{"id":"https://openalex.org/W4411713380","doi":"https://doi.org/10.1145/3716368.3735225","title":"Microarchitecture Evaluation Framework for Transient Execution Attack Vulnerability: Metrics, Fuzzing, and Sensitivity Analysis","display_name":"Microarchitecture Evaluation Framework for Transient Execution Attack Vulnerability: Metrics, Fuzzing, and Sensitivity Analysis","publication_year":2025,"publication_date":"2025-06-27","ids":{"openalex":"https://openalex.org/W4411713380","doi":"https://doi.org/10.1145/3716368.3735225"},"language":"en","primary_location":{"id":"doi:10.1145/3716368.3735225","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735225","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1145/3716368.3735225","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Jordan McGhee","orcid":"https://orcid.org/0009-0005-0768-4921"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jordan McGhee","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0009-0005-0768-4921","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118659648","display_name":"Nayra Lujano","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nayra Lujano","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0009-0009-1884-5646","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027026046","display_name":"A. H. Peterson","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Aiden Peterson","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0009-0006-7894-3342","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050514356","display_name":"Henry Duwe","orcid":"https://orcid.org/0000-0003-2310-7399"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Henry Duwe","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0000-0003-2310-7399","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102977539","display_name":"Akhilesh Tyagi","orcid":"https://orcid.org/0000-0002-2101-3594"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Akhilesh Tyagi","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0000-0002-2101-3594","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060182940","display_name":"Berk G\u00fclmezo\u011flu","orcid":"https://orcid.org/0000-0001-6268-6325"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Berk Gulmezoglu","raw_affiliation_strings":["Iowa State University, Ames, USA"],"raw_orcid":"https://orcid.org/0000-0001-6268-6325","affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.06575494,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"161","last_page":"168"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11241","display_name":"Advanced Malware Detection Techniques","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuzz-testing","display_name":"Fuzz testing","score":0.9642566442489624},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7185635566711426},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6691721081733704},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.62958824634552},{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.6269392967224121},{"id":"https://openalex.org/keywords/vulnerability-assessment","display_name":"Vulnerability assessment","score":0.6163586974143982},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.602928102016449},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.46775293350219727},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.37717095017433167},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.211101233959198},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1768786907196045},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.146182119846344},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.14021500945091248},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.07385969161987305},{"id":"https://openalex.org/keywords/psychology","display_name":"Psychology","score":0.061348944902420044}],"concepts":[{"id":"https://openalex.org/C111065885","wikidata":"https://www.wikidata.org/wiki/Q1189053","display_name":"Fuzz testing","level":3,"score":0.9642566442489624},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7185635566711426},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6691721081733704},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.62958824634552},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.6269392967224121},{"id":"https://openalex.org/C167063184","wikidata":"https://www.wikidata.org/wiki/Q1400839","display_name":"Vulnerability assessment","level":3,"score":0.6163586974143982},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.602928102016449},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.46775293350219727},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.37717095017433167},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.211101233959198},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1768786907196045},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.146182119846344},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.14021500945091248},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.07385969161987305},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.061348944902420044},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C542102704","wikidata":"https://www.wikidata.org/wiki/Q183257","display_name":"Psychotherapist","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C137176749","wikidata":"https://www.wikidata.org/wiki/Q4105337","display_name":"Psychological resilience","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3716368.3735225","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735225","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3716368.3735225","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735225","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1488058190","https://openalex.org/W2807403537","https://openalex.org/W2810584084","https://openalex.org/W2884163605","https://openalex.org/W2884267664","https://openalex.org/W2931679308","https://openalex.org/W2963311060","https://openalex.org/W2963804422","https://openalex.org/W2964281551","https://openalex.org/W2972034624","https://openalex.org/W2985509521","https://openalex.org/W3090475639","https://openalex.org/W3100860658","https://openalex.org/W3112409568","https://openalex.org/W3117764131","https://openalex.org/W3159715284","https://openalex.org/W3191114843","https://openalex.org/W3198421887","https://openalex.org/W3214515980","https://openalex.org/W4232120412","https://openalex.org/W4288086178","https://openalex.org/W4289038676","https://openalex.org/W4379116022","https://openalex.org/W4380881104","https://openalex.org/W4395106389"],"related_works":["https://openalex.org/W1883246888","https://openalex.org/W2370114625","https://openalex.org/W1756374135","https://openalex.org/W2062873522","https://openalex.org/W2947584067","https://openalex.org/W2280562859","https://openalex.org/W230721595","https://openalex.org/W3157230915","https://openalex.org/W1496728123","https://openalex.org/W2789975780"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}