{"id":"https://openalex.org/W4411713512","doi":"https://doi.org/10.1145/3716368.3735171","title":"HWFixBench: Benchmarking Tools for Hardware Understanding and Fault Repair","display_name":"HWFixBench: Benchmarking Tools for Hardware Understanding and Fault Repair","publication_year":2025,"publication_date":"2025-06-27","ids":{"openalex":"https://openalex.org/W4411713512","doi":"https://doi.org/10.1145/3716368.3735171"},"language":"en","primary_location":{"id":"doi:10.1145/3716368.3735171","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735171","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1145/3716368.3735171","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062517894","display_name":"Weimin Fu","orcid":"https://orcid.org/0000-0002-9623-6522"},"institutions":[{"id":"https://openalex.org/I189590672","display_name":"Kansas State University","ror":"https://ror.org/05p1j8758","country_code":"US","type":"education","lineage":["https://openalex.org/I189590672"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Weimin Fu","raw_affiliation_strings":["Mike Wiegers Department of Electrical and Computer Engineering, Kansas State University, Manhattan, Kansas, USA"],"raw_orcid":"https://orcid.org/0000-0002-9623-6522","affiliations":[{"raw_affiliation_string":"Mike Wiegers Department of Electrical and Computer Engineering, Kansas State University, Manhattan, Kansas, USA","institution_ids":["https://openalex.org/I189590672"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Shijie Li","orcid":"https://orcid.org/0009-0004-6343-6941"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shijie Li","raw_affiliation_strings":["School of Cyber Science and Technology, University of Science and Technology of China, Hefei, Anhui, China"],"raw_orcid":"https://orcid.org/0009-0004-6343-6941","affiliations":[{"raw_affiliation_string":"School of Cyber Science and Technology, University of Science and Technology of China, Hefei, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017464942","display_name":"Yier Jin","orcid":"https://orcid.org/0000-0002-8791-0597"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yier Jin","raw_affiliation_strings":["School of Cyber Science and Technology, University of Science and Technology of China, Hefei, Anhui, China"],"raw_orcid":"https://orcid.org/0000-0002-8791-0597","affiliations":[{"raw_affiliation_string":"School of Cyber Science and Technology, University of Science and Technology of China, Hefei, Anhui, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011794280","display_name":"Xiaolong Guo","orcid":"https://orcid.org/0000-0001-9896-9407"},"institutions":[{"id":"https://openalex.org/I189590672","display_name":"Kansas State University","ror":"https://ror.org/05p1j8758","country_code":"US","type":"education","lineage":["https://openalex.org/I189590672"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaolong Guo","raw_affiliation_strings":["Mike Wiegers Department of Electrical and Computer Engineering, Kansas State University, Manhattan, Kansas, USA"],"raw_orcid":"https://orcid.org/0000-0001-9896-9407","affiliations":[{"raw_affiliation_string":"Mike Wiegers Department of Electrical and Computer Engineering, Kansas State University, Manhattan, Kansas, USA","institution_ids":["https://openalex.org/I189590672"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"427","last_page":"434"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmarking","display_name":"Benchmarking","score":0.8943144083023071},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7186524271965027},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5125389099121094},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48615047335624695},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.43057146668434143},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.41803762316703796},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.08272877335548401},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.051700055599212646}],"concepts":[{"id":"https://openalex.org/C86251818","wikidata":"https://www.wikidata.org/wiki/Q816754","display_name":"Benchmarking","level":2,"score":0.8943144083023071},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7186524271965027},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5125389099121094},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48615047335624695},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.43057146668434143},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.41803762316703796},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.08272877335548401},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.051700055599212646},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3716368.3735171","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735171","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3716368.3735171","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3716368.3735171","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2025","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W4243552087","https://openalex.org/W4379115941","https://openalex.org/W4384918448","https://openalex.org/W4389156677","https://openalex.org/W4389166737","https://openalex.org/W4389363323","https://openalex.org/W4389519254","https://openalex.org/W4391182436","https://openalex.org/W4391272793","https://openalex.org/W4391681217","https://openalex.org/W4392822465","https://openalex.org/W4393145520","https://openalex.org/W4394838601","https://openalex.org/W4394867392","https://openalex.org/W4395474395","https://openalex.org/W4396786227","https://openalex.org/W4396913122","https://openalex.org/W4399510421","https://openalex.org/W4400377780","https://openalex.org/W4401306886","https://openalex.org/W4401306979","https://openalex.org/W4402502903","https://openalex.org/W4402963145","https://openalex.org/W4403511190","https://openalex.org/W4403709578","https://openalex.org/W4403713514","https://openalex.org/W4404346382","https://openalex.org/W4404354604","https://openalex.org/W4404407719","https://openalex.org/W4404739285","https://openalex.org/W4404781268","https://openalex.org/W4404782360","https://openalex.org/W4405300892","https://openalex.org/W4405354744","https://openalex.org/W4405469574","https://openalex.org/W4405655184","https://openalex.org/W4406014556","https://openalex.org/W4406071699","https://openalex.org/W4406779522","https://openalex.org/W6929397479"],"related_works":["https://openalex.org/W4238897586","https://openalex.org/W435179959","https://openalex.org/W2619091065","https://openalex.org/W2059640416","https://openalex.org/W1490753184","https://openalex.org/W2284465472","https://openalex.org/W2291782699","https://openalex.org/W1993948687","https://openalex.org/W2000169967","https://openalex.org/W2112883198"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}