid.org/0009-0006-1793-6587"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hyeongshin Yoon","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0006-1793-6587","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jaesung Yoo","orcid":"https://orcid.org/0009-0003-8049-4388"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaesung Yoo","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0003-8049-4388","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Sanghwan Lee","orcid":"https://orcid.org/0009-0009-6392-3826"},"institutions":[{"id":"https://openalex.org/I10654025","display_name":"SK Group (United States)","ror":"https://ror.org/00qajw440","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanghwan Lee","raw_affiliation_strings":["SK hynix America, San Jose, California, USA"],"raw_orcid":"https://orcid.org/0009-0009-6392-3826","affiliations":[{"raw_affiliation_string":"SK hynix America, San Jose, California, USA","institution_ids":["https://openalex.org/I10654025"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yongjun Lee","orcid":"https://orcid.org/0009-0005-5350-5170"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yongjun Lee","raw_affiliation_strings":["Microsoft, Mountain View, California, USA"],"raw_orcid":"https://orcid.org/0009-0005-5350-5170","affiliations":[{"raw_affiliation_string":"Microsoft, Mountain View, California, USA","institution_ids":["https://openalex.org/I1290206253"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Arhatha Bramhanand","orcid":"https://orcid.org/0009-0009-2958-1375"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arhatha Bramhanand","raw_affiliation_strings":["Microsoft, Redmond, Washington, USA"],"raw_orcid":"https://orcid.org/0009-0009-2958-1375","affiliations":[{"raw_affiliation_string":"Microsoft, Redmond, Washington, USA","institution_ids":["https://openalex.org/I1290206253"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Brett Dodds","orcid":"https://orcid.org/0009-0004-7954-6512"},"institutions":[{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]},{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Brett Dodds","raw_affiliation_strings":["Microsoft, Boise, Idaho, USA"],"raw_orcid":"https://orcid.org/0009-0004-7954-6512","affiliations":[{"raw_affiliation_string":"Microsoft, Boise, Idaho, USA","institution_ids":["https://openalex.org/I11912373","https://openalex.org/I1290206253"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yang Zhou","orcid":"https://orcid.org/0009-0001-7531-3365"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yang Zhou","raw_affiliation_strings":["University of Illinois Urbana-Champaign, Urbana, Illinois, USA"],"raw_orcid":"https://orcid.org/0009-0001-7531-3365","affiliations":[{"raw_affiliation_string":"University of Illinois Urbana-Champaign, Urbana, Illinois, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":null,"display_name":"Nam Sung Kim","orcid":"https://orcid.org/0000-0002-0442-5634"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nam Sung Kim","raw_affiliation_strings":["University of Illinois Urbana-Champaign, Urbana, Illinois, USA"],"raw_orcid":"https://orcid.org/0000-0002-0442-5634","affiliations":[{"raw_affiliation_string":"University of Illinois Urbana-Champaign, Urbana, Illinois, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I10654025"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57264781,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1448","last_page":"1461"},"is_retracted":false,"is_paratext":false,"is_xpac":true,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.3856000006198883,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.3856000006198883,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.21299999952316284,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.17110000550746918,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.6680999994277954},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5060999989509583},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.48100000619888306},{"id":"https://openalex.org/keywords/troubleshooting","display_name":"Troubleshooting","score":0.47450000047683716},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.43939998745918274},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.3068999946117401}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.6680999994277954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5785999894142151},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5060999989509583},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.48100000619888306},{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.47450000047683716},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.43939998745918274},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.39559999108314514},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.36640000343322754},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33869999647140503},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.3068999946117401},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.29809999465942383},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.290800005197525},{"id":"https://openalex.org/C108074857","wikidata":"https://www.wikidata.org/wiki/Q3067360","display_name":"Fault management","level":3,"score":0.28049999475479126},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2777000069618225},{"id":"https://openalex.org/C118702147","wikidata":"https://www.wikidata.org/wiki/Q189396","display_name":"Dynamic random-access memory","level":3,"score":0.2637999951839447}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3725843.3756089","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3725843.3756089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 58th IEEE/ACM International Symposium on Microarchitecture","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7853553295135498,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1559781097","https://openalex.org/W1990697197","https://openalex.org/W2015184411","https://openalex.org/W2040379684","https://openalex.org/W2042065072","https://openalex.org/W2050431855","https://openalex.org/W2061116412","https://openalex.org/W2065171379","https://openalex.org/W2094127360","https://openalex.org/W2120591095","https://openalex.org/W2142812297","https://openalex.org/W2145071552","https://openalex.org/W2782944865","https://openalex.org/W2989171707","https://openalex.org/W3004493283","https://openalex.org/W3006036681","https://openalex.org/W3083765802","https://openalex.org/W3112402894","https://openalex.org/W3137509183","https://openalex.org/W3158614068","https://openalex.org/W3204625459","https://openalex.org/W4200335215","https://openalex.org/W4220702013","https://openalex.org/W4248072170","https://openalex.org/W4283378767","https://openalex.org/W4286571718","https://openalex.org/W4287849472","https://openalex.org/W4313546932","https://openalex.org/W4360831854","https://openalex.org/W4389491852","https://openalex.org/W4396980778","https://openalex.org/W4401211861","https://openalex.org/W4412130242"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-01-11T23:08:45.486102","created_date":"2025-10-17T00:00:00"}