{"id":"https://openalex.org/W4407774228","doi":"https://doi.org/10.1145/3711129.3711175","title":"Industrial scene recognition application based on machine vision","display_name":"Industrial scene recognition application based on machine vision","publication_year":2024,"publication_date":"2024-10-18","ids":{"openalex":"https://openalex.org/W4407774228","doi":"https://doi.org/10.1145/3711129.3711175"},"language":"en","primary_location":{"id":"doi:10.1145/3711129.3711175","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3711129.3711175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Shaoping Li","orcid":"https://orcid.org/0009-0006-9024-339X"},"institutions":[{"id":"https://openalex.org/I4210136047","display_name":"Weifang University of Science and Technology","ror":"https://ror.org/04ha2bb10","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210136047"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shaoping Li","raw_affiliation_strings":["Shandong Vocational College of Science and Technology, Weifang, Shandong, China"],"raw_orcid":"https://orcid.org/0009-0006-9024-339X","affiliations":[{"raw_affiliation_string":"Shandong Vocational College of Science and Technology, Weifang, Shandong, China","institution_ids":["https://openalex.org/I4210136047"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210136047"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"255","last_page":"260"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9617999792098999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9617999792098999,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.8999999761581421,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.6955735683441162},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.680374026298523},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6236087679862976},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6117109060287476},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3574838638305664}],"concepts":[{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.6955735683441162},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.680374026298523},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6236087679862976},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6117109060287476},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3574838638305664}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3711129.3711175","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3711129.3711175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 8th International Conference on Electronic Information Technology and Computer Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2772917594","https://openalex.org/W2036807459","https://openalex.org/W2058170566","https://openalex.org/W2755342338","https://openalex.org/W2166024367","https://openalex.org/W3116076068","https://openalex.org/W2229312674","https://openalex.org/W2951359407","https://openalex.org/W2079911747","https://openalex.org/W1969923398"],"abstract_inverted_index":{"This":[0],"article":[1],"discusses":[2],"the":[3,65],"application":[4],"of":[5],"machine":[6],"vision":[7,22],"technology":[8],"in":[9,46],"industrial":[10,33,47,53,77],"scene":[11,27],"recognition.":[12],"The":[13,35],"research":[14],"uses":[15],"deep":[16],"learning":[17],"algorithms,":[18],"combined":[19],"with":[20],"computer":[21],"technology,":[23],"to":[24],"build":[25],"a":[26],"recognition":[28,68],"system":[29,36],"suitable":[30],"for":[31,52],"complex":[32],"environments.":[34],"can":[37],"effectively":[38],"identify":[39],"equipment,":[40],"products":[41],"and":[42,55,60,72],"potential":[43],"safety":[44],"hazards":[45],"environments,":[48],"providing":[49],"strong":[50],"support":[51],"automation":[54],"smart":[56],"manufacturing.":[57],"Extensive":[58],"experiments":[59],"real-world":[61],"case":[62],"studies":[63],"demonstrate":[64],"system's":[66],"high":[67],"accuracy,":[69],"real-time":[70],"performance,":[71],"practical":[73],"value":[74],"across":[75],"various":[76],"scenarios.":[78]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}