{"id":"https://openalex.org/W4401168074","doi":"https://doi.org/10.1145/3674225.3674228","title":"Research on Fault Prediction of Nuclear Safety Class Crucial Circuit Based on SDAE- MKRVM","display_name":"Research on Fault Prediction of Nuclear Safety Class Crucial Circuit Based on SDAE- MKRVM","publication_year":2024,"publication_date":"2024-01-19","ids":{"openalex":"https://openalex.org/W4401168074","doi":"https://doi.org/10.1145/3674225.3674228"},"language":"en","primary_location":{"id":"doi:10.1145/3674225.3674228","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1145/3674225.3674228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Power Electronics and Artificial Intelligence","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060404636","display_name":"Miaoxin Dai","orcid":"https://orcid.org/0009-0002-7715-4721"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Miaoxin Dai","raw_affiliation_strings":["School of Computer Science, University of South China, Hengyang, China"],"raw_orcid":"https://orcid.org/0009-0002-7715-4721","affiliations":[{"raw_affiliation_string":"School of Computer Science, University of South China, Hengyang, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100456825","display_name":"Zhi Chen","orcid":"https://orcid.org/0000-0002-5820-9080"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zhi Chen","raw_affiliation_strings":["National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China"],"raw_orcid":"https://orcid.org/0000-0002-5820-9080","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100346062","display_name":"Jie Liu","orcid":"https://orcid.org/0009-0008-1970-8347"},"institutions":[{"id":"https://openalex.org/I91935597","display_name":"University of South China","ror":"https://ror.org/03mqfn238","country_code":"CN","type":"education","lineage":["https://openalex.org/I91935597"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Liu","raw_affiliation_strings":["School of Computer Science, University of South China, Hengyang, China"],"raw_orcid":"https://orcid.org/0009-0008-1970-8347","affiliations":[{"raw_affiliation_string":"School of Computer Science, University of South China, Hengyang, China","institution_ids":["https://openalex.org/I91935597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106211660","display_name":"Wei Jiang","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wei Jiang","raw_affiliation_strings":["National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China"],"raw_orcid":"https://orcid.org/0009-0000-8549-0181","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China","institution_ids":[]}]},{"author_position":"last","author":{"id":null,"display_name":"Hao Yan","orcid":"https://orcid.org/0009-0001-4451-5140"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hao Yan","raw_affiliation_strings":["National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China"],"raw_orcid":"https://orcid.org/0009-0001-4451-5140","affiliations":[{"raw_affiliation_string":"National Key Laboratory of Nuclear Reactor Technolog,Chengdu,Sichuan, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"2022","issue":null,"first_page":"13","last_page":"18"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9836000204086304,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9793999791145325,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9248999953269958,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.5731590986251831},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5423939228057861},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5230247378349304},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3879878520965576},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2703961133956909},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24550557136535645},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.08007431030273438}],"concepts":[{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5731590986251831},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5423939228057861},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5230247378349304},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3879878520965576},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2703961133956909},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24550557136535645},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.08007431030273438},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3674225.3674228","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1145/3674225.3674228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International Conference on Power Electronics and Artificial Intelligence","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1981276685","https://openalex.org/W2160303195","https://openalex.org/W2794490067","https://openalex.org/W3023649542","https://openalex.org/W3023979398","https://openalex.org/W3092060236","https://openalex.org/W4200069638","https://openalex.org/W4205620499","https://openalex.org/W4210443567","https://openalex.org/W6679234696"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W2382290278","https://openalex.org/W4395014643"],"abstract_inverted_index":{"To":[0,36],"improve":[1],"the":[2,7,25,29,38,86,98,108,116,133,137,141,162,166,175,186,189,199,203],"reliability":[3],"and":[4,49,68,97,132,196],"maintainability":[5],"of":[6,21,28,40,52,85,94,136,165,188,202],"nuclear":[8,30],"safety":[9,31],"class":[10,32],"DCS":[11],"system,":[12],"this":[13],"paper":[14],"conducts":[15],"a":[16,57],"study":[17],"on":[18,61,128],"fault":[19,47,53,77,92,105,109,122,124,200],"prediction":[20,58,125,154,163,183],"key":[22,83,95],"components":[23,84],"in":[24,140],"output":[26,88],"circuit":[27,89,190],"signal":[33,87],"conditioning":[34],"module.":[35],"address":[37],"issues":[39],"insufficient":[41],"feature":[42,66],"extraction":[43,67],"for":[44,82,185],"minor":[45],"offset":[46],"characteristics":[48],"low":[50],"accuracy":[51,184],"prediction,":[54],"we":[55],"proposed":[56],"model":[59,100,126,143,177],"based":[60,127],"stacked":[62],"denoising":[63],"autoencoder":[64],"(SDAE)":[65],"improved":[69],"multi-kernel":[70],"relevance":[71],"vector":[72],"machine":[73],"(MKRVM)":[74],"model.":[75,170],"Therefore,":[76],"simulation":[78],"modeling":[79],"is":[80,101,112,130],"performed":[81],"to":[90,103,160],"obtain":[91],"datasets":[93],"components,":[96,192],"SDAE":[99],"used":[102,159],"extract":[104],"features.":[106],"And":[107],"degree":[110],"index":[111],"obtained":[113],"by":[114,179],"calculating":[115],"Pearson":[117],"correlation":[118],"coefficient":[119],"between":[120],"these":[121],"features.The":[123],"MKRVM":[129,142,176],"established,":[131],"combination":[134],"coefficients":[135],"kernel":[138],"functions":[139],"are":[144,158],"optimized":[145,178],"using":[146],"adaptive":[147],"gray":[148],"wolf":[149],"optimization":[150],"algorithm":[151],"(AGWO).":[152],"The":[153,171],"performance":[155],"evaluation":[156],"indicators":[157],"evaluate":[161],"results":[164,172],"AGWO-MKRVM":[167],"model,":[168],"RVM":[169],"show":[173],"that":[174],"AGWO":[180],"has":[181],"better":[182],"faults":[187],"critical":[191],"moreover,":[193],"can":[194],"accurately":[195],"stably":[197],"predict":[198],"trend":[201],"circuit.":[204]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}