{"id":"https://openalex.org/W4402194310","doi":"https://doi.org/10.1145/3670474.3685968","title":"ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects","display_name":"ML-TIME: ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects","publication_year":2024,"publication_date":"2024-09-03","ids":{"openalex":"https://openalex.org/W4402194310","doi":"https://doi.org/10.1145/3670474.3685968"},"language":"en","primary_location":{"id":"doi:10.1145/3670474.3685968","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3670474.3685968","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1145/3670474.3685968","any_repository_has_fulltext":null},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113365649","display_name":"Xuanyi Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xuanyi Tan","raw_affiliation_strings":["Arizona State University, Tempe, Arizona, USA"],"raw_orcid":"https://orcid.org/0009-0009-0599-8539","affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, Arizona, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032088471","display_name":"Peter Domanski","orcid":"https://orcid.org/0000-0001-5283-2712"},"institutions":[{"id":"https://openalex.org/I100066346","display_name":"University of Stuttgart","ror":"https://ror.org/04vnq7t77","country_code":"DE","type":"education","lineage":["https://openalex.org/I100066346"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Peter Domanski","raw_affiliation_strings":["University of Stuttgart, Stuttgart, Germany"],"raw_orcid":"https://orcid.org/0000-0001-5283-2712","affiliations":[{"raw_affiliation_string":"University of Stuttgart, Stuttgart, Germany","institution_ids":["https://openalex.org/I100066346"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052051759","display_name":"Sanmitra Banerjee","orcid":"https://orcid.org/0000-0002-1136-9220"},"institutions":[{"id":"https://openalex.org/I4210127875","display_name":"Nvidia (United States)","ror":"https://ror.org/03jdj4y14","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127875"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sanmitra Banerjee","raw_affiliation_strings":["NVIDIA Corporation, Santa Clara, California, USA"],"raw_orcid":"https://orcid.org/0000-0002-1136-9220","affiliations":[{"raw_affiliation_string":"NVIDIA Corporation, Santa Clara, California, USA","institution_ids":["https://openalex.org/I4210127875"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Arizona State University, Tempe, Arizona, USA"],"raw_orcid":"https://orcid.org/0000-0003-4475-6435","affiliations":[{"raw_affiliation_string":"Arizona State University, Tempe, Arizona, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1129849,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6389584541320801},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5760902166366577},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5737285614013672},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5095851421356201},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.15823477506637573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14972227811813354},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11608228087425232}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6389584541320801},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5760902166366577},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5737285614013672},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5095851421356201},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.15823477506637573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14972227811813354},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11608228087425232},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3670474.3685968","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3670474.3685968","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3670474.3685968","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3670474.3685968","pdf_url":null,"source":null,"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD","raw_type":"proceedings-article"},"sustainable_development_goals":[{"score":0.7400000095367432,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W658677875","https://openalex.org/W1157979147","https://openalex.org/W1969914907","https://openalex.org/W1974368829","https://openalex.org/W1991891926","https://openalex.org/W2031517912","https://openalex.org/W2033756824","https://openalex.org/W2034427507","https://openalex.org/W2034563310","https://openalex.org/W2037102348","https://openalex.org/W2096581954","https://openalex.org/W2098417235","https://openalex.org/W2102969696","https://openalex.org/W2111154686","https://openalex.org/W2114131053","https://openalex.org/W2131224517","https://openalex.org/W2153258655","https://openalex.org/W2182146805","https://openalex.org/W2295598076","https://openalex.org/W2296609147","https://openalex.org/W2487770199","https://openalex.org/W2538597346","https://openalex.org/W2544241580","https://openalex.org/W2593386967","https://openalex.org/W2625108149","https://openalex.org/W2916265288","https://openalex.org/W2962887670","https://openalex.org/W3121036806","https://openalex.org/W3185715161","https://openalex.org/W4210454259","https://openalex.org/W4307525381"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"Integrated":[0],"circuits":[1],"at":[2,96],"advanced":[3],"technology":[4],"nodes":[5],"are":[6,129],"prone":[7],"to":[8,16,23,41,67,104,125,131,144],"process":[9,79,115,133],"variations":[10,80,116,134,168],"and":[11,49,81,117,140,153,169],"early":[12,55],"life":[13,56],"failures":[14,57],"due":[15,40],"aging.":[17],"Variations":[18],"in":[19,28,31,45,71,75],"transistor":[20],"parameters":[21],"lead":[22],"a":[24,62,106],"degraded":[25],"on-current":[26],"which,":[27],"turn,":[29],"results":[30,149],"increasing":[32],"gate-level":[33],"propagation":[34],"delay.":[35],"Similarly,":[36],"threshold":[37],"voltage":[38],"shifts":[39],"aging":[42,82,118,136],"effects":[43,137],"result":[44],"increased":[46],"path":[47,69,94,111,165],"delays":[48,70,95,112,166],"erstwhile":[50],"latent":[51],"defects":[52],"manifesting":[53],"as":[54],"(ELFs).":[58],"We":[59],"propose":[60],"ML-TIME,":[61],"novel":[63],"machine":[64],"learning-based":[65],"framework":[66],"simulate":[68],"an":[72,172],"integrated":[73],"circuit":[74,186],"the":[76,110,159,181],"presence":[77],"of":[78,109,175],"effects.":[83],"While":[84],"conventional":[85],"static":[86],"timing":[87],"analysis":[88],"(STA)":[89],"tools":[90],"can":[91,101,122,141,161],"only":[92],"compute":[93],"well-defined":[97],"process-voltage-temperature":[98],"corners,":[99],"ML-TIME":[100,160],"be":[102,123],"used":[103,124],"obtain":[105],"statistical":[107],"distribution":[108],"under":[113,167],"user-defined":[114],"specifications.":[119],"Such":[120],"distributions":[121],"identify":[126],"paths":[127],"that":[128,158],"susceptible":[130],"either":[132],"or":[135,138],"both":[139],"enable":[142],"designers":[143],"make":[145],"remedial":[146],"changes.":[147],"Simulation":[148],"across":[150],"multiple":[151],"benchmarks":[152],"standard":[154],"cell":[155],"libraries":[156],"demonstrate":[157],"accurately":[162],"predict":[163],"critical":[164],"aging,":[170],"with":[171],"error":[173],"margin":[174],"less":[176],"than":[177],"1.7%,":[178],"all":[179],"without":[180],"need":[182],"for":[183],"computationally":[184],"expensive":[185],"simulations.":[187]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}