{"id":"https://openalex.org/W4407774117","doi":"https://doi.org/10.1145/3711129.3711330","title":"Study on Decoupling Capacitor Selection Strategy Based on Board-Level PDN Design","display_name":"Study on Decoupling Capacitor Selection Strategy Based on Board-Level PDN Design","publication_year":2024,"publication_date":"2024-10-18","ids":{"openalex":"https://openalex.org/W4407774117","doi":"https://doi.org/10.1145/3711129.3711330"},"language":"en","primary_location":{"id":"doi:10.1145/3711129.3711330","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3711129.3711330","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086728644","display_name":"Z. L. Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126257","display_name":"CRRC (China)","ror":"https://ror.org/033g21894","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210126257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ziyu Zhang","raw_affiliation_strings":["CRSC Research & Design Institute Group Co., Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0009-0003-6023-0094","affiliations":[{"raw_affiliation_string":"CRSC Research & Design Institute Group Co., Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210126257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112103730","display_name":"W. Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126257","display_name":"CRRC (China)","ror":"https://ror.org/033g21894","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210126257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weidong Zou","raw_affiliation_strings":["CRSC Research & Design Institute Group Co., Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0009-0006-8001-9386","affiliations":[{"raw_affiliation_string":"CRSC Research & Design Institute Group Co., Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210126257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5055359873","display_name":"C.H. Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I4210126257","display_name":"CRRC (China)","ror":"https://ror.org/033g21894","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210126257"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cui Ye","raw_affiliation_strings":["CRSC Research & Design Institute Group Co., Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0009-0008-0774-5589","affiliations":[{"raw_affiliation_string":"CRSC Research & Design Institute Group Co., Ltd., Beijing, China","institution_ids":["https://openalex.org/I4210126257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210126257"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1185","last_page":"1190"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/decoupling-capacitor","display_name":"Decoupling capacitor","score":0.7608710527420044},{"id":"https://openalex.org/keywords/decoupling","display_name":"Decoupling (probability)","score":0.7141964435577393},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7067793607711792},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5847232937812805},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4539808928966522},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3948315382003784},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3204621374607086},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.24503862857818604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2444000244140625},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08182531595230103},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0716407299041748}],"concepts":[{"id":"https://openalex.org/C35196352","wikidata":"https://www.wikidata.org/wiki/Q1532649","display_name":"Decoupling capacitor","level":4,"score":0.7608710527420044},{"id":"https://openalex.org/C205606062","wikidata":"https://www.wikidata.org/wiki/Q5249645","display_name":"Decoupling (probability)","level":2,"score":0.7141964435577393},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7067793607711792},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5847232937812805},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4539808928966522},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3948315382003784},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3204621374607086},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.24503862857818604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2444000244140625},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08182531595230103},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0716407299041748}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3711129.3711330","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3711129.3711330","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1916346930","https://openalex.org/W4230901984"],"related_works":["https://openalex.org/W2591634623","https://openalex.org/W2115156230","https://openalex.org/W2972236120","https://openalex.org/W2730834029","https://openalex.org/W1600789903","https://openalex.org/W1849148950","https://openalex.org/W2537334175","https://openalex.org/W1968306380","https://openalex.org/W2103363348","https://openalex.org/W1548863870"],"abstract_inverted_index":{"With":[0],"the":[1,8,23,39,44,96,103,109,116,133,157,170],"rapid":[2],"development":[3],"of":[4,10,25,100,112,118,136,145,156,159],"high-speed":[5],"digital":[6],"circuits,":[7],"rationality":[9],"power":[11],"distribution":[12],"network":[13],"(PDN)":[14],"design":[15,124],"is":[16,28,120,148],"becoming":[17],"increasingly":[18],"critical.":[19],"Among":[20],"these":[21],"aspects,":[22],"selection":[24,111],"decoupling":[26,35,77,92,141,162,175],"capacitors":[27,93,104,119,160],"particularly":[29],"important.":[30],"Traditional":[31],"methods":[32,128],"for":[33,90],"selecting":[34,91],"capacitors,":[36,113,137],"such":[37],"as":[38],"Big":[40],"\"V\"":[41],"method":[42],"and":[43,51,54,75,102,153,161,165,180],"Decade":[45],"method,":[46],"rely":[47],"on":[48,70,95],"empirical":[49],"values":[50],"cannot":[52],"quantitatively":[53],"accurately":[55],"select":[56],"capacitors.":[57],"This":[58,84,106],"results":[59],"in":[60,63],"high":[61],"redundancy":[62],"capacitor":[64],"selection,":[65],"leading":[66,138],"to":[67,131,139],"wasted":[68],"space":[69],"printed":[71],"circuit":[72],"boards":[73],"(PCBs)":[74],"low":[76],"efficiency,":[78],"while":[79,122],"also":[80],"increasing":[81],"engineering":[82,151,182],"costs.":[83,183],"paper":[85],"proposes":[86],"an":[87],"optimized":[88],"strategy":[89,107,147,172],"based":[94],"frequency":[97],"domain":[98],"characteristics":[99],"PDN":[101],"themselves.":[105],"enables":[108],"quantitative":[110],"ensuring":[114],"that":[115,169],"number":[117,158],"minimized":[121],"meeting":[123],"requirements.":[125],"Additionally,":[126],"simulation":[127],"are":[129],"used":[130],"confirm":[132],"reasonable":[134],"placement":[135],"improved":[140],"performance.":[142],"The":[143],"effectiveness":[144,163],"this":[146],"validated":[149],"through":[150],"examples,":[152],"a":[154],"comparison":[155],"before":[164],"after":[166],"optimization":[167],"demonstrates":[168],"proposed":[171],"offers":[173],"better":[174],"performance,":[176],"saves":[177],"board":[178],"space,":[179],"reduces":[181]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}