{"id":"https://openalex.org/W4408395338","doi":"https://doi.org/10.1145/3698364.3711684","title":"Invited: Automatic Die-to-Die Routing with Shielding","display_name":"Invited: Automatic Die-to-Die Routing with Shielding","publication_year":2025,"publication_date":"2025-03-13","ids":{"openalex":"https://openalex.org/W4408395338","doi":"https://doi.org/10.1145/3698364.3711684"},"language":"en","primary_location":{"id":"doi:10.1145/3698364.3711684","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3698364.3711684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2025 International Symposium on Physical Design","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020309824","display_name":"Sheng-Yu Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Sheng-Yu Hsiao","raw_affiliation_strings":["Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0009-0004-4578-335X","affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yu-Yueh Chang","orcid":"https://orcid.org/0009-0009-2947-0819"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Yueh Chang","raw_affiliation_strings":["Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0009-0009-2947-0819","affiliations":[{"raw_affiliation_string":"Department of Computer Science, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047449424","display_name":"J.H. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jeong-Tying Li","raw_affiliation_strings":["College of Semiconductor Research, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-2444-3629","affiliations":[{"raw_affiliation_string":"College of Semiconductor Research, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5020309824"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":2.1546,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.82683805,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"52","last_page":"53"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/die","display_name":"Die (integrated circuit)","score":0.9457257986068726},{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.5186730623245239},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.5105920433998108},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3932205140590668},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32838913798332214},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3012174963951111},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.21401673555374146},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.15993055701255798}],"concepts":[{"id":"https://openalex.org/C111106434","wikidata":"https://www.wikidata.org/wiki/Q1072430","display_name":"Die (integrated circuit)","level":2,"score":0.9457257986068726},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.5186730623245239},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.5105920433998108},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3932205140590668},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32838913798332214},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3012174963951111},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.21401673555374146},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.15993055701255798}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3698364.3711684","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3698364.3711684","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2025 International Symposium on Physical Design","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4896192969","display_name":null,"funder_award_id":"113-2221-E-007-083","funder_id":"https://openalex.org/F4320323817","funder_display_name":"Universitas Brawijaya"}],"funders":[{"id":"https://openalex.org/F4320323817","display_name":"Universitas Brawijaya","ror":"https://ror.org/01wk3d929"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2014843742","https://openalex.org/W2784010552","https://openalex.org/W4386764970","https://openalex.org/W4386767094"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4404521051","https://openalex.org/W4233910537","https://openalex.org/W2367685550","https://openalex.org/W2363328231","https://openalex.org/W2042913821","https://openalex.org/W2375356488","https://openalex.org/W2910601449","https://openalex.org/W2147810561","https://openalex.org/W2060436819"],"abstract_inverted_index":{"Die-to-die":[0],"routing":[1,37,52],"is":[2,15],"a":[3,67],"special":[4],"layout":[5],"problem":[6],"in":[7],"3DIC":[8],"advanced":[9],"packaging,":[10],"whose":[11],"primary":[12],"productivity":[13],"bottleneck":[14],"routing.":[16],"The":[17],"requirements":[18],"for":[19],"high":[20,23,68],"wiring":[21],"density,":[22],"shielding":[24],"rate,":[25],"complex":[26],"via":[27],"stacking":[28],"and":[29,65],"design":[30,72],"rules":[31],"present":[32],"challenges":[33],"to":[34,46,50,57],"create":[35],"good":[36],"results.":[38],"In":[39],"this":[40],"paper,":[41],"we":[42],"describe":[43],"our":[44],"approaches":[45],"assign":[47],"signal":[48,59],"nets":[49,60],"various":[51],"layers,":[53],"insert":[54],"VSS":[55],"wires":[56],"shield":[58],"as":[61,63],"much":[62],"possible":[64],"achieve":[66],"completion":[69],"rate":[70],"without":[71],"rule":[73],"violations.":[74]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}