{"id":"https://openalex.org/W4400268631","doi":"https://doi.org/10.1145/3665348.3665378","title":"Deep learning based defect classification method for pressure gas cylinders","display_name":"Deep learning based defect classification method for pressure gas cylinders","publication_year":2024,"publication_date":"2024-05-10","ids":{"openalex":"https://openalex.org/W4400268631","doi":"https://doi.org/10.1145/3665348.3665378"},"language":"en","primary_location":{"id":"doi:10.1145/3665348.3665378","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3665348.3665378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 International Conference on Generative Artificial Intelligence and Information Security","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052141577","display_name":"Shutao Xiong","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112488","display_name":"China Special Equipment Inspection and Research Institute","ror":"https://ror.org/01fmwwp26","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210112488"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shutao Xiong","raw_affiliation_strings":["Key Laboratory of Electromechanical Equipment Security in Western Complex Environment for State Market Regulation, Chongqing Special Equipment Inspection and Research Institute, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromechanical Equipment Security in Western Complex Environment for State Market Regulation, Chongqing Special Equipment Inspection and Research Institute, China","institution_ids":["https://openalex.org/I4210112488"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024989640","display_name":"Jixing Qu","orcid":null},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jixing Qu","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University of Science and Technology, China","institution_ids":["https://openalex.org/I168337820"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006944014","display_name":"Wang Xue","orcid":null},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Xue","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University of Science and Technology, China","institution_ids":["https://openalex.org/I168337820"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002949132","display_name":"Yanjun Li","orcid":"https://orcid.org/0009-0000-5255-314X"},"institutions":[{"id":"https://openalex.org/I168337820","display_name":"Chongqing University of Science and Technology","ror":"https://ror.org/03n3v6d52","country_code":"CN","type":"education","lineage":["https://openalex.org/I168337820"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanjun Li","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University of Science and Technology, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University of Science and Technology, China","institution_ids":["https://openalex.org/I168337820"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5052141577"],"corresponding_institution_ids":["https://openalex.org/I4210112488"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12813697,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"167","last_page":"172"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9674999713897705,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4917738735675812},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.439802348613739},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3561277985572815},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3361465334892273}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4917738735675812},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.439802348613739},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3561277985572815},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3361465334892273}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3665348.3665378","is_oa":false,"landing_page_url":"https://doi.org/10.1145/3665348.3665378","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 2024 International Conference on Generative Artificial Intelligence and Information Security","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2969247748","https://openalex.org/W3012006689","https://openalex.org/W3160656610","https://openalex.org/W3203305603","https://openalex.org/W3208261418","https://openalex.org/W4224940354","https://openalex.org/W4231180141","https://openalex.org/W4240429504"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4396520874","https://openalex.org/W4390401159","https://openalex.org/W2033914206","https://openalex.org/W2042327336"],"abstract_inverted_index":{"Infrared":[0],"image-based":[1],"defect":[2,49,66,80,102,217],"detection":[3],"of":[4,16,27,39,47,56,65,77,94,100,135,149,161,167,182,236],"gas":[5,17,40,71,78,163,187],"cylinders":[6,72,164],"is":[7,32,52,86,112,155,229],"a":[8,62,104,120,124,147,150],"key":[9],"link":[10],"in":[11,29,215],"the":[12,21,30,33,37,44,53,92,108,116,131,136,142,159,192,200,205,212,232,237],"manufacturing":[13],"and":[14,25,97,119,123,133,144,171,198,210,234],"inspection":[15],"cylinders,":[18,41],"accurately":[19],"distinguish":[20],"type,":[22],"distribution,":[23],"number":[24,96],"area":[26],"defects":[28,183],"image":[31],"basis":[34],"for":[35,69,175],"determining":[36],"quality":[38,160],"based":[42,73,106,184],"on":[43,74,107,141,185],"deep":[45],"learning":[46],"intelligent":[48],"classification":[50,67,153,181,194],"methods":[51,195],"mainstream":[54,193],"direction":[55],"current":[57],"research.":[58],"This":[59],"paper":[60],"proposes":[61],"comprehensive":[63],"technology":[64],"method":[68,203],"pressure":[70,162],"on-site":[75],"collection":[76],"cylinder":[79,188],"data":[81],"set.":[82],"The":[83],"main":[84],"work":[85],"as":[87],"follows:":[88],"1)":[89],"Aiming":[90],"at":[91],"problem":[93],"insufficient":[95],"unbalanced":[98],"distribution":[99],"field-collected":[101],"samples,":[103],"DA-DCGAN":[105],"dual-channel":[109,125],"attention":[110],"mechanism":[111],"designed":[113],"to":[114,129,157,178],"increase":[115,158],"sample":[117],"data,":[118],"self-attention":[121],"generator":[122],"discriminator":[126],"are":[127],"constructed":[128],"ensure":[130],"accuracy":[132],"reliability":[134],"generated":[137],"samples;":[138],"2)":[139],"Based":[140],"augmented":[143],"broadened":[145],"dataset,":[146],"design":[148],"cascaded":[151,201],"HRNet":[152,202],"network":[154],"proposed":[156],"by":[165,208],"means":[166],"global":[168],"feature":[169,173,176],"extraction,":[170],"local":[172],"extraction":[174],"fusion":[177],"achieve":[179],"multiple":[180],"infrared":[186],"images.":[189],"Compared":[190],"with":[191],"DenseNet,":[196],"ResNet,":[197],"VGG,":[199],"improves":[204],"average":[206],"AUC":[207],"6.1%":[209],"achieves":[211],"highest":[213],"scores":[214],"two":[216],"types.":[218],"For":[219],"temperature":[220],"fluctuation":[221],"experiments":[222],"under":[223],"real":[224],"working":[225],"conditions,":[226],"good":[227],"performance":[228],"achieved,":[230],"proving":[231],"effectiveness":[233],"anti-interference":[235],"improved":[238],"model.":[239]},"counts_by_year":[],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}