{"id":"https://openalex.org/W4407774639","doi":"https://doi.org/10.1145/3711129.3711338","title":"A PCB bare board defects detection method based on dual-domain wavelet-YOLO","display_name":"A PCB bare board defects detection method based on dual-domain wavelet-YOLO","publication_year":2024,"publication_date":"2024-10-18","ids":{"openalex":"https://openalex.org/W4407774639","doi":"https://doi.org/10.1145/3711129.3711338"},"language":"en","primary_location":{"id":"doi:10.1145/3711129.3711338","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3711129.3711338","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1145/3711129.3711338","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100517295","display_name":"Zhong Xu","orcid":null},"institutions":[{"id":"https://openalex.org/I176808543","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587","country_code":"CN","type":"education","lineage":["https://openalex.org/I176808543"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xu Zhong","raw_affiliation_strings":["Faculty of Electrical and Control Engineering, Liaoning Technical University, Huludao, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Control Engineering, Liaoning Technical University, Huludao, Liaoning, China","institution_ids":["https://openalex.org/I176808543"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041070540","display_name":"Kun Li","orcid":"https://orcid.org/0000-0002-9759-0072"},"institutions":[{"id":"https://openalex.org/I176808543","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587","country_code":"CN","type":"education","lineage":["https://openalex.org/I176808543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kun Li","raw_affiliation_strings":["Faculty of Electrical and Control Engineering, Liaoning Technical University, Huludao, Liaoning, China"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical and Control Engineering, Liaoning Technical University, Huludao, Liaoning, China","institution_ids":["https://openalex.org/I176808543"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100517295"],"corresponding_institution_ids":["https://openalex.org/I176808543"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.41429598,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1235","last_page":"1240"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9779000282287598,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.6006443500518799},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.5502915978431702},{"id":"https://openalex.org/keywords/on-board","display_name":"On board","score":0.5338669419288635},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5205353498458862},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.5076230764389038},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.31374186277389526},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.21657153964042664},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.1475566029548645},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11325782537460327}],"concepts":[{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.6006443500518799},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.5502915978431702},{"id":"https://openalex.org/C3018963415","wikidata":"https://www.wikidata.org/wiki/Q16878425","display_name":"On board","level":2,"score":0.5338669419288635},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5205353498458862},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.5076230764389038},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.31374186277389526},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.21657153964042664},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.1475566029548645},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11325782537460327},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3711129.3711338","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3711129.3711338","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3711129.3711338","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3711129.3711338","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2549337046","https://openalex.org/W2613718673","https://openalex.org/W2971587923","https://openalex.org/W2984761674","https://openalex.org/W4280611010","https://openalex.org/W4384207671","https://openalex.org/W4385834539","https://openalex.org/W4386251133","https://openalex.org/W4387125416","https://openalex.org/W4392089963","https://openalex.org/W6849520326"],"related_works":["https://openalex.org/W2382174632","https://openalex.org/W2129959498","https://openalex.org/W2784060934","https://openalex.org/W2902714807","https://openalex.org/W2537489131","https://openalex.org/W2046633342","https://openalex.org/W2394084632","https://openalex.org/W2358293514","https://openalex.org/W2059273319","https://openalex.org/W2014650515"],"abstract_inverted_index":{"In":[0,25],"this":[1,54,56],"paper,":[2],"a":[3],"defect":[4,23,32,116],"detection":[5,45,82,102],"model":[6,99],"DDW-YOLO":[7,92],"based":[8],"on":[9],"YOLOv5":[10],"is":[11,93],"proposed":[12],"to":[13,34,76,95],"improve":[14,80],"the":[15,29,59,65,73,81,96],"accuracy":[16,103],"and":[17,64,79,104,107],"efficiency":[18],"of":[19,31,43,84],"PCB":[20,26,113],"bare":[21,27,114],"board":[22,115],"detection.":[24,117],"boards,":[28],"ratio":[30],"area":[33,36],"background":[35],"differs":[37],"significantly,":[38],"resulting":[39],"in":[40,47,100],"poor":[41],"performance":[42],"existing":[44],"methods":[46],"identifying":[48],"small":[49,85],"target":[50],"defects.":[51,86],"To":[52],"solve":[53],"problem,":[55],"paper":[57],"proposes":[58],"wavelet":[60,67],"signature":[61],"fusion":[62],"module":[63],"dual-domain":[66],"attention":[68,75],"network,":[69],"which":[70],"can":[71],"enhance":[72],"model's":[74],"high-frequency":[77],"information":[78],"ability":[83],"The":[87],"experimental":[88],"results":[89],"show":[90],"that":[91],"superior":[94],"current":[97],"mainstream":[98],"both":[101],"calculation":[105],"efficiency,":[106],"provides":[108],"an":[109],"effective":[110],"solution":[111],"for":[112]},"counts_by_year":[],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}