{"id":"https://openalex.org/W4402527463","doi":"https://doi.org/10.1145/3678720.3685314","title":"In-Field Debugging of Automotive Microcontrollers for Highest System Availability","display_name":"In-Field Debugging of Automotive Microcontrollers for Highest System Availability","publication_year":2024,"publication_date":"2024-09-13","ids":{"openalex":"https://openalex.org/W4402527463","doi":"https://doi.org/10.1145/3678720.3685314"},"language":"en","primary_location":{"id":"doi:10.1145/3678720.3685314","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3678720.3685314","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd ACM International Workshop on Future Debugging Techniques","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040741792","display_name":"Ga\u0161per Skvar\u010d Bo\u017ei\u010d","orcid":"https://orcid.org/0000-0003-1603-8268"},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Ga\u0161per Skvar\u010d Bo\u017ei\u010d","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":"https://orcid.org/0000-0003-1603-8268","affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010880727","display_name":"Ibai Irigoyen Ceberio","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ibai Irigoyen Ceberio","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":"https://orcid.org/0009-0009-3457-8525","affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048314078","display_name":"Albrecht Mayer","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Albrecht Mayer","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"raw_orcid":"https://orcid.org/0009-0000-7909-9186","affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5040741792"],"corresponding_institution_ids":["https://openalex.org/I137594350"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1257279,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.8791496157646179},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.8200154304504395},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6997960209846497},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6754046678543091},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.581866979598999},{"id":"https://openalex.org/keywords/field","display_name":"Field (mathematics)","score":0.5488989949226379},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.4176645874977112},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23841321468353271},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06739035248756409}],"concepts":[{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.8791496157646179},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.8200154304504395},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6997960209846497},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6754046678543091},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.581866979598999},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.5488989949226379},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.4176645874977112},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23841321468353271},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06739035248756409},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3678720.3685314","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3678720.3685314","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2nd ACM International Workshop on Future Debugging Techniques","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W1908606724","https://openalex.org/W2158457802","https://openalex.org/W2899534862","https://openalex.org/W4230569261","https://openalex.org/W4365143541"],"related_works":["https://openalex.org/W4321442002","https://openalex.org/W3176369637","https://openalex.org/W2978026406","https://openalex.org/W2388687068","https://openalex.org/W1999657508","https://openalex.org/W2399091034","https://openalex.org/W2351581202","https://openalex.org/W2366922255","https://openalex.org/W3091627987","https://openalex.org/W2147310439"],"abstract_inverted_index":{"The":[0],"software":[1],"content":[2],"in":[3,20,43,57,109],"vehicles":[4],"is":[5,26,36,41],"increasing,":[6],"including":[7,84],"their":[8],"system":[9,35,113],"complexity,":[10],"which":[11],"leads":[12],"to":[13,30,67],"a":[14,21,138],"higher":[15],"probability":[16],"of":[17,52,55,79,88],"bugs":[18],"appearing":[19],"production":[22,34],"vehicle.":[23],"Consequently,":[24],"there":[25],"an":[27,49,80,89,97],"increasing":[28],"need":[29],"observe":[31],"what":[32],"the":[33,44,58,63,69,76,85,106,116,122],"doing":[37],"also":[38],"once":[39],"it":[40],"already":[42],"field.":[45],"This":[46,61],"paper":[47],"introduces":[48],"emerging":[50],"topic":[51],"in-field":[53,81,132],"diagnosis":[54,82],"microcontrollers":[56],"automotive":[59],"domain.":[60],"includes":[62],"architecture":[64],"and":[65,71,126,131],"how":[66],"address":[68],"safety":[70],"security":[72],"challenges.":[73],"We":[74,93],"describe":[75],"necessary":[77],"components":[78],"architecture,":[83],"required":[86],"properties":[87],"on-chip":[90,98],"debug":[91,99,124],"monitor.":[92],"provide":[94],"several":[95],"ways":[96],"monitor":[100],"can":[101,120],"be":[102],"implemented":[103],"by":[104],"utilizing":[105],"available":[107],"and,":[108],"some":[110],"cases,":[111],"unused":[112],"resources.":[114],"With":[115],"described":[117],"approach,":[118],"we":[119],"utilize":[121],"same":[123],"concepts":[125],"tools":[127],"for":[128],"local,":[129],"remote,":[130],"diagnosis,":[133],"enabling":[134],"runtime":[135],"verification":[136],"throughout":[137],"system's":[139],"lifecycle.":[140]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}